nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Ab initio calculations of plasmons and interband transitions in the low-loss electron energy-loss spectrum
|
Keast, V.J. |
|
2005 |
143 |
2-3 |
p. 97-104 8 p. |
artikel |
2 |
A new approach to study bonding anisotropy with EELS
|
Botton, G.A. |
|
2005 |
143 |
2-3 |
p. 129-137 9 p. |
artikel |
3 |
Atomic resolution electron energy-loss spectroscopy
|
Klie, R.F. |
|
2005 |
143 |
2-3 |
p. 105-115 11 p. |
artikel |
4 |
Author Index
|
|
|
2005 |
143 |
2-3 |
p. 253- 1 p. |
artikel |
5 |
Characterization of advanced gate stacks for Si CMOS by electron energy-loss spectroscopy in scanning transmission electron microscopy
|
Foran, Brendan |
|
2005 |
143 |
2-3 |
p. 149-158 10 p. |
artikel |
6 |
Coherence in electron energy loss spectrometry
|
Schattschneider, P. |
|
2005 |
143 |
2-3 |
p. 81-95 15 p. |
artikel |
7 |
conference announcement in the Journal of Electron Spectroscopy and Related Phenomena
|
|
|
2005 |
143 |
2-3 |
p. 251- 1 p. |
artikel |
8 |
Contents
|
|
|
2005 |
143 |
2-3 |
p. v- 1 p. |
artikel |
9 |
Determination of the local chemistry of iron in inorganic and organic materials
|
Calvert, Clair C. |
|
2005 |
143 |
2-3 |
p. 173-187 15 p. |
artikel |
10 |
EELS in the TEM
|
Egerton, R.F. |
|
2005 |
143 |
2-3 |
p. 43-50 8 p. |
artikel |
11 |
EELS studies of Ti-bearing materials and ab initio calculations
|
Kihn, Yolande |
|
2005 |
143 |
2-3 |
p. 117-127 11 p. |
artikel |
12 |
Electron energy loss spectroscopy microanalysis and imaging in the transmission electron microscope: example of biological applications
|
Diociaiuti, Marco |
|
2005 |
143 |
2-3 |
p. 189-203 15 p. |
artikel |
13 |
Energy-filtering transmission electron microscopy on the nanometer length scale
|
Grogger, Werner |
|
2005 |
143 |
2-3 |
p. 139-147 9 p. |
artikel |
14 |
High energy-resolution electron energy-loss spectroscopy study of the electronic structure of C60 polymer crystals
|
Terauchi, M. |
|
2005 |
143 |
2-3 |
p. 167-172 6 p. |
artikel |
15 |
High spatial resolution studies of surfaces and small particles using electron beam techniques
|
Venables, J.A. |
|
2005 |
143 |
2-3 |
p. 205-218 14 p. |
artikel |
16 |
IFC Editor Board
|
|
|
2005 |
143 |
2-3 |
p. CO2- 1 p. |
artikel |
17 |
Imaging of doped Si in low and very low voltage SEM: the contrast interpretation
|
Jayakody, G.H. |
|
2005 |
143 |
2-3 |
p. 233-239 7 p. |
artikel |
18 |
Influence of nitrogen vacancies on the N K-ELNES spectrum of titanium nitride
|
Tsujimoto, Masahiko |
|
2005 |
143 |
2-3 |
p. 159-165 7 p. |
artikel |
19 |
On the energy dissipation process in incoherent electron scattering
|
Werner, Wolfgang S.M. |
|
2005 |
143 |
2-3 |
p. 65-80 16 p. |
artikel |
20 |
Preface
|
Paparazzo, E. |
|
2005 |
143 |
2-3 |
p. 41- 1 p. |
artikel |
21 |
Reflected electron energy loss microscopy (REELM) studies of metals, semiconductors and insulators
|
Paparazzo, E. |
|
2005 |
143 |
2-3 |
p. 219-231 13 p. |
artikel |
22 |
Spatially resolved X-ray photoelectron spectroscopy
|
Blomfield, Christopher J. |
|
2005 |
143 |
2-3 |
p. 241-249 9 p. |
artikel |
23 |
Subject Index
|
|
|
2005 |
143 |
2-3 |
p. 255-257 3 p. |
artikel |
24 |
Theory of the near K-edge structure in electron energy loss spectroscopy
|
Paxton, A.T. |
|
2005 |
143 |
2-3 |
p. 51-64 14 p. |
artikel |