nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
An ac microcalorimeter for measuring specific heat of thin films
|
Song, Qinglin |
|
2004 |
35 |
10 |
p. 817-821 5 p. |
artikel |
2 |
Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope
|
Lopez, Luis David Patiño |
|
2004 |
35 |
10 |
p. 797-803 7 p. |
artikel |
3 |
Editorial board
|
|
|
2004 |
35 |
10 |
p. IFC- 1 p. |
artikel |
4 |
Effects of temperature in deep-submicron global interconnect optimization in future technology nodes
|
Graziano, Mariagrazia |
|
2004 |
35 |
10 |
p. 849-857 9 p. |
artikel |
5 |
Electro-thermal chaotic oscillations of paralleled bipolar transistors
|
Codecasa, Lorenzo |
|
2004 |
35 |
10 |
p. 859-868 10 p. |
artikel |
6 |
Extraction of material parameters based on inverse modeling of three-dimensional interconnect fusing structures
|
Holzer, Stefan |
|
2004 |
35 |
10 |
p. 805-810 6 p. |
artikel |
7 |
Ion sensitive field effect transistor modelling for multidomain simulation purposes
|
Janicki, Marcin |
|
2004 |
35 |
10 |
p. 831-840 10 p. |
artikel |
8 |
Nanoscale electrothermal co-simulation: compact dynamic models of hyperbolic heat transport and self-consistent device Monte Carlo
|
Pilgrim, N.J. |
|
2004 |
35 |
10 |
p. 823-830 8 p. |
artikel |
9 |
Self-heating experimental study of 600V PT-IGBTs under low dissipation energies
|
Perpiñà, X. |
|
2004 |
35 |
10 |
p. 841-847 7 p. |
artikel |
10 |
Special issue on thermal investigations of integrated circuits and systems (THERMINIC'03)
|
Székely, Vladimir |
|
2004 |
35 |
10 |
p. 789-790 2 p. |
artikel |
11 |
Thermal measurements of active semiconductor micro-structures acquired through the substrate using near IR thermoreflectance
|
Christofferson, James |
|
2004 |
35 |
10 |
p. 791-796 6 p. |
artikel |
12 |
Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy
|
Dilhaire, Stefan |
|
2004 |
35 |
10 |
p. 811-816 6 p. |
artikel |