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                             37 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Aberration correction results in the IBM STEM instrument Batson, P.E.
 2003
 96 3-4 p. 239-249
11 p.
 artikel
2 A proposal for dichroic experiments in the electron microscope Hébert, C.
 2003
 96 3-4 p. 463-468
6 p.
 artikel
3 Artifacts in aberration-corrected ADF-STEM imaging Yu, Zhiheng
 2003
 96 3-4 p. 275-284
10 p.
 artikel
4 A sub-50meV spectrometer and energy filter for use in combination with 200kV monochromated (S)TEMs Brink, H.A.
 2003
 96 3-4 p. 367-384
18 p.
 artikel
5 Author index 2003
 96 3-4 p. 583-585
3 p.
 artikel
6 Channeling, localization and the density matrix in inelastic electron scattering Schattschneider, P.
 2003
 96 3-4 p. 453-462
10 p.
 artikel
7 Channelling effects in atomic resolution STEM Rossouw, C.J.
 2003
 96 3-4 p. 299-312
14 p.
 artikel
8 Contents 2003
 96 3-4 p. xi-xii
nvt p.
 artikel
9 Core-hole effects on the ELNES of absorption edges in SrTiO3 van Benthem, K.
 2003
 96 3-4 p. 509-522
14 p.
 artikel
10 3D electron microscopy in the physical sciences: the development of Z-contrast and EFTEM tomography Midgley, P.A.
 2003
 96 3-4 p. 413-431
19 p.
 artikel
11 Electron energy-loss near-edge structures of 3d transition metal oxides recorded at high-energy resolution Mitterbauer, C.
 2003
 96 3-4 p. 469-480
12 p.
 artikel
12 Electron energy-loss spectroscopic profiling of thin film structures: 0.39nm line resolution and 0.04eV precision measurement of near-edge structure shifts at interfaces Walther, T.
 2003
 96 3-4 p. 401-411
11 p.
 artikel
13 Elemental occurrence maps: a starting point for quantitative EELS spectrum image processing Kothleitner, Gerald
 2003
 96 3-4 p. 491-508
18 p.
 artikel
14 Energy-filtering TEM at high magnification: spatial resolution and detection limits Grogger, Werner
 2003
 96 3-4 p. 481-489
9 p.
 artikel
15 Experimental and theoretical evidence for the magic angle in transmission electron energy loss spectroscopy Daniels, Howard
 2003
 96 3-4 p. 523-534
12 p.
 artikel
16 Experimental investigation of phase contrast formed by inelastically scattered electrons Kimoto, Koji
 2003
 96 3-4 p. 335-342
8 p.
 artikel
17 Foreword Leapman, Richard
 2003
 96 3-4 p. v-vi
nvt p.
 artikel
18 IFC (Editorial Board) 2003
 96 3-4 p. IFC-
1 p.
 artikel
19 Imaging individual atoms inside crystals with ADF-STEM Voyles, P.M.
 2003
 96 3-4 p. 251-273
23 p.
 artikel
20 Improving energy resolution of EELS spectra: an alternative to the monochromator solution Gloter, A.
 2003
 96 3-4 p. 385-400
16 p.
 artikel
21 Laterally resolved EELS for ELNES mapping of the Fe L2,3- and O K-edge Golla-Schindler, U.
 2003
 96 3-4 p. 573-582
10 p.
 artikel
22 Layer-doubling method in ADF-STEM image simulation Mitsuishi, K.
 2003
 96 3-4 p. 323-333
11 p.
 artikel
23 List of Participants 2003
 96 3-4 p. vii-ix
nvt p.
 artikel
24 Localization in elastic and inelastic scattering Lupini, A.R.
 2003
 96 3-4 p. 313-322
10 p.
 artikel
25 Materials science applications of HREELS in near edge structure analysis and low-energy loss spectroscopy Lazar, S.
 2003
 96 3-4 p. 535-546
12 p.
 artikel
26 Nanobeam propagation and imaging in a FEGTEM/STEM Möbus, Günter
 2003
 96 3-4 p. 285-298
14 p.
 artikel
27 Plasmon energy mapping in energy-filtering transmission electron microscopy Sigle, W.
 2003
 96 3-4 p. 565-571
7 p.
 artikel
28 PROCEEDINGS OF THE INTERNATIONAL WORKSHOP STRATEGIES AND ADVANCES IN ATOMIC LEVEL SPECTROSCOPY AND ANALYSIS Leapman, Richard D
 2003
 96 3-4 p. iii-
1 p.
 artikel
29 Quantitative valence plasmon mapping in the TEM: viewing physical properties at the nanoscale Daniels, H.R.
 2003
 96 3-4 p. 547-558
12 p.
 artikel
30 Scattering of Å-scale electron probes in silicon Dwyer, C.
 2003
 96 3-4 p. 343-360
18 p.
 artikel
31 Spectroscopic electron tomography Möbus, Günter
 2003
 96 3-4 p. 433-451
19 p.
 artikel
32 Study of the dielectric properties near the band gap by VEELS: gap measurement in bulk materials Schamm, S.
 2003
 96 3-4 p. 559-564
6 p.
 artikel
33 Subject guide 2003
 96 3-4 p. 587-588
2 p.
 artikel
34 Subject index 2003
 96 3-4 p. 589-593
5 p.
 artikel
35 The Manuscripts for these Proceedings were received by the Publisher: mid-April 2003 2003
 96 3-4 p. iv-
1 p.
 artikel
36 The phonon contribution to high-resolution electron microscope images Boothroyd, C.B.
 2003
 96 3-4 p. 361-365
5 p.
 artikel
37 Towards sub-0.5Å electron beams Krivanek, O.L.
 2003
 96 3-4 p. 229-237
9 p.
 artikel
                             37 gevonden resultaten
 
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