| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Achieving sub-nanometre particle mapping with energy-filtered TEM
|
Lozano-Perez, S.
|
|
2009
|
109 |
10 |
p. 1217-1228
12 p.
|
artikel
|
| 2 |
An efficient approach to characterize pseudo-merohedral twins by precession electron diffraction: Application to the LaGaO3 perovskite
|
Ji, G.
|
|
2009
|
109 |
10 |
p. 1282-1294
13 p.
|
artikel
|
| 3 |
An improved ptychographical phase retrieval algorithm for diffractive imaging
|
Maiden, Andrew M.
|
|
2009
|
109 |
10 |
p. 1256-1262
7 p.
|
artikel
|
| 4 |
Clustering and nearest neighbour distances in atom-probe tomography
|
Philippe, T.
|
|
2009
|
109 |
10 |
p. 1304-1309
6 p.
|
artikel
|
| 5 |
Complementary techniques for the characterization of thin film Ti/Nb multilayers
|
Genç, Arda
|
|
2009
|
109 |
10 |
p. 1276-1281
6 p.
|
artikel
|
| 6 |
Erratum to: “Column-by-column compositional mapping by Z-contrast imaging” [Ultramicroscopy 109(2) (2009) 172–176]
|
Molina, S.I.
|
|
2009
|
109 |
10 |
p. 1315-
1 p.
|
artikel
|
| 7 |
Fabrication of various tip-size AFM probes for evaluating single-molecular retraction force between actin and anti-actin
|
Okada, Tomoko
|
|
2009
|
109 |
10 |
p. 1299-1303
5 p.
|
artikel
|
| 8 |
Field-dependent electron emission patterns from individual SWCNTs simulated with a multi-scale algorithm
|
Wang, Weiliang
|
|
2009
|
109 |
10 |
p. 1295-1298
4 p.
|
artikel
|
| 9 |
Fourier-ratio deconvolution techniques for electron energy-loss spectroscopy (EELS)
|
Wang, Feng
|
|
2009
|
109 |
10 |
p. 1245-1249
5 p.
|
artikel
|
| 10 |
IFC (Editorial Board)
|
|
|
2009
|
109 |
10 |
p. IFC-
1 p.
|
artikel
|
| 11 |
Influence of thick crystal effects on ptychographic image reconstruction with moveable illumination
|
Liu, Cheng
|
|
2009
|
109 |
10 |
p. 1263-1275
13 p.
|
artikel
|
| 12 |
Initial experimental results on a magnetic beam separator spectrometer for the SEM
|
Osterberg, Mans
|
|
2009
|
109 |
10 |
p. 1310-1314
5 p.
|
artikel
|
| 13 |
Lattice distortions in GaN on sapphire using the CBED–HOLZ technique
|
Sridhara Rao, D.V.
|
|
2009
|
109 |
10 |
p. 1250-1255
6 p.
|
artikel
|
| 14 |
Microstructural tomography of a Ni 70 Cr 20 Al 10 superalloy using focused ion beam microscopy
|
Uchic, M.D.
|
|
2009
|
109 |
10 |
p. 1229-1235
7 p.
|
artikel
|
| 15 |
Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy
|
Van Aert, S.
|
|
2009
|
109 |
10 |
p. 1236-1244
9 p.
|
artikel
|
| 16 |
Quantitative measurements of Kikuchi bands in diffraction patterns of backscattered electrons using an electrostatic analyzer
|
Went, M.R.
|
|
2009
|
109 |
10 |
p. 1211-1216
6 p.
|
artikel
|
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