nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A further discussion on the peculiarity of maximum entropy image deconvolution in HREM
|
Wang, H.B. |
|
2004 |
99 |
2-3 |
p. 165-177 13 p. |
artikel |
2 |
A new method for the determination of the wave aberration function for high-resolution TEM.
|
Meyer, R.R. |
|
2004 |
99 |
2-3 |
p. 115-123 9 p. |
artikel |
3 |
Electron microscope calibration for the Lorentz mode
|
Fazzini, P.F. |
|
2004 |
99 |
2-3 |
p. 201-209 9 p. |
artikel |
4 |
IFC (Editorial Board)
|
|
|
2004 |
99 |
2-3 |
p. IFC- 1 p. |
artikel |
5 |
Imaging and thickness measurement of amorphous intergranular films using TEM
|
MacLaren, I. |
|
2004 |
99 |
2-3 |
p. 103-113 11 p. |
artikel |
6 |
Near-field optical microscope working on TEM wave
|
Lapchuk, A.S. |
|
2004 |
99 |
2-3 |
p. 143-157 15 p. |
artikel |
7 |
Optimal resolution of a time-dependent aberrationless magnetic lens
|
Calvo, M. |
|
2004 |
99 |
2-3 |
p. 179-187 9 p. |
artikel |
8 |
Recording of single-particle hysteresis loops with differential phase contrast microscopy
|
Uhlig, T. |
|
2004 |
99 |
2-3 |
p. 137-142 6 p. |
artikel |
9 |
Reproducible lateral force microscopy measurements for quantitative comparisons of the frictional and chemical properties of nanostructures
|
Such, M.W. |
|
2004 |
99 |
2-3 |
p. 189-196 8 p. |
artikel |
10 |
Role of surface amorphous film in high-resolution high-angle annular dark field STEM imaging
|
Yamazaki, T. |
|
2004 |
99 |
2-3 |
p. 125-135 11 p. |
artikel |
11 |
Spectromicroscope for the PHotoelectron Imaging of Nanostructures with X-rays (SPHINX): performance in biology, medicine and geology
|
Frazer, Bradley H. |
|
2004 |
99 |
2-3 |
p. 87-94 8 p. |
artikel |
12 |
Study of the field around magnetic force microscopy probes using electron holography
|
Matteucci, G. |
|
2004 |
99 |
2-3 |
p. 95-102 8 p. |
artikel |
13 |
The addition of chromatic aberration coefficients
|
Hawkes, P.W. |
|
2004 |
99 |
2-3 |
p. 197-200 4 p. |
artikel |
14 |
Time-correlations as a contrast mechanism in scanning-tunneling-microscopy-induced photon emission
|
Silly, Fabien |
|
2004 |
99 |
2-3 |
p. 159-164 6 p. |
artikel |