| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
Contrasting the 0.3 μm depth carrier concentration with dislocation density in a Si-implanted layer
|
Saito, Yasuyuki
|
|
1992
|
13 |
1 |
p. 40-46
7 p.
|
article
|
| 2 |
Editorial Board
|
|
|
1992
|
13 |
1 |
p. ii-
1 p.
|
article
|
| 3 |
Electrodeposition and characterization of iron sulphide thin films
|
Aricò, A.S.
|
|
1992
|
13 |
1 |
p. 12-17
6 p.
|
article
|
| 4 |
Enhanced T c in Sn-added Bi-2-1-2-2 superconductor
|
Sekhar, B.R.
|
|
1992
|
13 |
1 |
p. 1-6
6 p.
|
article
|
| 5 |
Evolution upward from the interface of the coarse structure existing in inhomogeneous III–V epitaxial layers
|
Peiró, F.
|
|
1992
|
13 |
1 |
p. 47-50
4 p.
|
article
|
| 6 |
Formation of TiN phase in SiO2 and Si through ion implantation of constituent elements
|
Rai, A.K.
|
|
1992
|
13 |
1 |
p. 35-39
5 p.
|
article
|
| 7 |
High-T c of undoped and fluorine-doped YBa2Cu3O y films on ceramic substrates by screen printing
|
Bansal, Narottam P.
|
|
1992
|
13 |
1 |
p. 7-11
5 p.
|
article
|
| 8 |
New black glasses in the CdO-Al2O3-SiO2 system useful for optical devices
|
Rivera, E.
|
|
1992
|
13 |
1 |
p. 27-31
5 p.
|
article
|
| 9 |
Some aspects of the behaviour of Bi in a matrix of Se
|
Atmani, H.
|
|
1992
|
13 |
1 |
p. 21-26
6 p.
|
article
|
| 10 |
Surface short-range order induced by rf annealing of Fe81B13.5Si3.5C2 glass
|
Rogalski, M
|
|
1992
|
13 |
1 |
p. 32-34
3 p.
|
article
|
| 11 |
Thermal diffusivity measurements for Mg-Mn ferrites
|
Bertolotti, M.
|
|
1992
|
13 |
1 |
p. 51-55
5 p.
|
article
|
| 12 |
The superhyperfine structure in the EPR spectra of Eu2+ ions in PbTe films
|
Gromovoj, Yu.S.
|
|
1992
|
13 |
1 |
p. 18-20
3 p.
|
article
|
| 13 |
XPS analysis of tungsten electrodeposit from formamide bath
|
Takei, T.
|
|
1992
|
13 |
1 |
p. 56-63
8 p.
|
article
|
Journal description