nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A model for hot-electron and hot-hole injection in flash EEPROM programming
|
Concannon, A. |
|
1994 |
25 |
7 |
p. 469-473 5 p. |
artikel |
2 |
Analysis of low energy boron implants in silicon through SiO2 films: implantation damage and anomalous diffusion
|
Kaabi, L. |
|
1994 |
25 |
7 |
p. 567-576 10 p. |
artikel |
3 |
Asynchronous circuit design for VLSI signal processing
|
Harris, M.S. |
|
1994 |
25 |
7 |
p. 604- 1 p. |
artikel |
4 |
Characterization and manufacturability of a 200 Å gate oxide
|
Whiston, S. |
|
1994 |
25 |
7 |
p. 475-483 9 p. |
artikel |
5 |
Characterization of flash structures erased with ultra-short pulses
|
Lanzoni, Massimo |
|
1994 |
25 |
7 |
p. 491-494 4 p. |
artikel |
6 |
Charge build-up and oxide wear-out during Fowler-Nordheim electron injection in irradiated MOS structures
|
Brożek, Tomasz |
|
1994 |
25 |
7 |
p. 507-514 8 p. |
artikel |
7 |
Designer's guide to testable ASIC devices
|
Harris, M.S. |
|
1994 |
25 |
7 |
p. 601- 1 p. |
artikel |
8 |
Designing with FPGAs and CPLDs
|
Harris, M.S. |
|
1994 |
25 |
7 |
p. 607-608 2 p. |
artikel |
9 |
Electrical properties of thin high- dielectric Ta2O5 films
|
Rausch, N. |
|
1994 |
25 |
7 |
p. 533-537 5 p. |
artikel |
10 |
Evaluation of hot-carrier degradation of n-channel MOSFETs at low gate bias
|
Meehan, Alan |
|
1994 |
25 |
7 |
p. 463-467 5 p. |
artikel |
11 |
Evaluation of the lifetime and failure probability for inter-poly oxides from RVS measurements
|
Martin, Andreas |
|
1994 |
25 |
7 |
p. 553-557 5 p. |
artikel |
12 |
Fuzzy reasoning in information, decision and control systems
|
Osborn, C. |
|
1994 |
25 |
7 |
p. 603- 1 p. |
artikel |
13 |
Heterojunction transistors and small size effects in devices
|
Henini, Mahomed |
|
1994 |
25 |
7 |
p. 606-607 2 p. |
artikel |
14 |
Impact of furnace nitridation time in N2O ambient on the quality of the Si/SiO2 system
|
Le Bihan, R. |
|
1994 |
25 |
7 |
p. 577-582 6 p. |
artikel |
15 |
Influence of ionizing radiation on the conduction properties of ultra-thin silica layers
|
Sarrabayrouse, G.J. |
|
1994 |
25 |
7 |
p. 583-588 6 p. |
artikel |
16 |
Japanese companies maintain lead in semiconductor memory technologies
|
|
|
1994 |
25 |
7 |
p. vi-xiv nvt p. |
artikel |
17 |
MOSFET degradation during substrate hot electron stress
|
Zhao, S.P. |
|
1994 |
25 |
7 |
p. 515-522 8 p. |
artikel |
18 |
Optical transmission for the subscriber loop
|
Marincic, A. |
|
1994 |
25 |
7 |
p. 604-606 3 p. |
artikel |
19 |
Plasma-grown oxides on silicon with extremely low interface state densities
|
Kennedy, G.P. |
|
1994 |
25 |
7 |
p. 485-489 5 p. |
artikel |
20 |
Quantum effects in accumulated MOS thin dielectric structures
|
Olivo, Piero |
|
1994 |
25 |
7 |
p. 523-531 9 p. |
artikel |
21 |
Relaxational polarization and charge injection in thin films of silicon nitride
|
Homann, M. |
|
1994 |
25 |
7 |
p. 559-566 8 p. |
artikel |
22 |
Sensor technology and devices
|
Janković, N.D. |
|
1994 |
25 |
7 |
p. 608- 1 p. |
artikel |
23 |
SIMS study of rapid nitridation of silicon dioxide thick films in an ammonia ambient
|
Bréelle, E. |
|
1994 |
25 |
7 |
p. 501-505 5 p. |
artikel |
24 |
System designs into silicon
|
Harris, M.S. |
|
1994 |
25 |
7 |
p. 601-602 2 p. |
artikel |
25 |
The economics of automatic testing
|
Dislis, Chryssa |
|
1994 |
25 |
7 |
p. 602-603 2 p. |
artikel |
26 |
The gigabit generation
|
Szweda, Roy |
|
1994 |
25 |
7 |
p. iii-v nvt p. |
artikel |
27 |
The impact of source composition evolution on optical coating characteristics
|
Piccirillo, A. |
|
1994 |
25 |
7 |
p. 589-599 11 p. |
artikel |
28 |
The 5th ESPRIT workshop on the characterization and growth of thin dielectrics in microelectronics
|
Mathewson, Alan |
|
1994 |
25 |
7 |
p. xxi-xxii nvt p. |
artikel |
29 |
Thin SiO2 films nitrided by rapid thermal processing in NH3 or N2O for applications in EEPROMs
|
Dutoit, M. |
|
1994 |
25 |
7 |
p. 539-551 13 p. |
artikel |
30 |
Thin SiO2 films nitrided in N2O
|
Bellafiore, N. |
|
1994 |
25 |
7 |
p. 495-500 6 p. |
artikel |
31 |
US companies dominate SEMICON West 94
|
|
|
1994 |
25 |
7 |
p. xv-xx nvt p. |
artikel |