| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
Accurate measurement of absolute experimental inelastic mean free paths and EELS differential cross-sections
|
Craven, Alan J.
|
|
2016
|
170 |
C |
p. 113-127
|
article
|
| 2 |
Adaptive multiresolution method for MAP reconstruction in electron tomography
|
Acar, Erman
|
|
2016
|
170 |
C |
p. 24-34
|
article
|
| 3 |
Comprehensive analysis of TEM methods for LiFePO4/FePO4 phase mapping: spectroscopic techniques (EFTEM, STEM-EELS) and STEM diffraction techniques (ACOM-TEM)
|
Mu, X.
|
|
2016
|
170 |
C |
p. 10-18
|
article
|
| 4 |
Cross-sectional measurement of grain boundary segregation using WDS
|
Christien, F.
|
|
2016
|
170 |
C |
p. 107-112
|
article
|
| 5 |
Current status and future directions for in situ transmission electron microscopy
|
Taheri, Mitra L.
|
|
2016
|
170 |
C |
p. 86-95
|
article
|
| 6 |
Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design
|
Gonnissen, J.
|
|
2016
|
170 |
C |
p. 128-138
|
article
|
| 7 |
Dose-rate-dependent damage of cerium dioxide in the scanning transmission electron microscope
|
Johnston-Peck, Aaron C.
|
|
2016
|
170 |
C |
p. 1-9
|
article
|
| 8 |
High temperature conductance mapping for correlation of electrical properties with micron-sized chemical and microstructural features
|
Hansen, Karin Vels
|
|
2016
|
170 |
C |
p. 69-76
|
article
|
| 9 |
IFC (Editorial Board)
|
|
|
2016
|
170 |
C |
p. IFC
|
article
|
| 10 |
Linear chemically sensitive electron tomography using DualEELS and dictionary-based compressed sensing
|
AlAfeef, Ala
|
|
2016
|
170 |
C |
p. 96-106
|
article
|
| 11 |
Observation of electron beam moiré fringes in an image conversion tube
|
Lei, Yunfei
|
|
2016
|
170 |
C |
p. 19-23
|
article
|
| 12 |
Progress in structure recovery from low dose exposures: Mixed molecular adsorption, exploitation of symmetry and reconstruction from the minimum signal level
|
Kramberger, C.
|
|
2016
|
170 |
C |
p. 60-68
|
article
|
| 13 |
Sparse modeling of EELS and EDX spectral imaging data by nonnegative matrix factorization
|
Shiga, Motoki
|
|
2016
|
170 |
C |
p. 43-59
|
article
|
| 14 |
Surface topography analysis with application of roughness area dependence method
|
Szyszka, Adam
|
|
2016
|
170 |
C |
p. 77-85
|
article
|
| 15 |
When does atomic resolution plan view imaging of surfaces work?
|
Koirala, Pratik
|
|
2016
|
170 |
C |
p. 35-42
|
article
|
Journal description