| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
Characteristics of PIXE channeling and its application to ZnSe thin films
|
Salonen, R.
|
|
1998
|
145 |
4 |
p. 539-544
6 p.
|
article
|
| 2 |
Comparative analysis of the low-energy He+ ions scattering on Al and Al2O3 surfaces
|
Fomin, V.M.
|
|
1998
|
145 |
4 |
p. 545-552
8 p.
|
article
|
| 3 |
Comparison of the least squares and the maximum likelihood estimators for gamma-spectrometry
|
Muravsky, V.A.
|
|
1998
|
145 |
4 |
p. 573-577
5 p.
|
article
|
| 4 |
Depth of origin of sputtered atoms for elemental targets
|
Shulga, V.I.
|
|
1998
|
145 |
4 |
p. 492-502
11 p.
|
article
|
| 5 |
Depth profiling of hydrogen in amorphous media and applicable to quartz air filters
|
Castaneda, Carlos M.
|
|
1998
|
145 |
4 |
p. 553-561
9 p.
|
article
|
| 6 |
Energy dependence of X-ray capillary performance
|
Sánchez, HéctorJorge
|
|
1998
|
145 |
4 |
p. 567-572
6 p.
|
article
|
| 7 |
Evaluation of non-Rutherford proton elastic scattering cross section for silicon
|
Gurbich, A.F.
|
|
1998
|
145 |
4 |
p. 578-583
6 p.
|
article
|
| 8 |
High resolution transmission electron microscopy of GeV heavy ion irradiated graphite
|
Dunlop, A.
|
|
1998
|
145 |
4 |
p. 532-538
7 p.
|
article
|
| 9 |
Influence of chemical effect on the Kβ-to-Kα X-ray intensity ratios of Ti, V, Cr and Fe in TiC, VC, CrB, CrB2 and FeB
|
Raj, S.
|
|
1998
|
145 |
4 |
p. 485-491
7 p.
|
article
|
| 10 |
Ion-beam densification of hydroxyapatite thin films
|
Lopatin, C.M.
|
|
1998
|
145 |
4 |
p. 522-531
10 p.
|
article
|
| 11 |
Near-surface K-Auger emission in low-energy scattering of highly charged ions with surfaces
|
Ducrée, J.
|
|
1998
|
145 |
4 |
p. 509-521
13 p.
|
article
|
| 12 |
Oxygen profiling in Czochralski-grown silicon substrates submitted to a rapid thermal annealing by using charged particles activation analysis
|
Erramli, H.
|
|
1998
|
145 |
4 |
p. 562-566
5 p.
|
article
|
| 13 |
Ta cluster bombardment of graphite: molecular dynamics study of penetration and damage
|
Henkel, M.
|
|
1998
|
145 |
4 |
p. 503-508
6 p.
|
article
|
Journal description