| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A bound dynamic programming for solving reliability redundancy optimization
|
Jianping, Li
|
|
1996
|
76-77 |
10 |
p. 1515-1520
6 p.
|
artikel
|
| 2 |
Accurate negative bias temperature instability lifetime prediction based on hole injection
|
Teramoto, Akinobu
|
|
2008
|
76-77 |
10 |
p. 1649-1654
6 p.
|
artikel
|
| 3 |
A finite range failure model
|
Siddiqui, S.A.
|
|
1992
|
76-77 |
10 |
p. 1453-1457
5 p.
|
artikel
|
| 4 |
A general repairable system with N failure modes and k standby units
|
Chryssaphinou, O.
|
|
1993
|
76-77 |
10 |
p. 1567-1572
6 p.
|
artikel
|
| 5 |
Analysis of a multiunit solar energy system model
|
Goel, L.R.
|
|
1993
|
76-77 |
10 |
p. 1461-1465
5 p.
|
artikel
|
| 6 |
An economic discrete replacement policy for a shock damage model with minimal repairs
|
Lai, Min-Tsai
|
|
1996
|
76-77 |
10 |
p. 1347-1355
9 p.
|
artikel
|
| 7 |
A new approach to evaluate two area interconnected power generating systems reliability
|
Azad, A.K.
|
|
1996
|
76-77 |
10 |
p. 1589-1594
6 p.
|
artikel
|
| 8 |
An explanation of the dependence of the effective saturation velocity on gate voltage in sub-0.1μm metal–oxide–semiconductor transistors by quasi-ballistic transport theory
|
Lau, W.S.
|
|
2008
|
76-77 |
10 |
p. 1641-1648
8 p.
|
artikel
|
| 9 |
An improved Boolean algebra method for computing the network reliability
|
Liu, H.H.
|
|
1992
|
76-77 |
10 |
p. 1401-1419
19 p.
|
artikel
|
| 10 |
A note on determining component reliability and redundancy
|
Wong, Jsun Y.
|
|
1993
|
76-77 |
10 |
p. 1553-1559
7 p.
|
artikel
|
| 11 |
A note on “using intuitionistic fuzzy sets for fault-tree analysis on printed circuit board assembly”
|
Li, Deng-Feng
|
|
2008
|
76-77 |
10 |
p. 1741-
1 p.
|
artikel
|
| 12 |
A physical strength-stress interference model explaining infant and random mortalit
|
Blanchart, Jacques
|
|
1996
|
76-77 |
10 |
p. 1379-1388
10 p.
|
artikel
|
| 13 |
A rapid smart approach for reliability and failure mode analysis of memories and large systems
|
Mehdi, K.A.
|
|
1996
|
76-77 |
10 |
p. 1547-1556
10 p.
|
artikel
|
| 14 |
A recursive algorithm evaluating the exact reliability of a circular consecutive k-within-m-out-of-n:F system
|
Malinowski, Jacek
|
|
1996
|
76-77 |
10 |
p. 1389-1394
6 p.
|
artikel
|
| 15 |
A reliability analysis of a k-out-of-N:G redundant system with the presence of chance common-cause shock failures
|
Who Kee Chung,
|
|
1992
|
76-77 |
10 |
p. 1395-1399
5 p.
|
artikel
|
| 16 |
A simple method of in-process checking of the large area GTO homogeneity
|
Benda, V.
|
|
1993
|
76-77 |
10 |
p. 1441-1445
5 p.
|
artikel
|
| 17 |
A simple spares model using Weibull theorems
|
Reiche, Hans
|
|
1993
|
76-77 |
10 |
p. 1473-1475
3 p.
|
artikel
|
| 18 |
A study of failure of SMT solder joints under thermal cycles by statistics
|
Huang, J.H.
|
|
1992
|
76-77 |
10 |
p. 1349-1352
4 p.
|
artikel
|
| 19 |
Attribute data reliability decay models
|
Nolander, J.L.
|
|
1994
|
76-77 |
10 |
p. 1565-1596
32 p.
|
artikel
|
| 20 |
A two unit priority redundant system with three modes and correlated failures and repairs
|
Goel, L.R.
|
|
1992
|
76-77 |
10 |
p. 1367-1372
6 p.
|
artikel
|
| 21 |
Availability of a man-machine system with critical and non-critical human error
|
Dhillon, B.S.
|
|
1993
|
76-77 |
10 |
p. 1511-1521
11 p.
|
artikel
|
| 22 |
Bayesian estimation of a non-linear failure rate from censored samples type II
|
Salem, Samia A.
|
|
1992
|
76-77 |
10 |
p. 1385-1388
4 p.
|
artikel
|
| 23 |
Bayesian prediction of the life times of the unused items for the Burr distributions with a random sample size
|
Ashour, S.K.
|
|
1993
|
76-77 |
10 |
p. 1523-1532
10 p.
|
artikel
|
| 24 |
Bayesian reliability analysis for the MED
|
Bhattacharya, Samir K.
|
|
1994
|
76-77 |
10 |
p. 1685-1687
3 p.
|
artikel
|
| 25 |
Book review
|
|
|
1998
|
76-77 |
10 |
p. 1645-
1 p.
|
artikel
|
| 26 |
Book review
|
|
|
1999
|
76-77 |
10 |
p. 1515-1516
2 p.
|
artikel
|
| 27 |
Book review
|
|
|
1999
|
76-77 |
10 |
p. 1513-
1 p.
|
artikel
|
| 28 |
Book review
|
|
|
1999
|
76-77 |
10 |
p. 1517-1518
2 p.
|
artikel
|
| 29 |
Book review
|
|
|
1999
|
76-77 |
10 |
p. 1511-
1 p.
|
artikel
|
| 30 |
Building in reliability with latch-up, ESD and hot carrier effects on 0.25 μm CMOS technology
|
Leroux, C
|
|
1998
|
76-77 |
10 |
p. 1547-1552
6 p.
|
artikel
|
| 31 |
Calendar
|
|
|
2008
|
76-77 |
10 |
p. I-II
nvt p.
|
artikel
|
| 32 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1994
|
76-77 |
10 |
p. 1701-1704
4 p.
|
artikel
|
| 33 |
Call for papers
|
|
|
1994
|
76-77 |
10 |
p. 1705-
1 p.
|
artikel
|
| 34 |
Characterization of defects in flexible circuits with ultrasonic atomic force microscopy
|
Nalladega, Vijayaraghava
|
|
2008
|
76-77 |
10 |
p. 1683-1688
6 p.
|
artikel
|
| 35 |
Classifications of discrete lives
|
Roy, Dilip
|
|
1992
|
76-77 |
10 |
p. 1459-1473
15 p.
|
artikel
|
| 36 |
Cold standby systems with imperfect and noninstantaneous switch-over mechanism
|
Gurov, Sergey V.
|
|
1996
|
76-77 |
10 |
p. 1425-1438
14 p.
|
artikel
|
| 37 |
Common-cause failure analysis of a redundant system with non-repairable units
|
Dhillon, B.S.
|
|
1993
|
76-77 |
10 |
p. 1499-1509
11 p.
|
artikel
|
| 38 |
Comparative study of the profit of a two server system including patience time and instruction time
|
Kumar, A.
|
|
1996
|
76-77 |
10 |
p. 1595-1601
7 p.
|
artikel
|
| 39 |
Composite material behavior under applied electric field: material switches to a high-resistive state
|
Javadi, Hamid H.S.
|
|
1996
|
76-77 |
10 |
p. 1499-1513
15 p.
|
artikel
|
| 40 |
Concurrent engineering and design for manufacture of electronic products
|
Catuneanu, V.M.
|
|
1994
|
76-77 |
10 |
p. 1693-
1 p.
|
artikel
|
| 41 |
Confidence regions having different shapes for the failure distribution function
|
Arsham, H.
|
|
1996
|
76-77 |
10 |
p. 1439-1457
19 p.
|
artikel
|
| 42 |
Contamination control and cleanrooms Problems, Engineering Solutions, and Applications
|
Elena, Radu Mihakla
|
|
1993
|
76-77 |
10 |
p. 1631-1632
2 p.
|
artikel
|
| 43 |
Contamination effects on electronic products
|
G.W.A.D.,
|
|
1992
|
76-77 |
10 |
p. 1491-
1 p.
|
artikel
|
| 44 |
Cost-benefit analysis of a two-server, two-unit, warm standby system with different types of failure
|
Tuteja, R.K.
|
|
1992
|
76-77 |
10 |
p. 1353-1359
7 p.
|
artikel
|
| 45 |
Decision modeling for thermal stress screening of commercial electronics
|
Landers, Thomas L.
|
|
1994
|
76-77 |
10 |
p. 1643-1656
14 p.
|
artikel
|
| 46 |
Degradation and breakdown in thin oxide layers: mechanisms, models and reliability prediction
|
Degraeve, R.
|
|
1999
|
76-77 |
10 |
p. 1445-1460
16 p.
|
artikel
|
| 47 |
Digital integrated circuit testing from a quality persepctive
|
Nikolić, Z.
|
|
1994
|
76-77 |
10 |
p. 1697-1698
2 p.
|
artikel
|
| 48 |
Dislocations structure investigation in neutron irradiated silicon detectors using AFM and microhardness measurements
|
Golan, G
|
|
1999
|
76-77 |
10 |
p. 1497-1504
8 p.
|
artikel
|
| 49 |
Dynamic study of the thermal laser stimulation response on advanced technology structures
|
Reverdy, A.
|
|
2008
|
76-77 |
10 |
p. 1689-1695
7 p.
|
artikel
|
| 50 |
Editorial
|
Dummer, G.W.A.
|
|
1993
|
76-77 |
10 |
p. 1439-
1 p.
|
artikel
|
| 51 |
Effect of crystallographic defects on the reverse performance of 4H–SiC JBS diodes
|
Grekov, A.
|
|
2008
|
76-77 |
10 |
p. 1664-1668
5 p.
|
artikel
|
| 52 |
Effects of continuously applied stress on tin whisker growth
|
Lin, Chih-Kuang
|
|
2008
|
76-77 |
10 |
p. 1737-1740
4 p.
|
artikel
|
| 53 |
Effects of gamma irradiation on the insulated-gate bipolar transistor
|
Tong, Z.H.
|
|
1996
|
76-77 |
10 |
p. 1489-1498
10 p.
|
artikel
|
| 54 |
Electrothermal compact macromodel of monolithic switching voltage regulator MC34063A
|
Zarębski, Janusz
|
|
2008
|
76-77 |
10 |
p. 1703-1710
8 p.
|
artikel
|
| 55 |
Entropy measures and some distribution approximations
|
Azzam, M.M.
|
|
1996
|
76-77 |
10 |
p. 1569-1580
12 p.
|
artikel
|
| 56 |
Estimating the three Weibull parameters by maximizing the logarithm of the likelihood function directly
|
Wong, Jsun Y.
|
|
1993
|
76-77 |
10 |
p. 1561-1565
5 p.
|
artikel
|
| 57 |
Experimental characterization of the continuous switching regime in floating-body PD SOI MOSFETs
|
Perron, L.M
|
|
1998
|
76-77 |
10 |
p. 1553-1559
7 p.
|
artikel
|
| 58 |
FPGA-based switch-level fault emulation using module-based dynamic partial reconfiguration
|
Lee, Peter Ming-Han
|
|
2008
|
76-77 |
10 |
p. 1724-1733
10 p.
|
artikel
|
| 59 |
Fractal description of dendrite growth during electrochemical migration
|
Dominkovics, Csaba
|
|
2008
|
76-77 |
10 |
p. 1628-1634
7 p.
|
artikel
|
| 60 |
Fuzzy repairable reliability based on fuzzy gert
|
Cheng, Ching-Hsue
|
|
1996
|
76-77 |
10 |
p. 1557-1563
7 p.
|
artikel
|
| 61 |
Genetic algorithms for reliability design problems
|
Hsieh, Yi-Chih
|
|
1998
|
76-77 |
10 |
p. 1599-1605
7 p.
|
artikel
|
| 62 |
Heat dissipation effect of Al plate embedded substrate in network system
|
Cho, Seung Hyun
|
|
2008
|
76-77 |
10 |
p. 1696-1702
7 p.
|
artikel
|
| 63 |
High-temperature performance of AlGaN/GaN HFETs and MOSHFETs
|
Donoval, D.
|
|
2008
|
76-77 |
10 |
p. 1669-1672
4 p.
|
artikel
|
| 64 |
High temperature reliability of aluminium wire-bonds to thin film, thick film and low temperature co-fired ceramic (LTCC) substrate metallization
|
Johannessen, Rolf
|
|
2008
|
76-77 |
10 |
p. 1711-1719
9 p.
|
artikel
|
| 65 |
Impact of geometrical scaling on parasitic pnp bipolar transistor in N-well, 0.25 μm CMOS devices and its effect on latchup immunity
|
Leong, Kam-Chew
|
|
1998
|
76-77 |
10 |
p. 1621-1626
6 p.
|
artikel
|
| 66 |
Impact of power electronics packaging on the reliability of grid connected photovoltaic converters for outdoor applications
|
Meinhardt, M
|
|
1999
|
76-77 |
10 |
p. 1461-1472
12 p.
|
artikel
|
| 67 |
Improving the precision on forecasting
|
Peiris, M.Shelton
|
|
1996
|
76-77 |
10 |
p. 1375-1378
4 p.
|
artikel
|
| 68 |
Influence of thermal heating effect on pulsed DC electromigration result analysis
|
Waltz, P
|
|
1998
|
76-77 |
10 |
p. 1531-1537
7 p.
|
artikel
|
| 69 |
Inside front cover - Editorial board
|
|
|
2008
|
76-77 |
10 |
p. IFC-
1 p.
|
artikel
|
| 70 |
Introduction to semiconductor device yield modeling
|
Dimitrijev, S.
|
|
1994
|
76-77 |
10 |
p. 1696-
1 p.
|
artikel
|
| 71 |
Inverse gaussian distribution and its application to reliability
|
Jain, R.K.
|
|
1996
|
76-77 |
10 |
p. 1323-1335
13 p.
|
artikel
|
| 72 |
Investigation of diode geometry and metal line pattern for robust ESD protection applications
|
Li, You
|
|
2008
|
76-77 |
10 |
p. 1660-1663
4 p.
|
artikel
|
| 73 |
Investigation of morphology and fractal behaviour on compound semiconductor surface after electrochemical layer removal
|
Nemcsics, Ákos
|
|
1999
|
76-77 |
10 |
p. 1505-1509
5 p.
|
artikel
|
| 74 |
Key reliability concerns with lead-free connectors
|
Shibutani, Tadahiro
|
|
2008
|
76-77 |
10 |
p. 1613-1627
15 p.
|
artikel
|
| 75 |
Leakage currents and dielectric breakdown of Si1−x−y Ge x C y thermal oxides
|
Cuadras, A.
|
|
2008
|
76-77 |
10 |
p. 1635-1640
6 p.
|
artikel
|
| 76 |
Low-frequency noise in thick-film structures caused by traps in glass barriers
|
Mrak, I.
|
|
1998
|
76-77 |
10 |
p. 1569-1576
8 p.
|
artikel
|
| 77 |
Maintenance minimization for competitive advantage: A Life Cycle Approach for Product Manufacturers and End-Users
|
G.W.A.D.,
|
|
1993
|
76-77 |
10 |
p. 1629-1630
2 p.
|
artikel
|
| 78 |
Mean time to failure formulas for standard reliability networks with erlangian distributed component failure times
|
Dhillon, B.S.
|
|
1996
|
76-77 |
10 |
p. 1521-1523
3 p.
|
artikel
|
| 79 |
Methods and models for computing survivability and fault-tolerance of a network
|
Gagin, Alexander A.
|
|
1993
|
76-77 |
10 |
p. 1533-1552
20 p.
|
artikel
|
| 80 |
Mixed-Weibull parameter estimation for burn-in data using the Bayesian approach
|
Kececioglu, Dimitri
|
|
1994
|
76-77 |
10 |
p. 1657-1679
23 p.
|
artikel
|
| 81 |
Modelling common cause failures under data uncertainty of the system unavailability
|
Kulkarni, R.N.
|
|
1994
|
76-77 |
10 |
p. 1615-1622
8 p.
|
artikel
|
| 82 |
Modification of scheduled data flow graph for on-line testability
|
Ismaeel, A.A.
|
|
1999
|
76-77 |
10 |
p. 1473-1484
12 p.
|
artikel
|
| 83 |
MTTF and availability evaluation of a two unit, three state redundant system with a proviso of random activation
|
Singh, S.K.
|
|
1992
|
76-77 |
10 |
p. 1443-1452
10 p.
|
artikel
|
| 84 |
Negative bias temperature instability (NBTI) recovery with bake
|
Katsetos, Anastasios A.
|
|
2008
|
76-77 |
10 |
p. 1655-1659
5 p.
|
artikel
|
| 85 |
New trends in system reliability evaluation
|
G.W.A.D.,
|
|
1994
|
76-77 |
10 |
p. 1699-1700
2 p.
|
artikel
|
| 86 |
Non-parametric estimation of sample size and censoring time in life testing experiments
|
Sharma, K.K.
|
|
1992
|
76-77 |
10 |
p. 1479-1481
3 p.
|
artikel
|
| 87 |
[No title]
|
Stojcev, Mile
|
|
2008
|
76-77 |
10 |
p. 1744-1745
2 p.
|
artikel
|
| 88 |
[No title]
|
Stojcev, Mile
|
|
2008
|
76-77 |
10 |
p. 1742-1743
2 p.
|
artikel
|
| 89 |
Off-state gate current with quasi-zero temperature coefficient in n-MOSFETs with reoxidized nitrided oxide as gate dielectric
|
Lai, P.T
|
|
1998
|
76-77 |
10 |
p. 1585-1589
5 p.
|
artikel
|
| 90 |
On Bayesian estimation of system reliability
|
Soman, K.P.
|
|
1993
|
76-77 |
10 |
p. 1455-1459
5 p.
|
artikel
|
| 91 |
On distribution of cycles in a Markovian queueing system
|
Bhandari, Rajiv
|
|
1992
|
76-77 |
10 |
p. 1483-1487
5 p.
|
artikel
|
| 92 |
On some partial ordering of interest in reliability
|
Ahmed, A.N.
|
|
1996
|
76-77 |
10 |
p. 1337-1346
10 p.
|
artikel
|
| 93 |
On the effect of weather condition in a two unit cold standby system
|
Singh, S.K.
|
|
1994
|
76-77 |
10 |
p. 1681-1684
4 p.
|
artikel
|
| 94 |
On the relation of errors and its syndrome in signature analysis
|
Chan, John C.
|
|
1992
|
76-77 |
10 |
p. 1379-1383
5 p.
|
artikel
|
| 95 |
Optimal arrangement of components in a consecutive k-out-of-r-from n:F system
|
Sfakianakis, Michael
|
|
1993
|
76-77 |
10 |
p. 1573-1578
6 p.
|
artikel
|
| 96 |
Optimal burn-in for minimizing cost and multiobjectives
|
Kim, K.N.
|
|
1998
|
76-77 |
10 |
p. 1577-1583
7 p.
|
artikel
|
| 97 |
Optimal planned maintenance with salvage cost for a two-unit standby redundant system
|
Dohi, Tadashi
|
|
1996
|
76-77 |
10 |
p. 1581-1588
8 p.
|
artikel
|
| 98 |
Optimal redundancies for reliability and availability of series systems
|
Galikowsky, C.
|
|
1996
|
76-77 |
10 |
p. 1537-1546
10 p.
|
artikel
|
| 99 |
Optimal repair-cost limit for a consumer following expiry of a warranty
|
Chung, Kun-Jen
|
|
1994
|
76-77 |
10 |
p. 1689-1692
4 p.
|
artikel
|
| 100 |
Optimum stochastic inspection policies for a system with safety device
|
Schabe, H.
|
|
1996
|
76-77 |
10 |
p. 1395-1405
11 p.
|
artikel
|
| 101 |
Physics-of-failure assessment of a cruise control module
|
Kimseng, K
|
|
1999
|
76-77 |
10 |
p. 1423-1444
22 p.
|
artikel
|
| 102 |
Probabilistic analysis of a two-unit warm standby system subject to hardware and human error failures
|
Mahmoud, M.A.W.
|
|
1996
|
76-77 |
10 |
p. 1565-1568
4 p.
|
artikel
|
| 103 |
Process Improvement in the Electronics Industry
|
G.W.A.D.,
|
|
1992
|
76-77 |
10 |
p. 1490-
1 p.
|
artikel
|
| 104 |
Profit analysis of the machine repair problem with cold standbys and two modes of failure
|
Wang, Kuo-Hsiung
|
|
1994
|
76-77 |
10 |
p. 1635-1642
8 p.
|
artikel
|
| 105 |
Publications, notices, calls for papers, etc.
|
|
|
1993
|
76-77 |
10 |
p. 1633-
1 p.
|
artikel
|
| 106 |
Publications, notices, calls for papers, etc.
|
|
|
1992
|
76-77 |
10 |
p. 1493-1496
4 p.
|
artikel
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Wafer level tunnel oxide reliability evaluation by means of the Exponentially Ramped Current Stress method
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