| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Aberration-free moiré profilometry—Analysis, simulation and implementation of the optimal setup geometry
|
Buytaert, Jan A.N.
|
|
2012
|
50 |
8 |
p. 1119-1129
11 p.
|
artikel
|
| 2 |
Analysis and synthesis of phase shifting algorithms based on linear systems theory
|
Servin, M.
|
|
2012
|
50 |
8 |
p. 1009-1014
6 p.
|
artikel
|
| 3 |
Comparison of Fourier transform, windowed Fourier transform, and wavelet transform methods for phase calculation at discontinuities in fringe projection profilometry
|
Zhang, Zonghua
|
|
2012
|
50 |
8 |
p. 1152-1160
9 p.
|
artikel
|
| 4 |
Comparison on performance of some representative and recent filtering methods in electronic speckle pattern interferometry
|
Tang, Chen
|
|
2012
|
50 |
8 |
p. 1036-1051
16 p.
|
artikel
|
| 5 |
Detection of defects from fringe patterns using a pseudo-Wigner–Ville distribution based method
|
Rajshekhar, Gannavarpu
|
|
2012
|
50 |
8 |
p. 1059-1062
4 p.
|
artikel
|
| 6 |
2D simultaneous phase unwrapping and filtering: A review and comparison
|
Estrada, Julio C.
|
|
2012
|
50 |
8 |
p. 1026-1029
4 p.
|
artikel
|
| 7 |
Editorial Board
|
|
|
2012
|
50 |
8 |
p. IFC-
1 p.
|
artikel
|
| 8 |
Far-field modeling of Moiré interferometry using scalar diffraction theory
|
Chen, Bicheng
|
|
2012
|
50 |
8 |
p. 1168-1176
9 p.
|
artikel
|
| 9 |
Fringe analysis: Premise and perspectives
|
Rajshekhar, Gannavarpu
|
|
2012
|
50 |
8 |
p. iii-x
nvt p.
|
artikel
|
| 10 |
High temporal and spatial resolution in time resolved speckle interferometry
|
Borza, Dan N.
|
|
2012
|
50 |
8 |
p. 1075-1083
9 p.
|
artikel
|
| 11 |
Investigation of phase error correction for digital sinusoidal phase-shifting fringe projection profilometry
|
Ma, S.
|
|
2012
|
50 |
8 |
p. 1107-1118
12 p.
|
artikel
|
| 12 |
Measurement uncertainty of Carré-type phase-stepping algorithms
|
Hack, Erwin
|
|
2012
|
50 |
8 |
p. 1023-1025
3 p.
|
artikel
|
| 13 |
Modulo-2pi phase determination from individual ESPI images
|
Georgas, Peter J.
|
|
2012
|
50 |
8 |
p. 1030-1035
6 p.
|
artikel
|
| 14 |
Recent progress in two-dimensional continuous wavelet transform technique for fringe pattern analysis
|
Wang, Zhaoyang
|
|
2012
|
50 |
8 |
p. 1052-1058
7 p.
|
artikel
|
| 15 |
Review of fringe pattern phase recovery using the 1-D and 2-D continuous wavelet transforms
|
Watkins, Lionel R.
|
|
2012
|
50 |
8 |
p. 1015-1022
8 p.
|
artikel
|
| 16 |
Review of single-shot 3D shape measurement by phase calculation-based fringe projection techniques
|
Zhang, Z.H.
|
|
2012
|
50 |
8 |
p. 1097-1106
10 p.
|
artikel
|
| 17 |
Role of data processing in measuring temperature gradients with DOE Schardin's schlieren #2
|
Ambrosini, D.
|
|
2012
|
50 |
8 |
p. 1069-1074
6 p.
|
artikel
|
| 18 |
Self-correction phase unwrapping method based on Gray-code light
|
Zheng, Dongliang
|
|
2012
|
50 |
8 |
p. 1130-1139
10 p.
|
artikel
|
| 19 |
Static and dynamic features of Fourier transform profilometry: A review
|
Zappa, Emanuele
|
|
2012
|
50 |
8 |
p. 1140-1151
12 p.
|
artikel
|
| 20 |
Vibration phase mapping using holographic optical element-based electronic speckle pattern interferometry
|
Bavigadda, Viswanath
|
|
2012
|
50 |
8 |
p. 1161-1167
7 p.
|
artikel
|
| 21 |
Wavelength scanning interferometry using a Ti:Sapphire laser with wide tuning range
|
Davila, A.
|
|
2012
|
50 |
8 |
p. 1089-1096
8 p.
|
artikel
|
| 22 |
White-light interferometry—Envelope detection by Hilbert transform and influence of noise
|
Pavliček, Pavel
|
|
2012
|
50 |
8 |
p. 1063-1068
6 p.
|
artikel
|
| 23 |
White light interferometry for surface profiling with a colour CCD
|
Kumar, U. Paul
|
|
2012
|
50 |
8 |
p. 1084-1088
5 p.
|
artikel
|
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