| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A dictionary of scientific units
|
Hurst, S.L.
|
|
1994
|
25 |
2 |
p. 139-140
2 p.
|
artikel
|
| 2 |
An efficient multiparticle diffusion simulation by an adaptive multigrid method
|
Pantić, D.
|
|
1994
|
25 |
2 |
p. 79-97
19 p.
|
artikel
|
| 3 |
Automating programming and handling
|
|
|
1994
|
25 |
2 |
p. vii-xiv
nvt p.
|
artikel
|
| 4 |
Boundary-scan test: a practical approach
|
Hurst, S.L.
|
|
1994
|
25 |
2 |
p. 139-
1 p.
|
artikel
|
| 5 |
Digital integrated circuit testing from a quality perspective
|
Nikolić, Z.
|
|
1994
|
25 |
2 |
p. 140-141
2 p.
|
artikel
|
| 6 |
Engineering tables and data
|
|
|
1994
|
25 |
2 |
p. 139-
1 p.
|
artikel
|
| 7 |
GaAs ASIC applications: a new feature for 1994
|
|
|
1994
|
25 |
2 |
p. xxv-
1 p.
|
artikel
|
| 8 |
IDDQ testing of VLSI circuits
|
Hurst, S.L.
|
|
1994
|
25 |
2 |
p. 139-
1 p.
|
artikel
|
| 9 |
Inter-metallic dielectric (IMD) and other high voltage testing
|
|
|
1994
|
25 |
2 |
p. xv-xxiii
nvt p.
|
artikel
|
| 10 |
“Mutual profitability”
|
|
|
1994
|
25 |
2 |
p. xxxiii-xxxv
nvt p.
|
artikel
|
| 11 |
New linearly tunable CMOS-compatible OTA-C oscillators with non-interacting controls
|
Bhaskar, D.R.
|
|
1994
|
25 |
2 |
p. 115-123
9 p.
|
artikel
|
| 12 |
Numerical simulation of submicron semiconductor devices
|
Mijalković, S.
|
|
1994
|
25 |
2 |
p. 143-144
2 p.
|
artikel
|
| 13 |
Phase-locked loops
|
Krstić, D.
|
|
1994
|
25 |
2 |
p. 141-142
2 p.
|
artikel
|
| 14 |
Reliability analysis and prediction (a methodology oriented treatment)
|
Jevtić, M.
|
|
1994
|
25 |
2 |
p. 142-143
2 p.
|
artikel
|
| 15 |
Self-adaptive space grids in process simulation
|
Nanz, Gerd
|
|
1994
|
25 |
2 |
p. 125-132
8 p.
|
artikel
|
| 16 |
Some theoretical and technological aspects of uncooled HgCdTe detectors: a review
|
Djurić, Zoran
|
|
1994
|
25 |
2 |
p. 99-114
16 p.
|
artikel
|
| 17 |
Structured logic design with VHDL
|
Hurst, S.L.
|
|
1994
|
25 |
2 |
p. 144-
1 p.
|
artikel
|
| 18 |
Systematic approaches to testing embedded analogue circuit functions
|
Russell, G.
|
|
1994
|
25 |
2 |
p. 133-138
6 p.
|
artikel
|
| 19 |
Systolic technology's new FISP speeds up ASIC design
|
|
|
1994
|
25 |
2 |
p. iii-vi
nvt p.
|
artikel
|
| 20 |
Vitesse/JPL ASICs tune in to deep space
|
|
|
1994
|
25 |
2 |
p. xxvi-xxxii
nvt p.
|
artikel
|
| 21 |
Will back end processing take the lead in microelectronics?
|
|
|
1994
|
25 |
2 |
p. i-ii
nvt p.
|
artikel
|
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