nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A cross-layer aging-aware task scheduling approach for multiprocessor embedded systems
|
Karami, Masoomeh |
|
2018 |
85 |
C |
p. 190-197 |
artikel |
2 |
A generalized degradation model based on Gaussian process
|
Wang, Zhihua |
|
2018 |
85 |
C |
p. 207-214 |
artikel |
3 |
A novel prediction method based on the support vector regression for the remaining useful life of lithium-ion batteries
|
Zhao, Qi |
|
2018 |
85 |
C |
p. 99-108 |
artikel |
4 |
A reverse hysteresis effect of graphene transistors with amorphous silicon gate dielectric
|
Zhang, Qingwei |
|
2018 |
85 |
C |
p. 118-121 |
artikel |
5 |
Comphy — A compact-physics framework for unified modeling of BTI
|
Rzepa, G. |
|
2018 |
85 |
C |
p. 49-65 |
artikel |
6 |
Comprehensive separate extraction of parasitic resistances in MOSFETs considering the gate bias-dependence and the asymmetric overlap length
|
Kim, Junyeap |
|
2018 |
85 |
C |
p. 66-70 |
artikel |
7 |
Design, manufacture and test for reliable 3D printed electronics packaging
|
Tilford, Tim |
|
2018 |
85 |
C |
p. 109-117 |
artikel |
8 |
Editorial Board
|
|
|
2018 |
85 |
C |
p. ii |
artikel |
9 |
Effect of aging on mechanical properties of high temperature Pb-rich solder joints
|
Khatibi, G. |
|
2018 |
85 |
C |
p. 1-11 |
artikel |
10 |
Effect of negative potential on the extent of PID degradation in photovoltaic power plant in a real operation mode
|
Hylský, Josef |
|
2018 |
85 |
C |
p. 12-18 |
artikel |
11 |
Effect of voids on thermo-mechanical reliability of chip resistor solder joints: Experiment, modelling and simulation
|
Wild, P. |
|
2018 |
85 |
C |
p. 163-175 |
artikel |
12 |
Failure mode analysis of MEMS suspended inductors under mechanical shock
|
Li, Yiyuan |
|
2018 |
85 |
C |
p. 38-48 |
artikel |
13 |
Potential failure mode identification of operational amplifier circuit board by using high accelerated limit test
|
Sakamoto, Junji |
|
2018 |
85 |
C |
p. 19-24 |
artikel |
14 |
Simulation, characterization and implementation of a new SCR-based device with a turn-off capability for EOS-immune ESD power supply clamps in advanced CMOS technology nodes
|
Loayza, Jorge |
|
2018 |
85 |
C |
p. 176-189 |
artikel |
15 |
Specification analysis of the deteriorating sensor for required lifetime prognostic performance
|
Zhang, Jian-Xun |
|
2018 |
85 |
C |
p. 71-83 |
artikel |
16 |
Stable reduced order modeling of piezoelectric energy harvesting modules using implicit Schur complement
|
Hu, S. |
|
2018 |
85 |
C |
p. 148-155 |
artikel |
17 |
Strategy for enhancing reliability and lifetime of DC-AC inverters used for wind turbines
|
Batunlu, C. |
|
2018 |
85 |
C |
p. 25-37 |
artikel |
18 |
Sub-1 ns characterization methodology for transistor electrical parameter extraction
|
Qu, Yiming |
|
2018 |
85 |
C |
p. 93-98 |
artikel |
19 |
The influence of microwave pulse repetition frequency on the thermal burnout effect of a PIN diode limiting-amplifying system
|
Yi, Shipeng |
|
2018 |
85 |
C |
p. 156-162 |
artikel |
20 |
The influence of microwave pulse width on the thermal burnout effect of an LNA constructed by a GaAs PHEMT
|
Yi, Shipeng |
|
2018 |
85 |
C |
p. 140-147 |
artikel |
21 |
Towards the CFD model of flow rate dependent enzyme-substrate reactions in nanoparticle filled flow microreactors
|
Pálovics, Péter |
|
2018 |
85 |
C |
p. 84-92 |
artikel |
22 |
Vertical natural convection models and their effect on failure analysis in electro-thermal simulation of large-surface OLEDs
|
Pohl, László |
|
2018 |
85 |
C |
p. 198-206 |
artikel |
23 |
Zero-maintenance of electronic systems: Perspectives, challenges, and opportunities
|
McWilliam, Richard |
|
2018 |
85 |
C |
p. 122-139 |
artikel |