| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A complete analysis of the laser beam deflection systems used in cantilever-based systems
|
Beaulieu, L.Y.
|
|
2007
|
107 |
4-5 |
p. 422-430
9 p.
|
artikel
|
| 2 |
A method of combining STEM image with parallel beam diffraction and electron-optical conditions for diffractive imaging
|
He, Haifeng
|
|
2007
|
107 |
4-5 |
p. 340-344
5 p.
|
artikel
|
| 3 |
An algorithm for refinement of lattice parameters using CBED patterns
|
Morawiec, A.
|
|
2007
|
107 |
4-5 |
p. 390-395
6 p.
|
artikel
|
| 4 |
A new nano-accuracy AFM system for minimizing Abbe errors and the evaluation of its measuring uncertainty
|
Kim, Dongmin
|
|
2007
|
107 |
4-5 |
p. 322-328
7 p.
|
artikel
|
| 5 |
A straightforward specimen holder modification for remnant magnetic-field measurement in TEM
|
Lau, J.W.
|
|
2007
|
107 |
4-5 |
p. 396-400
5 p.
|
artikel
|
| 6 |
Cantilever dynamics and quality factor control in AC mode AFM height measurements
|
Chen, Liwei
|
|
2007
|
107 |
4-5 |
p. 275-280
6 p.
|
artikel
|
| 7 |
Carbon nanotubes: A promising standard for quantitative evaluation of AFM tip apex geometry
|
Wang, You
|
|
2007
|
107 |
4-5 |
p. 293-298
6 p.
|
artikel
|
| 8 |
Charge defects glowing in the dark
|
Deng, Bin
|
|
2007
|
107 |
4-5 |
p. 374-381
8 p.
|
artikel
|
| 9 |
Design of a microfabricated, two-electrode phase-contrast element suitable for electron microscopy
|
Cambie, Rossana
|
|
2007
|
107 |
4-5 |
p. 329-339
11 p.
|
artikel
|
| 10 |
Effective removal of Ga residue from focused ion beam using a plasma cleaner
|
Ko, Dong-Su
|
|
2007
|
107 |
4-5 |
p. 368-373
6 p.
|
artikel
|
| 11 |
EFTEM assistant: A tool to understand the limitations of EFTEM
|
Lozano-Perez, S.
|
|
2007
|
107 |
4-5 |
p. 313-321
9 p.
|
artikel
|
| 12 |
Electron imaging with Medipix2 hybrid pixel detector
|
McMullan, G.
|
|
2007
|
107 |
4-5 |
p. 401-413
13 p.
|
artikel
|
| 13 |
Fluorescence imaging and investigations of directly labelled chromosomes using scanning near-field optical microscopy
|
Baylis, Richard M.
|
|
2007
|
107 |
4-5 |
p. 308-312
5 p.
|
artikel
|
| 14 |
IFC (Editorial Board)
|
|
|
2007
|
107 |
4-5 |
p. CO2-
1 p.
|
artikel
|
| 15 |
Low-voltage cross-sectional EBIC for characterisation of GaN-based light emitting devices
|
Moldovan, Grigore
|
|
2007
|
107 |
4-5 |
p. 382-389
8 p.
|
artikel
|
| 16 |
MAC mode atomic force microscopy studies of living samples, ranging from cells to fresh tissue
|
Ge, Guanglu
|
|
2007
|
107 |
4-5 |
p. 299-307
9 p.
|
artikel
|
| 17 |
Many-beam dynamical simulation of electron backscatter diffraction patterns
|
Winkelmann, Aimo
|
|
2007
|
107 |
4-5 |
p. 414-421
8 p.
|
artikel
|
| 18 |
Practical considerations for high spatial and temporal resolution dynamic transmission electron microscopy
|
Armstrong, Michael R.
|
|
2007
|
107 |
4-5 |
p. 356-367
12 p.
|
artikel
|
| 19 |
Quantitative comparison of image contrast and pattern between experimental and simulated high-resolution transmission electron micrographs
|
Du, K.
|
|
2007
|
107 |
4-5 |
p. 281-292
12 p.
|
artikel
|
| 20 |
Separation of bulk and surface-losses in low-loss EELS measurements in STEM
|
Mkhoyan, K.A.
|
|
2007
|
107 |
4-5 |
p. 345-355
11 p.
|
artikel
|
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