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                             24 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Breakdown of the weak-phase object approximation in amorphous objects and measurement of high-resolution electron optical parameters Murray Gibson, J.
1994
56 1-3 p. 26-31
6 p.
artikel
2 Correction of aberrations, a promising means for improving the spatial and energy resolution of energy-filtering electron microscopes Rose, H.
1994
56 1-3 p. 11-25
15 p.
artikel
3 Defect-flow-induced grain boundary migration with segregation under electron irradiation Takahashi, H.
1994
56 1-3 p. 193-199
7 p.
artikel
4 Determination of grain boundary volume expansion by HREM Buckett, M.I.
1994
56 1-3 p. 71-78
8 p.
artikel
5 Dual ion beam irradiation system interfaced with a transmission electron microscope and the observation of defect evolution in Ni during irradiation Ishikawa, Nobuhiro
1994
56 1-3 p. 211-215
5 p.
artikel
6 Editorial Board 1994
56 1-3 p. ii-
1 p.
artikel
7 Electron-diffraction channeling effect on defect formation in Si with 〈110〉 zone-axis incidence Takeda, S.
1994
56 1-3 p. 144-162
19 p.
artikel
8 High-resolution transmission electron microscopy studies of dislocation cores in metals and intermetallic compounds Mills, Michael J.
1994
56 1-3 p. 79-93
15 p.
artikel
9 High-temperature straining stage for in situ experiments in the high-voltage electron microscope Messerschmidt, U.
1994
56 1-3 p. 163-171
9 p.
artikel
10 In situ HREM: application to metal-mediated crystallization Sinclair, R.
1994
56 1-3 p. 225-232
8 p.
artikel
11 In situ ion- and electron-irradiation effects studies in transmission electron microscopes Allen, Charles W.
1994
56 1-3 p. 200-210
11 p.
artikel
12 In-situ observations of irradiation-induced phase transformations Kinoshita, C.
1994
56 1-3 p. 216-224
9 p.
artikel
13 In-situ transmission electron microscopy of grain boundaries in CuGa2 Sasaki, K.
1994
56 1-3 p. 184-192
9 p.
artikel
14 Interpretation of the {100} fringes in lattice images from the centre of carbon nanotubes Cullen, S.L.
1994
56 1-3 p. 127-134
8 p.
artikel
15 New high-voltage atomic resolution microscope approaching 1 Å point resolution installed in Stuttgart Phillipp, F.
1994
56 1-3 p. 1-10
10 p.
artikel
16 On the extraction of high quality data from real-time transmission electron microscopy experiments Bithell, E.G.
1994
56 1-3 p. 172-183
12 p.
artikel
17 On the role of dislocations in heavily strained YBa2Cu3O7−δ Verwerft, M.
1994
56 1-3 p. 135-143
9 p.
artikel
18 Preface Rühle, Manfred
1994
56 1-3 p. ix-
1 p.
artikel
19 Premise-free reconstruction of the exit-surface wave function in HRTEM Bierwolf, R.
1994
56 1-3 p. 32-45
14 p.
artikel
20 Quantitative analysis of the deformation and chemical profiles of strained multilayers Bayle, P.
1994
56 1-3 p. 94-107
14 p.
artikel
21 Quantitative HREM using non-linear least-squares methods King, Wayne E.
1994
56 1-3 p. 46-53
8 p.
artikel
22 Structure determination of metal-ceramic interfaces by numerical contrast evaluation of HRTEM micrographs Möbus, G.
1994
56 1-3 p. 54-70
17 p.
artikel
23 Theoretical and observed electron microscope images of impurity atoms in thin crystals formed by L-shell ionization electrons Endoh, H.
1994
56 1-3 p. 108-120
13 p.
artikel
24 UHVEM and AES analysis of electron-irradiation-induced gold-atom implantation into silicon carbide Yasuda, H.
1994
56 1-3 p. 121-126
6 p.
artikel
                             24 gevonden resultaten
 
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