nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A simple model for the adsorption of mixtures on solids involving energetic heterogeneity of the surface and differences in molecular sizes of the components
|
Jaroniec, M. |
|
1981 |
81 |
1 |
p. L97-L99 nvt p. |
artikel |
2 |
A study from electrical conductivity data of the defect concentration in as-grown indium thin films vacuum deposited at different deposition rates
|
Das, V.Damodara |
|
1981 |
81 |
1 |
p. 21-25 5 p. |
artikel |
3 |
Direct observation of the duplex nature of anodic barrier films on aluminum
|
Shimizu, K. |
|
1981 |
81 |
1 |
p. 39-44 6 p. |
artikel |
4 |
Editorial Board
|
|
|
1981 |
81 |
1 |
p. i- 1 p. |
artikel |
5 |
Effect of hydrogen on the growth kinetics of Pd2Si
|
Barbarino, A.E. |
|
1981 |
81 |
1 |
p. 35-38 4 p. |
artikel |
6 |
Effect of water vapour on the switching phenomena in silver thin films produced by electroforming
|
Tanaka, Koji |
|
1981 |
81 |
1 |
p. L85-L87 nvt p. |
artikel |
7 |
Gel-derived single-layer antireflection films with a refractive index gradient
|
Mukherjee, S.P. |
|
1981 |
81 |
1 |
p. L89-L90 nvt p. |
artikel |
8 |
Low temperature resistivity of thin film and bulk samples of CuAl2 and Cu9Al4
|
Macchioni, C. |
|
1981 |
81 |
1 |
p. 71-78 8 p. |
artikel |
9 |
Observation of gas absorption in evaporated amorphous silicon films using secondary ion mass spectrometry
|
Magee, Charles W. |
|
1981 |
81 |
1 |
p. 1-6 6 p. |
artikel |
10 |
Phase transitions in adsorbed layers II: A simple theory exhibiting two phase transitions in monolayer films of gases on homogeneous solid surfaces
|
Patrykiejew, A. |
|
1981 |
81 |
1 |
p. 89-99 11 p. |
artikel |
11 |
Preparation of ZnS films by reactive sputtering and their investigation by electron microscopy and Rutherford backscattering
|
Schönbrodt, L. |
|
1981 |
81 |
1 |
p. 45-52 8 p. |
artikel |
12 |
Quantitative Auger electron spectroscopy and X-ray fluorescence analysis of CoSm alloy thin films deposited by co-evaporation
|
Anton, R. |
|
1981 |
81 |
1 |
p. 53-60 8 p. |
artikel |
13 |
Stimulated crystallization of dielectric films on semiconductor surfaces (Si/SiO2)
|
Litovchenko, V.G. |
|
1981 |
81 |
1 |
p. 27-34 8 p. |
artikel |
14 |
Temperature distribution in plasma-sprayed coatings
|
PawŁowski, Lech |
|
1981 |
81 |
1 |
p. 79-88 10 p. |
artikel |
15 |
The effect of ion bombardment on stress and adhesion in thin films of silver and aluminum
|
Laugier, M. |
|
1981 |
81 |
1 |
p. 61-69 9 p. |
artikel |
16 |
The effect of ion implantation on r.f.-sputtered TiB2 films
|
Padmanabhan, K.R. |
|
1981 |
81 |
1 |
p. 13-19 7 p. |
artikel |
17 |
The orientation of vapour-deposited silver crystallites on mica
|
Gardiner, T.M. |
|
1981 |
81 |
1 |
p. L93-L96 nvt p. |
artikel |
18 |
The origin of the uncommon X-ray reflections of CdS:Mn, Cl polycrystalline thin films
|
Ciecholewski, R. |
|
1981 |
81 |
1 |
p. 7-12 6 p. |
artikel |
19 |
Titanium nitride films prepared by ion implantation
|
Chen, P.A. |
|
1981 |
81 |
1 |
p. L91-L92 nvt p. |
artikel |