nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A high-level VLSI design for ultra-dense instruction set computer architectures
|
Schoepke, Olaf S. |
|
1993 |
24 |
5 |
p. 497-503 7 p. |
artikel |
2 |
Analogue-digital ASICs: Circuit techniques, design tools and applications
|
Hurst, S.L. |
|
1993 |
24 |
5 |
p. 592- 1 p. |
artikel |
3 |
Analysis of microelectronic materials and devices
|
Gorham, D.A. |
|
1993 |
24 |
5 |
p. 594- 1 p. |
artikel |
4 |
An empirical timing characterization method and its application to CMOS logic circuits
|
Shum, Roger S. |
|
1993 |
24 |
5 |
p. 477-484 8 p. |
artikel |
5 |
An introduction to power electronics
|
Robinson, F.V.P. |
|
1993 |
24 |
5 |
p. 586-587 2 p. |
artikel |
6 |
A wide-range tunable BiCMOS transconductor
|
Shoval, Ayal |
|
1993 |
24 |
5 |
p. 555-564 10 p. |
artikel |
7 |
Canadian microelectronics
|
Hurst, Stanley L. |
|
1993 |
24 |
5 |
p. 461- 1 p. |
artikel |
8 |
CMOS photodetector with built-in light adaptation mechanism
|
Ward, Vivian |
|
1993 |
24 |
5 |
p. 547-553 7 p. |
artikel |
9 |
Delay and current estimation in CMOS gates using collapsing
|
Nabavi-Lishi, A. |
|
1993 |
24 |
5 |
p. 485-495 11 p. |
artikel |
10 |
Design automation for timing-driven layout synthesis
|
Hurst, S.L. |
|
1993 |
24 |
5 |
p. 587- 1 p. |
artikel |
11 |
Design of logic systems
|
Bennetts, R.G. |
|
1993 |
24 |
5 |
p. 586- 1 p. |
artikel |
12 |
Economics of design and test for electronic circuits and systems
|
Hurst, S.L. |
|
1993 |
24 |
5 |
p. 593-594 2 p. |
artikel |
13 |
Electronic design: Circuits and systems
|
Harris, M.S. |
|
1993 |
24 |
5 |
p. 590-591 2 p. |
artikel |
14 |
Fine pitch surface mount technology —quality, design and manufacturing techniques
|
Griffiths, G.W. |
|
1993 |
24 |
5 |
p. 585- 1 p. |
artikel |
15 |
Global optimization of multipleiers and buses in interconnect synthesis
|
Wilson, T.C. |
|
1993 |
24 |
5 |
p. 513-532 20 p. |
artikel |
16 |
Introduction to semiconductor device yield modeling
|
Hurst, S.L. |
|
1993 |
24 |
5 |
p. 589- 1 p. |
artikel |
17 |
Microelectronic reliability, volume II: Integrity assessment and assurance
|
Haskard, M.R. |
|
1993 |
24 |
5 |
p. 588-589 2 p. |
artikel |
18 |
Organizational learning across critical linkages: The case of captive ASIC design and man manufacturing
|
Callahan, John |
|
1993 |
24 |
5 |
p. 463-476 14 p. |
artikel |
19 |
Performance analysis and design of optimized static random access memory (SRAM)
|
Dewan, Jahangir |
|
1993 |
24 |
5 |
p. 505-512 8 p. |
artikel |
20 |
Physical design automation of VLSI systems
|
Bell, I.M. |
|
1993 |
24 |
5 |
p. 592-593 2 p. |
artikel |
21 |
Rapid reliability assessment of VLSICs
|
Taylor, D. |
|
1993 |
24 |
5 |
p. 589- 1 p. |
artikel |
22 |
Reliability of gallium arsenide MMICs
|
Hurst, S.L. |
|
1993 |
24 |
5 |
p. 587-588 2 p. |
artikel |
23 |
Semiconductor memories: a handbook of design, manufacture and application
|
Gorham, D.A. |
|
1993 |
24 |
5 |
p. 585- 1 p. |
artikel |
24 |
The art of electronics
|
Hurst, S.L. |
|
1993 |
24 |
5 |
p. 591- 1 p. |
artikel |
25 |
The board designer's guide to testable logic circuits
|
Hurst, S.L. |
|
1993 |
24 |
5 |
p. 590- 1 p. |
artikel |
26 |
The Canadian microelectronics corporation, Queen's University, Kingston, Ontario, Canada, K7L 3N6
|
|
|
1993 |
24 |
5 |
p. 577-579 3 p. |
artikel |
27 |
The microelectronics and computer systems laboratory, McGill University, 3480 University Street, Montreal, Quebec, Canada H3A 2A7
|
|
|
1993 |
24 |
5 |
p. 580-584 5 p. |
artikel |
28 |
The partitioning of linear registers for testing applications
|
Kontopidi, E. |
|
1993 |
24 |
5 |
p. 533-546 14 p. |
artikel |
29 |
Update
|
|
|
1993 |
24 |
5 |
p. 584- 1 p. |
artikel |
30 |
VLSI design of an M-path decoder IC suitable for bidirectional decoding of convolutional codes
|
Chalifoux, M. |
|
1993 |
24 |
5 |
p. 565-576 12 p. |
artikel |