nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A chromium carbide phase with B1 structure in thin films prepared by ion plating
|
Bewilogua, K. |
|
1988 |
167 |
1-2 |
p. 233-244 12 p. |
artikel |
2 |
A new approach to the fabrication of cuprous sulphide-cadmium sulphide solar cells
|
Cumberbatch, T.J. |
|
1988 |
167 |
1-2 |
p. 169-174 6 p. |
artikel |
3 |
A surface plasmon-polariton study of the dielectric constants of reactive metals: Aluminium
|
Tillin, M.D. |
|
1988 |
167 |
1-2 |
p. 73-84 12 p. |
artikel |
4 |
A transmission electron microscopy study of the crystallization of ion-beam-mixed Pd80Si20 amorphous thin films
|
Janicki, A.J. |
|
1988 |
167 |
1-2 |
p. 141-148 8 p. |
artikel |
5 |
Author index
|
|
|
1988 |
167 |
1-2 |
p. 317-318 2 p. |
artikel |
6 |
Cathodic arc plasma deposition technology
|
Randhawa, H. |
|
1988 |
167 |
1-2 |
p. 175-186 12 p. |
artikel |
7 |
Changes in the properties of glow-discharge-deposited microcrystalline silicon films with thickness
|
De, S.C. |
|
1988 |
167 |
1-2 |
p. 121-128 8 p. |
artikel |
8 |
Chemically deposited Cu2O thin film as an oxygen pressure sensor
|
Ristov, M. |
|
1988 |
167 |
1-2 |
p. 309-316 8 p. |
artikel |
9 |
Contamination ionique des couches minces de silice par des solutions NaI et KCl
|
Choquet, C. |
|
1988 |
167 |
1-2 |
p. 45-56 12 p. |
artikel |
10 |
Crystallization of amorphous antimony layers on as-deposited ultrathin sublayers of silver
|
Hashimoto, Mituru |
|
1988 |
167 |
1-2 |
p. 223-232 10 p. |
artikel |
11 |
Crystallization of amorphous silicon films using a multistep thermal annealing process
|
Korin, E. |
|
1988 |
167 |
1-2 |
p. 101-106 6 p. |
artikel |
12 |
Determination of the composition of sputtered silcon oxynitride films by Auger electron spectroscopy and Rutherford backscattering spectrometry
|
Reinhardt, Herwig |
|
1988 |
167 |
1-2 |
p. L1-L6 nvt p. |
artikel |
13 |
Editorial Board
|
|
|
1988 |
167 |
1-2 |
p. iii- 1 p. |
artikel |
14 |
Effect of addition of fluorine to phosphorous-doped tin oxide films
|
Upadhyay, J.P. |
|
1988 |
167 |
1-2 |
p. L7-L10 nvt p. |
artikel |
15 |
Effect of temperature rise on the growth rate of anodic SiO2
|
Katircioǧlu, B. |
|
1988 |
167 |
1-2 |
p. 129-140 12 p. |
artikel |
16 |
Electrical resistivity and structural changes in amorphous Ge1−x Al x thin films under thermal annealing
|
Catalina, F. |
|
1988 |
167 |
1-2 |
p. 57-66 10 p. |
artikel |
17 |
Frequency-dependent conductivity in vanadium pentoxide gel
|
Murawski, L. |
|
1988 |
167 |
1-2 |
p. 67-72 6 p. |
artikel |
18 |
High efficiency front and rear surface silver reflectors
|
Viswanathan, M. |
|
1988 |
167 |
1-2 |
p. 291-298 8 p. |
artikel |
19 |
High reflectance bands of some simple two-material dielectric multilayers
|
Leś, Z. |
|
1988 |
167 |
1-2 |
p. 33-44 12 p. |
artikel |
20 |
Hydrogen incorporation scheme in a-Si:H prepared by photochemical vapour deposition
|
Kumeda, Minoru |
|
1988 |
167 |
1-2 |
p. L23-L26 nvt p. |
artikel |
21 |
Impurity distribution of very thin permalloy films
|
Kitada, Masahiro |
|
1988 |
167 |
1-2 |
p. L39-L41 nvt p. |
artikel |
22 |
Influence of oxides at metal electrode-amorphous silicon interface on solar cell characteristics
|
Suzuki, K. |
|
1988 |
167 |
1-2 |
p. 85-94 10 p. |
artikel |
23 |
Intermetallic phase formation in aluminium and iron thin film systems
|
Csanády, A. |
|
1988 |
167 |
1-2 |
p. 203-216 14 p. |
artikel |
24 |
Magnetic properties and defects in polycrystalline nickel films I: Microstructure-related magnetic anisotropy
|
Belu-Marian, A. |
|
1988 |
167 |
1-2 |
p. 1-12 12 p. |
artikel |
25 |
Mass spectrometric study of gas evolution from plasma-deposited fluorohydrogenated amorphous carbon films on heating
|
Sah, R.E. |
|
1988 |
167 |
1-2 |
p. 255-260 6 p. |
artikel |
26 |
New results in d.c. reactive magnetron deposition of TiN x films
|
Musil, J. |
|
1988 |
167 |
1-2 |
p. 107-120 14 p. |
artikel |
27 |
Oxide film formation and thickening on titanium in water
|
el Din, A.M.Shams |
|
1988 |
167 |
1-2 |
p. 269-280 12 p. |
artikel |
28 |
Preparation and characterization of chemically deposited CuInSe2 films
|
Murali, K.R. |
|
1988 |
167 |
1-2 |
p. L19-L22 nvt p. |
artikel |
29 |
Preparation of copper indium disulphide films by airless spraying
|
Belgacem, S. |
|
1988 |
167 |
1-2 |
p. 217-222 6 p. |
artikel |
30 |
Preparation of transparent and conducting indium oxide films by solution pyrolysis of dibutylindium thiolate
|
Nomura, Ryoki |
|
1988 |
167 |
1-2 |
p. L27-L30 nvt p. |
artikel |
31 |
Rapid IR lamp alloying of nickel-based ohmic contacts on n-GaAs
|
Gill, Sukhdev S. |
|
1988 |
167 |
1-2 |
p. 161-168 8 p. |
artikel |
32 |
Reflectivity of sputtered aluminum alloy films
|
Rieck, U. |
|
1988 |
167 |
1-2 |
p. L35-L38 nvt p. |
artikel |
33 |
R.f.-sputtered indium tin oxide films on water-cooled substrates
|
Mansingh, Abhai |
|
1988 |
167 |
1-2 |
p. L11-L14 nvt p. |
artikel |
34 |
Secondary electron emission studies on MgO films
|
Ushio, Y. |
|
1988 |
167 |
1-2 |
p. 299-308 10 p. |
artikel |
35 |
Silicide formation in the Pt/a-Si:H system
|
Ito, Taichiro |
|
1988 |
167 |
1-2 |
p. 187-194 8 p. |
artikel |
36 |
Space charge and electret behaviour in anodic Ta2O5 films
|
Montero, I. |
|
1988 |
167 |
1-2 |
p. 95-100 6 p. |
artikel |
37 |
Säulenwchstum bei aufgedampften schichten
|
Fiedler Und, R. |
|
1988 |
167 |
1-2 |
p. 281-290 10 p. |
artikel |
38 |
Temperature and thickness dependence of the resistivity of thin polycrystalline aluminium, cobalt, nickel, palladium, silver and gold films
|
De Vries, J.W.C. |
|
1988 |
167 |
1-2 |
p. 25-32 8 p. |
artikel |
39 |
The effect of argon during the plasma-assisted chemical vapor deposition of TiN
|
Hilton, M.R. |
|
1988 |
167 |
1-2 |
p. L31-L34 nvt p. |
artikel |
40 |
The influence of photoangular effect on dynamic characteristics of the current in CdS(Cu,Cl) thin films
|
Porada, Z. |
|
1988 |
167 |
1-2 |
p. L15-L18 nvt p. |
artikel |
41 |
The sticking of magnesium on ω-tricosenoic acid multilayers deposited by the langmuir-blodgett technique
|
Geddes, N.J. |
|
1988 |
167 |
1-2 |
p. 261-268 8 p. |
artikel |
42 |
Transient currents in conditions of continuous injection in thin insulating layers with spatially non-homogeneous trap distribution
|
Rybicki, J. |
|
1988 |
167 |
1-2 |
p. 13-24 12 p. |
artikel |
43 |
Étude par microdiffraction des particules icosaédriques de nickel obtenues par réduction d'un sel en phase liquide
|
Brieu, M. |
|
1988 |
167 |
1-2 |
p. 149-160 12 p. |
artikel |
44 |
Use of binuclear organometallic compounds in chemical vapour deposition
|
Feurer, R. |
|
1988 |
167 |
1-2 |
p. 195-202 8 p. |
artikel |
45 |
X-ray photoelectron spectroscopy and Rutherford backscattering spectrometry study of anion incorporation in anodically grown films
|
Magnussen, N. |
|
1988 |
167 |
1-2 |
p. 245-254 10 p. |
artikel |