nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A current shaping methodology for lowering em disturbances in asynchronous circuits
|
Panyasak, Dhanistha |
|
2004 |
35 |
6 |
p. 531-540 10 p. |
artikel |
2 |
An EMC-oriented VHDL-AMS simulation methodology for dynamic current activity assessment
|
Perdriau, Richard |
|
2004 |
35 |
6 |
p. 541-546 6 p. |
artikel |
3 |
An overview of standards in electromagnetic compatibility for integrated circuits
|
Carlton, Ross M |
|
2004 |
35 |
6 |
p. 487-495 9 p. |
artikel |
4 |
Behavioral EMI models of complex digital VLSI circuits
|
Steinecke, T |
|
2004 |
35 |
6 |
p. 547-555 9 p. |
artikel |
5 |
Editorial Board
|
|
|
2004 |
35 |
6 |
p. IFC- 1 p. |
artikel |
6 |
Electromagnetic compatibility of integrated circuits
|
Sicard, E |
|
2004 |
35 |
6 |
p. 485-486 2 p. |
artikel |
7 |
GTEM cell facility use during project development phases for automotive
|
Maurice, Olivier |
|
2004 |
35 |
6 |
p. 563-569 7 p. |
artikel |
8 |
IBIS and ICEM interaction
|
Ross, Bob |
|
2004 |
35 |
6 |
p. 497-500 4 p. |
artikel |
9 |
ICEM modelling of microcontroller current activity
|
Levant, Jean-Luc |
|
2004 |
35 |
6 |
p. 501-507 7 p. |
artikel |
10 |
Influence of the power supply on the radiated electromagnetic emission of integrated circuits
|
Ostermann, T. |
|
2004 |
35 |
6 |
p. 525-530 6 p. |
artikel |
11 |
Investigation on RFI effects in bandgap voltage references
|
Fiori, F |
|
2004 |
35 |
6 |
p. 557-561 5 p. |
artikel |
12 |
REGINA test mask: research on EMC guidelines for integrated automotive circuits
|
Lochot, C. |
|
2004 |
35 |
6 |
p. 509-523 15 p. |
artikel |