nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Accurate measurement of absolute experimental inelastic mean free paths and EELS differential cross-sections
|
Craven, Alan J. |
|
2016 |
170 |
C |
p. 113-127 |
artikel |
2 |
Adaptive multiresolution method for MAP reconstruction in electron tomography
|
Acar, Erman |
|
2016 |
170 |
C |
p. 24-34 |
artikel |
3 |
Comprehensive analysis of TEM methods for LiFePO4/FePO4 phase mapping: spectroscopic techniques (EFTEM, STEM-EELS) and STEM diffraction techniques (ACOM-TEM)
|
Mu, X. |
|
2016 |
170 |
C |
p. 10-18 |
artikel |
4 |
Cross-sectional measurement of grain boundary segregation using WDS
|
Christien, F. |
|
2016 |
170 |
C |
p. 107-112 |
artikel |
5 |
Current status and future directions for in situ transmission electron microscopy
|
Taheri, Mitra L. |
|
2016 |
170 |
C |
p. 86-95 |
artikel |
6 |
Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design
|
Gonnissen, J. |
|
2016 |
170 |
C |
p. 128-138 |
artikel |
7 |
Dose-rate-dependent damage of cerium dioxide in the scanning transmission electron microscope
|
Johnston-Peck, Aaron C. |
|
2016 |
170 |
C |
p. 1-9 |
artikel |
8 |
High temperature conductance mapping for correlation of electrical properties with micron-sized chemical and microstructural features
|
Hansen, Karin Vels |
|
2016 |
170 |
C |
p. 69-76 |
artikel |
9 |
IFC (Editorial Board)
|
|
|
2016 |
170 |
C |
p. IFC |
artikel |
10 |
Linear chemically sensitive electron tomography using DualEELS and dictionary-based compressed sensing
|
AlAfeef, Ala |
|
2016 |
170 |
C |
p. 96-106 |
artikel |
11 |
Observation of electron beam moiré fringes in an image conversion tube
|
Lei, Yunfei |
|
2016 |
170 |
C |
p. 19-23 |
artikel |
12 |
Progress in structure recovery from low dose exposures: Mixed molecular adsorption, exploitation of symmetry and reconstruction from the minimum signal level
|
Kramberger, C. |
|
2016 |
170 |
C |
p. 60-68 |
artikel |
13 |
Sparse modeling of EELS and EDX spectral imaging data by nonnegative matrix factorization
|
Shiga, Motoki |
|
2016 |
170 |
C |
p. 43-59 |
artikel |
14 |
Surface topography analysis with application of roughness area dependence method
|
Szyszka, Adam |
|
2016 |
170 |
C |
p. 77-85 |
artikel |
15 |
When does atomic resolution plan view imaging of surfaces work?
|
Koirala, Pratik |
|
2016 |
170 |
C |
p. 35-42 |
artikel |