| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
An error analysis of the SYNCANG and SYNCWANG methods for the measurement of film refractive index and thickness
|
Walter, D.J.
|
|
1977
|
46 |
1 |
p. 7-15
9 p.
|
artikel
|
| 2 |
A technique for modifying the aperture of an interdigital transducer finger pattern for a surface acoustic wave device
|
Nanayakkara, S
|
|
1977
|
46 |
1 |
p. 75-80
6 p.
|
artikel
|
| 3 |
Cadmium selenide sputtered films
|
Glew, R.W.
|
|
1977
|
46 |
1 |
p. 59-67
9 p.
|
artikel
|
| 4 |
Editorial Board
|
|
|
1977
|
46 |
1 |
p. iii-
1 p.
|
artikel
|
| 5 |
Effects of temperature on the solid phase epitaxy of silicon
|
Liau, Z.L.
|
|
1977
|
46 |
1 |
p. 93-98
6 p.
|
artikel
|
| 6 |
MOS processing for III–V compound semiconductors: Overview and bibliography
|
Wilmsen, C.W.
|
|
1977
|
46 |
1 |
p. 17-45
29 p.
|
artikel
|
| 7 |
Schichtdickenzunahme, spannungsabfall und ladungsverbrauch beim ausformieren von tantalschichten
|
Juergens, W.
|
|
1977
|
46 |
1 |
p. 69-74
6 p.
|
artikel
|
| 8 |
The coercivity of CoFeP thin ferromagnetic films
|
Bursuc, I.D.
|
|
1977
|
46 |
1 |
p. 1-6
6 p.
|
artikel
|
| 9 |
The crystalline qualities of silicon layers formed by solid phase epitaxial growth
|
Tseng, W.F.
|
|
1977
|
46 |
1 |
p. 99-107
9 p.
|
artikel
|
| 10 |
Thermal strain in lead thin films I: Dependence of the strain on crystal orientation
|
Murakami, M.
|
|
1977
|
46 |
1 |
p. 109-115
7 p.
|
artikel
|
| 11 |
Thickness distribution in thin films
|
Hattori, Takeo
|
|
1977
|
46 |
1 |
p. 47-58
12 p.
|
artikel
|
| 12 |
Étude expérimentale de la transmission d'électrons d'énergie inférieure à 3 keV à travers des lames minces d'aluminium sans support
|
Rostaing, P.
|
|
1977
|
46 |
1 |
p. 81-91
11 p.
|
artikel
|
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