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                             53 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Advances in automated wire and die bonding 1984
15 4 p. 59-
1 p.
artikel
2 Advances in contamination control of processing chemicals in VLSI 1984
15 4 p. 62-
1 p.
artikel
3 An approach to ensure stability of precision laser trimmed thick film resistors 1984
15 4 p. 60-61
2 p.
artikel
4 An automated, low power, high speed complementary PLA design system for VLSI applications Powell, S.
1984
15 4 p. 47-54
8 p.
artikel
5 A new failure mechanism in thin gold films at elevated temperatures 1984
15 4 p. 63-
1 p.
artikel
6 Applications of ellipsometry to in situ study of the growth of hydrogenated amorphous films 1984
15 4 p. 63-64
2 p.
artikel
7 A simulative approach to electron conduction is thick-film resistors 1984
15 4 p. 60-
1 p.
artikel
8 A single-chip CMOS analog front-end for high-speed modems Fotouhi, B.
1984
15 4 p. 5-19
15 p.
artikel
9 Assembley equipment users speak out 1984
15 4 p. 63-
1 p.
artikel
10 Back-contact resistor network pares wire count in ECL hybrids 1984
15 4 p. 60-
1 p.
artikel
11 Ceramic on metal substrates produced by plasma spraying for thick film technology 1984
15 4 p. 64-
1 p.
artikel
12 Chip-carriers change their course 1984
15 4 p. 60-
1 p.
artikel
13 CMOS single-chip digital signal processor Hara, Hideo
1984
15 4 p. 20-28
9 p.
artikel
14 Combinatorial reliability analysis of multiprocessor computers 1984
15 4 p. 58-
1 p.
artikel
15 Current noise is thick and thin film resistors 1984
15 4 p. 60-
1 p.
artikel
16 Density upgrading in tape automated bonding 1984
15 4 p. 59-60
2 p.
artikel
17 Developments in crystal growth from high-temperature solutions 1984
15 4 p. 64-
1 p.
artikel
18 Device modeling 1984
15 4 p. 59-
1 p.
artikel
19 Diffusion of zinc into ion-implanted gallium arsenide 1984
15 4 p. 63-
1 p.
artikel
20 Editorial Butcher, John
1984
15 4 p. 3-
1 p.
artikel
21 Effects of MBE growth conditions on carbon contamination in GaAs 1984
15 4 p. 63-
1 p.
artikel
22 Evaluation of Du Pont copper-compatible resistor system 1984
15 4 p. 61-
1 p.
artikel
23 Experience with polymer thick film technology 1984
15 4 p. 60-
1 p.
artikel
24 Failure modes induced in TTL-LS bipolar logics by negative inputs 1984
15 4 p. 58-
1 p.
artikel
25 Float-zoning of semiconductor silicon: a perspective 1984
15 4 p. 62-
1 p.
artikel
26 Integrable tunable dual-function integrator/differentiator network with extremely low value grounded capacitor Nandi, S.
1984
15 4 p. 41-46
6 p.
artikel
27 Ion beam etching with reactive gases 1984
15 4 p. 64-
1 p.
artikel
28 Ion projection microlithography 1984
15 4 p. 64-
1 p.
artikel
29 Minority carrier diffusion length in LPE InxGa1−xP:N layers (χ<0.01) 1984
15 4 p. 61-
1 p.
artikel
30 Model for transient and permanent error-detection and fault-isolation coverage 1984
15 4 p. 58-59
2 p.
artikel
31 Non-homogeneous electrical transport through silicon-on-sapphire thin films: evidence of the internal stress influence 1984
15 4 p. 61-62
2 p.
artikel
32 [No title] Brazier, T.
1984
15 4 p. 57-
1 p.
artikel
33 [No title] Stoddart, R.
1984
15 4 p. 55-
1 p.
artikel
34 [No title] Bayford, Richard
1984
15 4 p. 55-56
2 p.
artikel
35 [No title] Bayford, Richard
1984
15 4 p. 56-57
2 p.
artikel
36 On discrete hazard functions 1984
15 4 p. 61-
1 p.
artikel
37 Particle size analysis techniques for metal powders and frits used in thick-film pastes 1984
15 4 p. 62-63
2 p.
artikel
38 Parts control and reliability assurance of RF hybrids 1984
15 4 p. 59-
1 p.
artikel
39 Properties of digital microelectronic systems from the viewpoint of signal transmission 1984
15 4 p. 58-
1 p.
artikel
40 Self-consistent theory of diagonal and off-diogonal disorder in the screened impurity band of doped semiconductors 1984
15 4 p. 64-
1 p.
artikel
41 Temperature verification of hybrid microelectronic circuit design 1984
15 4 p. 59-
1 p.
artikel
42 The ageing behaviour of commercial thick-film resistors 1984
15 4 p. 61-
1 p.
artikel
43 The design of a truly random monolithic noise generator Penzhorn, W.T.
1984
15 4 p. 29-40
12 p.
artikel
44 The influence of hydrogen gas on the characteristics of amorphous silicon deposited by RF sputtering 1984
15 4 p. 62-
1 p.
artikel
45 The properties of thick-film resistors on dielectrics 1984
15 4 p. 62-
1 p.
artikel
46 Thermal analysis helps keep hybrid microcircuits cool 1984
15 4 p. 60-
1 p.
artikel
47 Thermal characteristics of a hybrid microcircuit 1984
15 4 p. 59-
1 p.
artikel
48 The use of hybrid microelectronics in the construction of ionselective electrodes 1984
15 4 p. 60-
1 p.
artikel
49 Thin-film systems for hybrid circuits—produced by plasmatron atomizers 1984
15 4 p. 60-
1 p.
artikel
50 Time-resolved optical transmission during pulsed-laser annealing of ion-implanted amorphous silico-on-sapphire 1984
15 4 p. 63-
1 p.
artikel
51 VLSI metallization using aluminium and its alloys. Part I 1984
15 4 p. 62-
1 p.
artikel
52 VLSI metallization using aluminium and its alloys. Part II 1984
15 4 p. 62-
1 p.
artikel
53 Wafer processing in the early 1980s 1984
15 4 p. 63-
1 p.
artikel
                             53 gevonden resultaten
 
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