nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Effects of preexisting voids on electromigration failure of flip chip solder bumps
|
Tang, Zirong |
|
2001 |
32 |
7 |
p. 605-613 9 p. |
artikel |
2 |
Finite element analysis of the transmission characteristics of quantum wires in a magnetic field
|
Hirayama, Koichi |
|
2001 |
32 |
7 |
p. 569-577 9 p. |
artikel |
3 |
Influence of ionising radiation on the performance of CMOS inverter
|
Chauhan, R.K |
|
2001 |
32 |
7 |
p. 615-620 6 p. |
artikel |
4 |
Influence of γ radiation on thin Ta2O5–Si structures
|
Atanassova, E |
|
2001 |
32 |
7 |
p. 553-562 10 p. |
artikel |
5 |
Modeling and optimization of process parameters for GaAs/AlGaAs multiple quantum well avalanche photodiodes using genetic algorithms
|
Kim, Eui-Seung |
|
2001 |
32 |
7 |
p. 563-567 5 p. |
artikel |
6 |
Optical Sensors and Microsystems: New Concepts, Materials, Technologies
|
Saidane, A |
|
2001 |
32 |
7 |
p. 621-622 2 p. |
artikel |
7 |
Patents Alert
|
|
|
2001 |
32 |
7 |
p. 623-629 7 p. |
artikel |
8 |
Space–Time Processing for CDMA Mobile Communications
|
Saidane, A |
|
2001 |
32 |
7 |
p. 621- 1 p. |
artikel |
9 |
Structural parameters governing properties of GaInSb/InAs infra-red detectors
|
Shaw, M.J |
|
2001 |
32 |
7 |
p. 593-598 6 p. |
artikel |
10 |
Study of microstructure and resistivity evolution for electroplated copper films at near-room temperature
|
Teh, W.H |
|
2001 |
32 |
7 |
p. 579-585 7 p. |
artikel |
11 |
The degradation of p-MOSFETs under off-state stress
|
Yang, Cunyu |
|
2001 |
32 |
7 |
p. 587-591 5 p. |
artikel |
12 |
VDMOSFET model parameter extraction based on electrical and optical measurements
|
Salame, C. |
|
2001 |
32 |
7 |
p. 599-603 5 p. |
artikel |