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30 results found

no	title	author	magazine	year	volume	issue	page(s)	type
1	A fast fault injection platform of multiple SEUs for SRAM-based FPGAs	Zhang, Rongsheng		2018	82	C	p. 147-152	article
2	A portable high-density absolute-measure NIRS imager for detecting prefrontal lobe activity under fatigue driving	Zhao, Yue		2018	82	C	p. 197-203	article
3	A review of pulsed NBTI in P-channel power VDMOSFETs	Danković, D.		2018	82	C	p. 28-36	article
4	Ball impact responses of Sn-1Ag-0.5Cu solder joints at different temperatures and surface finishes	Kao, Chin-Li		2018	82	C	p. 204-212	article
5	60Co gamma radiation total ionizing dose combined with conducted electromagnetic interference studies in BJTs	Lawal, Olarewaju Mubashiru		2018	82	C	p. 159-164	article
6	Editorial			2018	82	C	p. iii	article
7	Editorial Board			2018	82	C	p. ii	article
8	Experimental study on optical-thermal associated characteristics of LED car lamps under the action of ionic wind	Wang, Jing		2018	82	C	p. 113-123	article
9	Fault diagnosis for the motor drive system of urban transit based on improved Hidden Markov Model	Darong, Huang		2018	82	C	p. 179-189	article
10	Humidity build-up in electronic enclosures exposed to different geographical locations by RC modelling and reliability prediction	Conseil-Gudla, H.		2018	82	C	p. 136-146	article
11	Importance of test parameters, specimen type and use configuration on the identification of Sn/Ag solder behaviour laws	Martin, Carmen		2018	82	C	p. 213-223	article
12	Joule heating dominated fracture behavior change in micro-scale Cu/Sn-3.0Ag-0.5Cu/Cu(Ni) joints under electro-thermal coupled loads	Li, W.Y.		2018	82	C	p. 224-227	article
13	Lifetime estimation of IGBT modules for MMC-HVDC application	Wang, Longjun		2018	82	C	p. 90-99	article
14	Low-cycle fatigue testing and thermal fatigue life prediction of electroplated copper thin film for through hole via	Watanabe, Kazuki		2018	82	C	p. 20-27	article
15	Micro-Raman spectroscopy applied in crystal structure analysis on the ESD failure mechanism of SiC JBS diodes	Jia, Yunpeng		2018	82	C	p. 37-41	article
16	Microstructural and tensile properties of Fe and Bi added Sn-1Ag-0.5Cu solder alloy under high temperature environment	Ali, Bakhtiar		2018	82	C	p. 171-178	article
17	Mössbauer studies of β → α phase transition in Sn-rich solder alloys	Zachariasz, Piotr		2018	82	C	p. 165-170	article
18	NBTI: Experimental investigation, physical modelling, circuit aging simulations and verification	Schlünder, C.		2018	82	C	p. 1-10	article
19	Parameter driven monitoring for a flip-chip LED module under power cycling condition	Magnien, J.		2018	82	C	p. 84-89	article
20	Review of bias-temperature instabilities at the III-N/dielectric interface	Ostermaier, C.		2018	82	C	p. 62-83	article
21	Study and analysis of DR-VCO for rad-hardness in type II third order CPLL	Karthigeyan, K.A.		2018	82	C	p. 190-196	article
22	Study of microwave damage effect on HEMT low noise amplifier under different drain voltage bias	Yan, Tao		2018	82	C	p. 228-234	article
23	Study of the operation and SET robustness of a CMOS pulse stretching circuit	Andjelkovic, Marko		2018	82	C	p. 100-112	article
24	Synergistic effects of NPN transistors caused by combined proton irradiations with different energies	Li, Xingji		2018	82	C	p. 130-135	article
25	Technology scaling implications for BTI reliability	Ramey, S.M.		2018	82	C	p. 42-50	article
26	The effect of epoxy/glass interfaces on CAF failures in printed circuit boards	Sood, Bhanu		2018	82	C	p. 235-243	article
27	The effect of ionization and displacement damage on minority carrier lifetime	Yang, Jianqun		2018	82	C	p. 124-129	article
28	Thermal lifetime estimation method of IGBT module considering solder fatigue damage feedback loop	Gao, Bing		2018	82	C	p. 51-61	article
29	The temperature and oxygen vacancy effects on the diffusion coefficient and ionic conductivity in ferroelectric BaTiO3 nanowires; A molecular dynamics study	Gholipour Shahraki, Mehran		2018	82	C	p. 153-158	article
30	Topological variation on sub-20 nm double-gate inversion and Junctionless-FinFET based 6T-SRAM circuits and its SEU radiation performance	Nilamani, S.		2018	82	C	p. 11-19	article

30 results found

Koninklijke Bibliotheek - National Library of the Netherlands