nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Analysis of the effects of reflectance and refraction generated by wafers made from fused silica, ALOxNy and TiSixNy under different light sources on pattern length and best focus
|
Kuo, Yang-Kuao |
|
2005 |
36 |
1 |
p. 35-39 5 p. |
artikel |
2 |
An investigation on the relation between digital circuitry characteristics and power supply noise spectrum in mixed-signal CMOS integrated circuits
|
Méndez, Miguel A. |
|
2005 |
36 |
1 |
p. 77-84 8 p. |
artikel |
3 |
A novel compact circuit for 4-PAM energy-efficient high speed interconnect data transmission and reception
|
Avci, Uygar |
|
2005 |
36 |
1 |
p. 67-75 9 p. |
artikel |
4 |
Approximate process-parameter-dependent study of the logarithmic domain lossy integrator harmonic distortion levels
|
Drakakis, E.M. |
|
2005 |
36 |
1 |
p. 5-23 19 p. |
artikel |
5 |
Corrigendum to: Design and analysis of planar printed microwave and PBG filters using an FDTD method
|
Tong, Ming-Sze |
|
2005 |
36 |
1 |
p. 97- 1 p. |
artikel |
6 |
Dependence of GaAs:Si persistent photoconductivity on temperature and α-particle irradiation
|
Zardas, G.E. |
|
2005 |
36 |
1 |
p. 1-4 4 p. |
artikel |
7 |
Dielectric breakdown characteristics and interface trapping of hafnium oxide films
|
Zhan, N. |
|
2005 |
36 |
1 |
p. 29-33 5 p. |
artikel |
8 |
Editorial board
|
|
|
2005 |
36 |
1 |
p. IFC- 1 p. |
artikel |
9 |
Effects of extended dislocations on charge distribution in GaN epilayer
|
Choi, H. |
|
2005 |
36 |
1 |
p. 25-28 4 p. |
artikel |
10 |
Electrical overstress due to ESD induced displacement currents
|
Kaschani, K.T. |
|
2005 |
36 |
1 |
p. 85-90 6 p. |
artikel |
11 |
Electrical properties of vacuum annealed La2O3 thin films grown by E-beam evaporation
|
Kim, Yongshik |
|
2005 |
36 |
1 |
p. 41-49 9 p. |
artikel |
12 |
Fabrication of 128×128 element optical switch array by micromachining technology
|
Wang, S.B. |
|
2005 |
36 |
1 |
p. 91-95 5 p. |
artikel |
13 |
Fabrication of sharp silicon tips employing anisotropic wet etching and reactive ion etching
|
Alves, M.A.R. |
|
2005 |
36 |
1 |
p. 51-54 4 p. |
artikel |
14 |
Full-band Monte Carlo simulation of thin InP p+–i–n+ diodes
|
You, A.H. |
|
2005 |
36 |
1 |
p. 61-65 5 p. |
artikel |
15 |
Nanomechanical characterization of polymer using atomic force microscopy and nanoindentation
|
Fang, Te-Hua |
|
2005 |
36 |
1 |
p. 55-59 5 p. |
artikel |