| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Accurate measurement of Mg and Al Kα1,2 X-ray energy profiles
|
Schweppe, J.
|
|
1994
|
67 |
3 |
p. 463-478
16 p.
|
artikel
|
| 2 |
An angular resolved electron energy loss investigation of highly oriented pyrolitic graphite electronic structure
|
Iacobucci, S.
|
|
1994
|
67 |
3 |
p. 479-488
10 p.
|
artikel
|
| 3 |
Electron impact multiple ionization cross section of argon (σ n+, n = 3-6)
|
Almeida, D.P.
|
|
1994
|
67 |
3 |
p. 503-510
8 p.
|
artikel
|
| 4 |
He I photoelectron spectra and π-electronic structure of 1,3,2,4-benzodithiadiazine and 5,6,7,8-tetrafluoro-1,3,2,4-benzodithiadiazine, formally antiaromatic 12π-electron compounds
|
Petrachenko, Nikolai E.
|
|
1994
|
67 |
3 |
p. 489-492
4 p.
|
artikel
|
| 5 |
He I photoelectron spectroscopic studies of the electronic structure in some forked conjugated systems. Experimental and theoretical studies of the molecular orbital character of the compounds
|
Dianxun, Wang
|
|
1994
|
67 |
3 |
p. 493-501
9 p.
|
artikel
|
| 6 |
Kinetics of photoreduction of Fe(III) in solid solution K3(Fe,M)(CN)6 (where M is Cr, Co) during XPS measurement
|
Oku, Masaoki
|
|
1994
|
67 |
3 |
p. 401-407
7 p.
|
artikel
|
| 7 |
Materials and Strutural Properties, 14th International COTADA Conference, 18-22 September 1994, Chambéry, France
|
|
|
1994
|
67 |
3 |
p. 519-520
2 p.
|
artikel
|
| 8 |
Study of SiO2/Si interface states in MOS devices by surface charge spectroscopy. Application to rapid thermal nitridation of silicon
|
Ermolieff, A.
|
|
1994
|
67 |
3 |
p. 409-416
8 p.
|
artikel
|
| 9 |
The determination of depth profiles from angle-dependent XPS using maximum entropy data analysis
|
Livesey, A.K.
|
|
1994
|
67 |
3 |
p. 439-461
23 p.
|
artikel
|
| 10 |
VUV light-induced electron emission from organic liquids
|
Koizumi, Hitoshi
|
|
1994
|
67 |
3 |
p. 417-427
11 p.
|
artikel
|
| 11 |
XPS determination of the isoelectric point of solid surfaces: possible improvements to the method of Simmons and Beard
|
Delamar, Michel
|
|
1994
|
67 |
3 |
p. R1-R5
nvt p.
|
artikel
|
| 12 |
XPS quantitative evaluation of the overlayer/support intensity ratio in particulate systems
|
Cimino, A.
|
|
1994
|
67 |
3 |
p. 429-438
10 p.
|
artikel
|
| 13 |
X-ray photoelectron diffraction from Si(111): short versus longer range structural sensitivity
|
Gewinner, G.
|
|
1994
|
67 |
3 |
p. 387-399
13 p.
|
artikel
|
| 14 |
Yields, sensitivities and natural line shapes of high-energy Auger lines: Ta, W, Pt, Au, Pb and Bi
|
Goldstein, Y.
|
|
1994
|
67 |
3 |
p. 511-518
8 p.
|
artikel
|
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