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                             30 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A fast fault injection platform of multiple SEUs for SRAM-based FPGAs Zhang, Rongsheng
2018
82 C p. 147-152
artikel
2 A portable high-density absolute-measure NIRS imager for detecting prefrontal lobe activity under fatigue driving Zhao, Yue
2018
82 C p. 197-203
artikel
3 A review of pulsed NBTI in P-channel power VDMOSFETs Danković, D.
2018
82 C p. 28-36
artikel
4 Ball impact responses of Sn-1Ag-0.5Cu solder joints at different temperatures and surface finishes Kao, Chin-Li
2018
82 C p. 204-212
artikel
5 60Co gamma radiation total ionizing dose combined with conducted electromagnetic interference studies in BJTs Lawal, Olarewaju Mubashiru
2018
82 C p. 159-164
artikel
6 Editorial 2018
82 C p. iii
artikel
7 Editorial Board 2018
82 C p. ii
artikel
8 Experimental study on optical-thermal associated characteristics of LED car lamps under the action of ionic wind Wang, Jing
2018
82 C p. 113-123
artikel
9 Fault diagnosis for the motor drive system of urban transit based on improved Hidden Markov Model Darong, Huang
2018
82 C p. 179-189
artikel
10 Humidity build-up in electronic enclosures exposed to different geographical locations by RC modelling and reliability prediction Conseil-Gudla, H.
2018
82 C p. 136-146
artikel
11 Importance of test parameters, specimen type and use configuration on the identification of Sn/Ag solder behaviour laws Martin, Carmen
2018
82 C p. 213-223
artikel
12 Joule heating dominated fracture behavior change in micro-scale Cu/Sn-3.0Ag-0.5Cu/Cu(Ni) joints under electro-thermal coupled loads Li, W.Y.
2018
82 C p. 224-227
artikel
13 Lifetime estimation of IGBT modules for MMC-HVDC application Wang, Longjun
2018
82 C p. 90-99
artikel
14 Low-cycle fatigue testing and thermal fatigue life prediction of electroplated copper thin film for through hole via Watanabe, Kazuki
2018
82 C p. 20-27
artikel
15 Micro-Raman spectroscopy applied in crystal structure analysis on the ESD failure mechanism of SiC JBS diodes Jia, Yunpeng
2018
82 C p. 37-41
artikel
16 Microstructural and tensile properties of Fe and Bi added Sn-1Ag-0.5Cu solder alloy under high temperature environment Ali, Bakhtiar
2018
82 C p. 171-178
artikel
17 Mössbauer studies of β → α phase transition in Sn-rich solder alloys Zachariasz, Piotr
2018
82 C p. 165-170
artikel
18 NBTI: Experimental investigation, physical modelling, circuit aging simulations and verification Schlünder, C.
2018
82 C p. 1-10
artikel
19 Parameter driven monitoring for a flip-chip LED module under power cycling condition Magnien, J.
2018
82 C p. 84-89
artikel
20 Review of bias-temperature instabilities at the III-N/dielectric interface Ostermaier, C.
2018
82 C p. 62-83
artikel
21 Study and analysis of DR-VCO for rad-hardness in type II third order CPLL Karthigeyan, K.A.
2018
82 C p. 190-196
artikel
22 Study of microwave damage effect on HEMT low noise amplifier under different drain voltage bias Yan, Tao
2018
82 C p. 228-234
artikel
23 Study of the operation and SET robustness of a CMOS pulse stretching circuit Andjelkovic, Marko
2018
82 C p. 100-112
artikel
24 Synergistic effects of NPN transistors caused by combined proton irradiations with different energies Li, Xingji
2018
82 C p. 130-135
artikel
25 Technology scaling implications for BTI reliability Ramey, S.M.
2018
82 C p. 42-50
artikel
26 The effect of epoxy/glass interfaces on CAF failures in printed circuit boards Sood, Bhanu
2018
82 C p. 235-243
artikel
27 The effect of ionization and displacement damage on minority carrier lifetime Yang, Jianqun
2018
82 C p. 124-129
artikel
28 Thermal lifetime estimation method of IGBT module considering solder fatigue damage feedback loop Gao, Bing
2018
82 C p. 51-61
artikel
29 The temperature and oxygen vacancy effects on the diffusion coefficient and ionic conductivity in ferroelectric BaTiO3 nanowires; A molecular dynamics study Gholipour Shahraki, Mehran
2018
82 C p. 153-158
artikel
30 Topological variation on sub-20 nm double-gate inversion and Junctionless-FinFET based 6T-SRAM circuits and its SEU radiation performance Nilamani, S.
2018
82 C p. 11-19
artikel
                             30 gevonden resultaten
 
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