| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A modified bias-method for the determination of spectrometer functions
|
Ebel, H.
|
|
1983
|
31 |
2 |
p. 123-130
8 p.
|
artikel
|
| 2 |
An economical transfer vessel with detachable reactor for XPS studies
|
Debies, T.P.
|
|
1983
|
31 |
2 |
p. 191-196
6 p.
|
artikel
|
| 3 |
An electron-retardation device to improve the resolution of a turner-type UV photoelectron spectrometer
|
Dressler, R.
|
|
1983
|
31 |
2 |
p. 181-189
9 p.
|
artikel
|
| 4 |
A new method for determining relaxation energies by means of aes and xps and its application to silicon compounds
|
Bechstedt, F.
|
|
1983
|
31 |
2 |
p. 131-143
13 p.
|
artikel
|
| 5 |
Characterization of resonances in photoionization
|
Thiel, Walter
|
|
1983
|
31 |
2 |
p. 151-160
10 p.
|
artikel
|
| 6 |
Erratum
|
|
|
1983
|
31 |
2 |
p. 198-
1 p.
|
artikel
|
| 7 |
He(I)/He(II) photoelectron band intensity ratios for simple organic molecules
|
Cannington, P.H.
|
|
1983
|
31 |
2 |
p. 175-179
5 p.
|
artikel
|
| 8 |
Ionisation of cyanate ions in solution
|
Ballard, R.E.
|
|
1983
|
31 |
2 |
p. 145-150
6 p.
|
artikel
|
| 9 |
Photoelectron spectra of adsorbed carbonates
|
Barteau, M.A.
|
|
1983
|
31 |
2 |
p. 101-108
8 p.
|
artikel
|
| 10 |
Sixth International Conference on Thin Films August 13–17, 1984, Stockholm, Sweden
|
|
|
1983
|
31 |
2 |
p. 197-
1 p.
|
artikel
|
| 11 |
The adsorption of ammonia on an Fe(110) single-crystal surface studied by high-resolution electron energy-loss spectroscopy (eels)
|
Erley, W.
|
|
1983
|
31 |
2 |
p. 161-174
14 p.
|
artikel
|
| 12 |
X-ray and UV photoelectron-spectroscopic studies of pyridine adsorbed on evaporated nickel and palladium in the temperature range 140–385 k
|
Inoue, Yoshihide
|
|
1983
|
31 |
2 |
p. 109-121
13 p.
|
artikel
|
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