nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Acquisition of the dopant contrast in semiconductors with slow electrons
|
Frank, L. |
|
|
241 |
C |
p. |
artikel |
2 |
Analysis and detection of low-energy electrons in scanning electron microscopes using a Bessel box electron energy analyser
|
Suri, Ashish |
|
|
241 |
C |
p. |
artikel |
3 |
Editorial Board
|
|
|
|
241 |
C |
p. |
artikel |
4 |
Electron optical characterization of a graphene coated nickel electron source
|
Shao, Xiuyuan |
|
|
241 |
C |
p. |
artikel |
5 |
Entanglement and entropy in electron–electron scattering
|
Schattschneider, P. |
|
|
241 |
C |
p. |
artikel |
6 |
Field emission from a nanometric paraboloidal emitter
|
Chatziafratis, A. |
|
|
241 |
C |
p. |
artikel |
7 |
Field emission properties of single crystalline W5O14 and W18O49 nanowires
|
Saqib, Muhammad |
|
|
241 |
C |
p. |
artikel |
8 |
Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer
|
Materna Mikmeková, E. |
|
|
241 |
C |
p. |
artikel |
9 |
Low energy (1–100 eV) electron inelastic mean free path (IMFP) values determined from analysis of secondary electron yields (SEY) in the incident energy range of 0.1–10 keV
|
Ridzel, Olga Yu. |
|
|
241 |
C |
p. |
artikel |
10 |
Low-secondary electron emission yield under electron bombardment of microstructured surfaces, looking for multipactor effect suppression
|
Montero, Isabel |
|
|
241 |
C |
p. |
artikel |
11 |
Measurement of charge density in nanoscale materials using off-axis electron holography
|
Zheng, Fengshan |
|
|
241 |
C |
p. |
artikel |
12 |
Modelling a capped carbon nanotube by linear-scaling density-functional theory
|
Masur, S.M. |
|
|
241 |
C |
p. |
artikel |
13 |
On the timescales of correlated electron dynamics
|
Schumann, F.O. |
|
|
241 |
C |
p. |
artikel |
14 |
Optical and electronic properties of amorphous silicon dioxide by single and double electron spectroscopy
|
Astašauskas, Vytautas |
|
|
241 |
C |
p. |
artikel |
15 |
Scanning Field Emission Microscopy with Polarization Analysis (SFEMPA)
|
Bertolini, G. |
|
|
241 |
C |
p. |
artikel |
16 |
Secondary electron generation mechanisms in carbon allotropes at low impact electron energies
|
Bellissimo, Alessandra |
|
|
241 |
C |
p. |
artikel |
17 |
SEY and low-energy SEY of conductive surfaces
|
Cimino, R. |
|
|
241 |
C |
p. |
artikel |
18 |
Sources Interaction with Matter, Detection and Analysis of Low Energy Electrons
|
Werner, Wolfgang S.M. |
|
|
241 |
C |
p. |
artikel |
19 |
Spectra of correlated many-electron systems: From a one- to a two-particle description
|
Rohringer, Georg |
|
|
241 |
C |
p. |
artikel |
20 |
Spin-orbit coupling in scattering of very low-energy spin-polarized electrons from Co film by (e,2e) spectroscopy
|
Williams, J.F. |
|
|
241 |
C |
p. |
artikel |
21 |
Surface microscopy with low energy electrons: LEEM
|
Bauer, Ernst |
|
|
241 |
C |
p. |
artikel |
22 |
Time-of-flight spectrometer for efficient coincidence detection of low-energy electrons from surfaces with 2π solid angle, pair recognition and unlimited band path (2e2πCS)
|
Voss, S. |
|
|
241 |
C |
p. |
artikel |