nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
An alternative interpretation of CS2 −• resonant states
|
Pogulay, A.V. |
|
1994 |
70 |
2 |
p. 95-101 7 p. |
artikel |
2 |
Announcement and call for papers
|
|
|
1994 |
70 |
2 |
p. 181- 1 p. |
artikel |
3 |
Application of an He I photoelectron spectroscopic (UPS) technique to the kinetic study of chemical reactions. Determination of the kinetic parameters of the conversion reaction of 2(3H) furanone to 2(5H) furanone
|
Wang Dianxun, |
|
1994 |
70 |
2 |
p. 173-178 6 p. |
artikel |
4 |
A very high resolution electron spectrometer
|
Mårtensson, N. |
|
1994 |
70 |
2 |
p. 117-128 12 p. |
artikel |
5 |
Corrigendum
|
|
|
1994 |
70 |
2 |
p. 179- 1 p. |
artikel |
6 |
Effect of physical and chemical adsorption of water molecules on YBa2Cu3O7−δ surface composition
|
Gorelov, B.M. |
|
1994 |
70 |
2 |
p. 161-165 5 p. |
artikel |
7 |
Electron impact spectroscopy of SiF4 and GeF4
|
Kuroki, Kenro |
|
1994 |
70 |
2 |
p. 151-160 10 p. |
artikel |
8 |
He I photoelectron spectroscopic studies of the electronic structure of 2(3H) furanone and 2(5H) furanone
|
Wang Dianxun, |
|
1994 |
70 |
2 |
p. 167-172 6 p. |
artikel |
9 |
Multiple surface plasmon excitations in overlayers of K and Na on Ru(001)
|
Zharnikov, M. |
|
1994 |
70 |
2 |
p. 103-116 14 p. |
artikel |
10 |
Quantitative ARXPS depth profiling characterisation of native oxides grown on In0.53Ga0.47As(100) single crystals
|
Dal Colle, Maurizio |
|
1994 |
70 |
2 |
p. 129-143 15 p. |
artikel |
11 |
Theoretical study of the valence photoelectron spectrum of UF6
|
Onoe, Jun |
|
1994 |
70 |
2 |
p. 89-93 5 p. |
artikel |
12 |
XPS study of the In x Ga 1−x As GaAs superlattice
|
Kačiulis, S. |
|
1994 |
70 |
2 |
p. 145-149 5 p. |
artikel |