| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
An approach to test synthesis from higher level 1 This work was supported in part by Semiconductor Technology Academic Research Center (STARC) under the Research Project and in part by the Ministry of Education, Science, Sports and Culture, Japan under the Grant-in-Aid for Scientific Research B(2) (No.09480054). 1
|
Inoue, Michiko
|
|
1998
|
26 |
1-2 |
p. 101-116
16 p.
|
artikel
|
| 2 |
A new approach in feature interaction testing
|
Nakamura, Masahide
|
|
1998
|
26 |
1-2 |
p. 211-223
13 p.
|
artikel
|
| 3 |
BIST for systems-on-a-chip
|
Wunderlich, Hans-Joachim
|
|
1998
|
26 |
1-2 |
p. 55-78
24 p.
|
artikel
|
| 4 |
Delay fault models for VLSI circuits 1 Work supported in part by NSF Grant Nos. MIP-9357581, and MIP-9725053 1
|
Pomeranz, Irith
|
|
1998
|
26 |
1-2 |
p. 21-40
20 p.
|
artikel
|
| 5 |
Design of mixed-signal systems for testability
|
Agrawal, Vishwani D
|
|
1998
|
26 |
1-2 |
p. 141-150
10 p.
|
artikel
|
| 6 |
Editorial
|
|
|
1998
|
26 |
1-2 |
p. 1-3
3 p.
|
artikel
|
| 7 |
FTROM: A Silicon Compiler for Fault-tolerant ROMs 1 Extended version of a paper presented at the IEEE Symposium on Defect and Fault Tolerance in VLSI Systems (Austin, Nov. 1998). This research was partially supported by the Army Research Office under its MURI programs at the University of Michigan and also by the National Science Foundation. 1
|
Gupta, Anurag
|
|
1998
|
26 |
1-2 |
p. 117-140
24 p.
|
artikel
|
| 8 |
High-level test synthesis: a survey
|
Ghosh, Indradeep
|
|
1998
|
26 |
1-2 |
p. 79-99
21 p.
|
artikel
|
| 9 |
I DDQ testing: state of the art and future trends
|
Ferré, A
|
|
1998
|
26 |
1-2 |
p. 167-196
30 p.
|
artikel
|
| 10 |
Mixed-signal on-chip timing measurements
|
Soma, Mani
|
|
1998
|
26 |
1-2 |
p. 151-165
15 p.
|
artikel
|
| 11 |
On-line testing for VLSI: state of the art and trends
|
Nicolaidis, Michael
|
|
1998
|
26 |
1-2 |
p. 197-209
13 p.
|
artikel
|
| 12 |
Sequential test generators: past, present and future
|
Chang Kim, Yong
|
|
1998
|
26 |
1-2 |
p. 41-54
14 p.
|
artikel
|
| 13 |
Testing with decision diagrams
|
Becker, Bernd
|
|
1998
|
26 |
1-2 |
p. 5-20
16 p.
|
artikel
|
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