| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
Absorption spectrum of Nd3+:LiNH4SO4 single crystals
|
Ramesh Babu, V.
|
|
1986
|
4 |
2 |
p. 99-101
3 p.
|
article
|
| 2 |
A new method for selecting the IR oxygen- and carbon-free reference sample
|
Yuezhen, Li
|
|
1986
|
4 |
2 |
p. 117-119
3 p.
|
article
|
| 3 |
Anomalous microwave melting of zeolites
|
Komarneni, Sridhar
|
|
1986
|
4 |
2 |
p. 107-110
4 p.
|
article
|
| 4 |
A solution growth technique for the preparation of zinc sulfide thin film
|
Biswas, S.
|
|
1986
|
4 |
2 |
p. 81-84
4 p.
|
article
|
| 5 |
Composition gradients in bridgman-grown Hg 1−x Mn x Te
|
Tamjidi, M.R.
|
|
1986
|
4 |
2 |
p. 90-92
3 p.
|
article
|
| 6 |
Dynamic compressive behaviour of unidirectional GFRP for various fibre orientations
|
Kumar, Prashant
|
|
1986
|
4 |
2 |
p. 111-116
6 p.
|
article
|
| 7 |
Effects of back interface impurities on the action spectrum of thin cadmium sulfide layers
|
Ebothé, Jean
|
|
1986
|
4 |
2 |
p. 85-89
5 p.
|
article
|
| 8 |
Influence of laser surface boronizing on the high-temperature oxidation of nickel
|
Caillet, M.
|
|
1986
|
4 |
2 |
p. 102-106
5 p.
|
article
|
| 9 |
Intervalence-band absorption spectra and hole effective masses in CuGaTe2
|
Neumann, H.
|
|
1986
|
4 |
2 |
p. 57-60
4 p.
|
article
|
| 10 |
Low-pressure growth of single-crystal silicon carbide
|
Harris, G.L.
|
|
1986
|
4 |
2 |
p. 77-80
4 p.
|
article
|
| 11 |
Measurement of thermal stress in Pd2Si film on Si(111) by absorption edge contour mapping
|
Chen, Haydn
|
|
1986
|
4 |
2 |
p. 61-64
4 p.
|
article
|
| 12 |
Observation of pendellösung fringes in reflection-section topographs of bent silicon crystals
|
Chen, Haydn
|
|
1986
|
4 |
2 |
p. 65-70
6 p.
|
article
|
| 13 |
Optical properties of tin oxide on anodized aluminium
|
Roos, A.
|
|
1986
|
4 |
2 |
p. 49-51
3 p.
|
article
|
| 14 |
Pre-switching non-linear region and delay time in the Cu0.15As0.35Se0.50 semiconducting glass
|
Márquez, E.
|
|
1986
|
4 |
2 |
p. 52-56
5 p.
|
article
|
| 15 |
Semi-insulating polysilicon: Growth, processing and structural characterization
|
Prasad, R.V.
|
|
1986
|
4 |
2 |
p. 71-76
6 p.
|
article
|
| 16 |
Titanium incorporation into LiNbO3 using scanned electron beam annealing
|
Al-Chalabi, S.A.M.
|
|
1986
|
4 |
2 |
p. 93-98
6 p.
|
article
|
Journal description