| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A theoretical study of the photoelectron spectrum of atomic lithium
|
Larkins, F.P.
|
|
1981
|
22 |
2 |
p. 141-155
15 p.
|
artikel
|
| 2 |
Autoionization of O2 by photoelectron spectroscopy
|
Kumar, Vijay
|
|
1981
|
22 |
2 |
p. 109-118
10 p.
|
artikel
|
| 3 |
Corrigenda
|
|
|
1981
|
22 |
2 |
p. 191-
1 p.
|
artikel
|
| 4 |
Determination of the reduced thickness of surface layers by means of the substrate method
|
Ebel, Maria F.
|
|
1981
|
22 |
2 |
p. 157-172
16 p.
|
artikel
|
| 5 |
Electron mean free paths in Langmuir—Blodgett multilayers
|
Clark, D.T.
|
|
1981
|
22 |
2 |
p. 173-185
13 p.
|
artikel
|
| 6 |
Gas phase and solid state X-ray photoelectron spectra of the substituted acetylenes (SF5) n C2 (CF3)2−n (n = 0, 1, 2): A comparison of the pentafluorosulfur and trifluoromethyl groups
|
Brant, Patrick
|
|
1981
|
22 |
2 |
p. 119-129
11 p.
|
artikel
|
| 7 |
Photoelectron diffraction effects in XPS angular distributions from GaAs(110) and Ge(110) single crystals
|
Owari, Masanori
|
|
1981
|
22 |
2 |
p. 131-140
10 p.
|
artikel
|
| 8 |
Re-measurements of partial photoionization cross-sections of CH4, NH3 and H2O at 58.4 nm by He(I) photoelectron spectroscopy
|
Achiba, Y.
|
|
1981
|
22 |
2 |
p. 187-190
4 p.
|
artikel
|
| 9 |
XPS study of tellurium—niobium and tellurium—tantalum oxide systems
|
Garbassi, F.
|
|
1981
|
22 |
2 |
p. 95-107
13 p.
|
artikel
|
Tijdschrift beschrijving