nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Amplitude or frequency modulation-detection in Kelvin probe force microscopy
|
Glatzel, Th |
|
2003 |
210 |
1-2 |
p. 84-89 6 p. |
artikel |
2 |
A self-assembled monolayer of a disulfide with a pair of bicyclo[2.2.2]octane moieties on Au(1 1 1) investigated by non-contact atomic force microscopy
|
Fujii, Shintaro |
|
2003 |
210 |
1-2 |
p. 79-83 5 p. |
artikel |
3 |
Atom selective imaging by NC-AFM: case of oxygen adsorbed on a Si(111)7×7 surface
|
Nishi, Ryuji |
|
2003 |
210 |
1-2 |
p. 90-92 3 p. |
artikel |
4 |
Author index
|
|
|
2003 |
210 |
1-2 |
p. I-II nvt p. |
artikel |
5 |
Dependence of the tip–surface interaction on the surface electronic structure
|
Foster, A.S. |
|
2003 |
210 |
1-2 |
p. 146-152 7 p. |
artikel |
6 |
Dynamics of small amplitude, off-resonance AFM
|
Hoffmann, Peter M. |
|
2003 |
210 |
1-2 |
p. 140-145 6 p. |
artikel |
7 |
Effect of step function-like perturbation on intermittent contact mode sensors: a response analysis
|
Kokavecz, János |
|
2003 |
210 |
1-2 |
p. 123-127 5 p. |
artikel |
8 |
Exact calculation of the tip friction within the harmonic model
|
Kantorovich, L.N. |
|
2003 |
210 |
1-2 |
p. 27-31 5 p. |
artikel |
9 |
Frequency shift feedback imaging in liquid for biological molecules
|
Sekiguchi, Hiroshi |
|
2003 |
210 |
1-2 |
p. 61-67 7 p. |
artikel |
10 |
Imaging coherent electron flow in a two-dimensional electron gas
|
LeRoy, B.J. |
|
2003 |
210 |
1-2 |
p. 134-139 6 p. |
artikel |
11 |
Imaging in situ cleaved MgO(1 0 0) with non-contact atomic force microscopy
|
Ashworth, T.V. |
|
2003 |
210 |
1-2 |
p. 2-5 4 p. |
artikel |
12 |
Ion beam-induced nanostructuring of AIIIBV semiconductor surfaces studied with dynamic force microscopy and Kelvin probe force spectroscopy
|
Krok, F. |
|
2003 |
210 |
1-2 |
p. 112-116 5 p. |
artikel |
13 |
Jumping mode scanning force microscopy: a suitable technique for imaging DNA in liquids
|
Moreno-Herrero, F |
|
2003 |
210 |
1-2 |
p. 22-26 5 p. |
artikel |
14 |
KPFM imaging of Si(1 1 1)5 3 ×5 3 -Sb surface for atom distinction using NC-AFM
|
Okamoto, Kenji |
|
2003 |
210 |
1-2 |
p. 128-133 6 p. |
artikel |
15 |
Measurement of energy dissipation between tungsten tip and Si(1 0 0)-(2×1) using sub-Ångström oscillation amplitude non-contact atomic force microscope
|
Özgür Özer, H. |
|
2003 |
210 |
1-2 |
p. 12-17 6 p. |
artikel |
16 |
Molecular dynamics simulation of non-contact atomic force microscopy of an ordered monolayer consisting of single united atoms chemisorbed strongly on a continuum substrate
|
Shiokawa, T. |
|
2003 |
210 |
1-2 |
p. 117-122 6 p. |
artikel |
17 |
Observation of stretched single DNA molecules by Kelvin probe force microscopy
|
Kwak, K.J. |
|
2003 |
210 |
1-2 |
p. 73-78 6 p. |
artikel |
18 |
Phase imaging of buried structures
|
Yongsunthon, R. |
|
2003 |
210 |
1-2 |
p. 6-11 6 p. |
artikel |
19 |
Phase-separated alkanethiol self-assembled monolayers investigated by non-contact AFM
|
Ichii, T. |
|
2003 |
210 |
1-2 |
p. 99-104 6 p. |
artikel |
20 |
Preface
|
Grutter, Peter |
|
2003 |
210 |
1-2 |
p. 1- 1 p. |
artikel |
21 |
Pseudo-non-contact mode: why it can give true atomic resolution
|
Sokolov, I.Yu. |
|
2003 |
210 |
1-2 |
p. 37-42 6 p. |
artikel |
22 |
Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation
|
Sadewasser, S. |
|
2003 |
210 |
1-2 |
p. 32-36 5 p. |
artikel |
23 |
Self-oscillation technique for AFM in liquids
|
Okajima, Takaharu |
|
2003 |
210 |
1-2 |
p. 68-72 5 p. |
artikel |
24 |
Self-sensing and self-actuating probe based on quartz tuning fork combined with microfabricated cantilever for dynamic mode atomic force microscopy
|
Akiyama, T |
|
2003 |
210 |
1-2 |
p. 18-21 4 p. |
artikel |
25 |
Simulation of section curve by phase constant dynamic mode atomic force microscopy in non-contact situation
|
Nanjo, H. |
|
2003 |
210 |
1-2 |
p. 49-53 5 p. |
artikel |
26 |
Single molecule imaging of RNA polymerase II using atomic force microscopy
|
Rhodin, Thor |
|
2003 |
210 |
1-2 |
p. 105-111 7 p. |
artikel |
27 |
Subject Index
|
|
|
2003 |
210 |
1-2 |
p. III-VI nvt p. |
artikel |
28 |
The Cu(1 0 0)-c(2×2) N structure studied by combined nc-AFM/STM
|
Schär, S. |
|
2003 |
210 |
1-2 |
p. 43-48 6 p. |
artikel |
29 |
Tribology and ultrasonic hysteresis at local scales
|
Szoszkiewicz, R. |
|
2003 |
210 |
1-2 |
p. 54-60 7 p. |
artikel |
30 |
Two-dimensional dopant profiling by scanning capacitance force microscopy
|
Kimura, K. |
|
2003 |
210 |
1-2 |
p. 93-98 6 p. |
artikel |