nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Announcement
|
|
|
1996 |
47 |
10 |
p. iv- 1 p. |
artikel |
2 |
A program for Monte Carlo simulation of penetration and scattering of accelerated electrons in multicomponent multilayer targets
|
Gueorguiev, YM |
|
1996 |
47 |
10 |
p. 1227-1230 4 p. |
artikel |
3 |
Backscattering of nitrogen ions from a cold nickel surface covered with condensed rare gases under N2 + ion bombardment
|
Soszka, W |
|
1996 |
47 |
10 |
p. 1189-1192 4 p. |
artikel |
4 |
Computational heat transfer; vol. 1 mathematical modelling
|
Steckelmacher, W. |
|
1996 |
47 |
10 |
p. 1245-1246 2 p. |
artikel |
5 |
Computer simulation of the emission process of some field emission alloy ion sources
|
Georgieva, S |
|
1996 |
47 |
10 |
p. 1143-1144 2 p. |
artikel |
6 |
CO sensing characteristics of reactively sputtered SnO2 thin films prepared under different oxygen partial pressure values
|
Micocci, G |
|
1996 |
47 |
10 |
p. 1175-1177 3 p. |
artikel |
7 |
Electron physics of vacuum and gaseous devices
|
Steckelmacher, W. |
|
1996 |
47 |
10 |
p. 1246- 1 p. |
artikel |
8 |
Hermann Adam
|
Reich, Günter |
|
1996 |
47 |
10 |
p. 1247- 1 p. |
artikel |
9 |
Holographic investigations of photoinduced changes in PECVD GeSe thin films
|
Boev, V |
|
1996 |
47 |
10 |
p. 1211-1213 3 p. |
artikel |
10 |
Homogeneous CVD α-Si:H thin film based position sensitive photodetector
|
Toneva, A |
|
1996 |
47 |
10 |
p. 1207-1209 3 p. |
artikel |
11 |
Interfacial effects in poly (p-phenylene-vinylene)-metal systems
|
Nguyen, TP |
|
1996 |
47 |
10 |
p. 1153-1158 6 p. |
artikel |
12 |
Intrinsic defects and Pt atoms at TiO2(110) surfaces: a valence band spectroscopy study using synchrotron radiation
|
Fischer, S |
|
1996 |
47 |
10 |
p. 1149-1152 4 p. |
artikel |
13 |
Introduction to thermodynamics and kinetic theory of matter
|
Steckelmacher, W. |
|
1996 |
47 |
10 |
p. 1245- 1 p. |
artikel |
14 |
Laser heating of a slab with temperature dependent absorptance in relation to the cooling conditions
|
El-Adawi, MK |
|
1996 |
47 |
10 |
p. 1167-1173 7 p. |
artikel |
15 |
Low voltage scanning electron microscope with a combined multi-electrode retarding lens and detector
|
Słówko, W |
|
1996 |
47 |
10 |
p. 1159-1162 4 p. |
artikel |
16 |
Negative ion beams from a plasma type source with additional surface ionization
|
Latuszyński, A |
|
1996 |
47 |
10 |
p. 1219-1222 4 p. |
artikel |
17 |
New nanometer manipulators for surface research
|
Anisimov, VV |
|
1996 |
47 |
10 |
p. 1163-1166 4 p. |
artikel |
18 |
On the mechanism of bombardment-induced oxygen redistribution at ZrO2 surfaces
|
Miteva, VA |
|
1996 |
47 |
10 |
p. 1235-1238 4 p. |
artikel |
19 |
Preferential sputtering and oxidation of NbTa single crystals studied by low-energy ion scattering
|
Semenov, VN |
|
1996 |
47 |
10 |
p. 1193-1196 4 p. |
artikel |
20 |
Properties of amorphous silicon carbide films prepared by PECVD
|
Huran, J |
|
1996 |
47 |
10 |
p. 1223-1225 3 p. |
artikel |
21 |
Reactively magnetron sputtered TiAlz.sbnd;N thin films with enhanced mechanical properties
|
Kourtev, J |
|
1996 |
47 |
10 |
p. 1197-1201 5 p. |
artikel |
22 |
Silicon oxide conductivity of hydrogen ion implanted polysilicon thin film transistors
|
Gueorguiev, V |
|
1996 |
47 |
10 |
p. 1203-1205 3 p. |
artikel |
23 |
Surface and thin film analysis of CdTe layers for solar cells
|
Stoev, MD |
|
1996 |
47 |
10 |
p. 1231-1234 4 p. |
artikel |
24 |
The effect of Ca, Sr, and Ba substitutions on the morphology and electrical resistivity of La1 − xAxCu0.5O3 thin films
|
Stambolova, I |
|
1996 |
47 |
10 |
p. 1239-1242 4 p. |
artikel |
25 |
The effect of surface on pressure
|
Lewin, G |
|
1996 |
47 |
10 |
p. 1243- 1 p. |
artikel |
26 |
The fabrication of thin GaAs cantilever beams for power sensor microsystem using RIE
|
Haščík, Š |
|
1996 |
47 |
10 |
p. 1215-1217 3 p. |
artikel |
27 |
The mechanical and structural properties of Ti films prepared by filtered arc deposition
|
Bendavid, A |
|
1996 |
47 |
10 |
p. 1179-1188 10 p. |
artikel |
28 |
Vacuum diary 1996—Conferences on related topics
|
|
|
1996 |
47 |
10 |
p. i-iii nvt p. |
artikel |
29 |
XRD Characterization of thin films with low intensity reflection lines
|
Musil, J |
|
1996 |
47 |
10 |
p. 1145-1147 3 p. |
artikel |