nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Approaches to analyzing insulators with Auger electron spectroscopy: Update and overview
|
Baer, D.R. |
|
2010 |
176 |
1-3 |
p. 80-94 15 p. |
artikel |
2 |
Author Index
|
|
|
2010 |
176 |
1-3 |
p. 95- 1 p. |
artikel |
3 |
Chemically resolved electrical measurements in organic self-assembled molecular layers
|
Cohen, Hagai |
|
2010 |
176 |
1-3 |
p. 24-34 11 p. |
artikel |
4 |
Differential charging in X-ray photoelectron spectroscopy for characterizing organic thin films
|
Dubey, Manish |
|
2010 |
176 |
1-3 |
p. 18-23 6 p. |
artikel |
5 |
Electrical double layer at the mineral-aqueous solution interface as probed by XPS with fast-frozen samples
|
Shchukarev, Andrey |
|
2010 |
176 |
1-3 |
p. 13-17 5 p. |
artikel |
6 |
Foreword
|
Suzer, Sefik |
|
2010 |
176 |
1-3 |
p. 1- 1 p. |
artikel |
7 |
Historical perspectives on charging issues in XPS
|
Kelly, Michael A. |
|
2010 |
176 |
1-3 |
p. 5-7 3 p. |
artikel |
8 |
IFC Editorial Board
|
|
|
2010 |
176 |
1-3 |
p. CO2- 1 p. |
artikel |
9 |
Preface
|
Sherwood, Peter M.A. |
|
2010 |
176 |
1-3 |
p. 2-4 3 p. |
artikel |
10 |
Removal of charging on SiO2/Si structure during photoelectron spectroscopy measurements by metal overlayer
|
Kim, Woo-Byoung |
|
2010 |
176 |
1-3 |
p. 8-12 5 p. |
artikel |
11 |
Secondary electron emission and charging mechanisms in Auger Electron Spectroscopy and related e-beam techniques
|
Cazaux, Jacques |
|
2010 |
176 |
1-3 |
p. 58-79 22 p. |
artikel |
12 |
Study of neutralization kinetics in charged polymer–metal nanocomposite systems by photoemission spectroscopy
|
Mukherjee, S. |
|
2010 |
176 |
1-3 |
p. 35-45 11 p. |
artikel |
13 |
Subject Index
|
|
|
2010 |
176 |
1-3 |
p. 96-97 2 p. |
artikel |
14 |
XPS measurements for probing dynamics of charging
|
Suzer, Sefik |
|
2010 |
176 |
1-3 |
p. 52-57 6 p. |
artikel |
15 |
XPS time-dependent measurement of SiO2/Si and HfAlO x /Si interfaces
|
Hirose, K. |
|
2010 |
176 |
1-3 |
p. 46-51 6 p. |
artikel |