| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Compaction-based concurrent error detection for digital circuits
|
Almukhaizim, Sobeeh
|
|
2005
|
36 |
9 |
p. 856-862
7 p.
|
artikel
|
| 2 |
Designing leakage tolerant, low power wide-OR dominos for sub-130nm CMOS technologies
|
Chatterjee, Bhaskar
|
|
2005
|
36 |
9 |
p. 801-809
9 p.
|
artikel
|
| 3 |
International Symposium on Quality Electronic Design
|
De Venuto, Daniela
|
|
2005
|
36 |
9 |
p. 787-788
2 p.
|
artikel
|
| 4 |
Monolithic voltage conversion in low-voltage CMOS technologies
|
Kursun, Volkan
|
|
2005
|
36 |
9 |
p. 863-867
5 p.
|
artikel
|
| 5 |
Robustness enhancement through chip-package co-design for high-speed electronics
|
Shen, Meigen
|
|
2005
|
36 |
9 |
p. 846-855
10 p.
|
artikel
|
| 6 |
Standby supply voltage minimization for deep sub-micron SRAM
|
Qin, Huifang
|
|
2005
|
36 |
9 |
p. 789-800
12 p.
|
artikel
|
| 7 |
Test generation for specification test of analog circuits using efficient test response observation methods
|
Halder, Achintya
|
|
2005
|
36 |
9 |
p. 820-832
13 p.
|
artikel
|
| 8 |
Testing high resolution ΣΔ ADC's by using the quantizer input as test access
|
De Venuto, Daniela
|
|
2005
|
36 |
9 |
p. 810-819
10 p.
|
artikel
|
| 9 |
Timing analysis of network on chip architectures for MP-SoC platforms
|
Grecu, Cristian
|
|
2005
|
36 |
9 |
p. 833-845
13 p.
|
artikel
|
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