| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A CAD coupled laser beam test system for digital circuit failure analysis
|
|
|
1992
|
76-77 |
1-2 |
p. 300-301
2 p.
|
artikel
|
| 2 |
A case study of ethernet anomalies in a distributed computing environment
|
|
|
1992
|
76-77 |
1-2 |
p. 289-
1 p.
|
artikel
|
| 3 |
A census of tandem system availability between 1985 and 1990
|
|
|
1992
|
76-77 |
1-2 |
p. 283-
1 p.
|
artikel
|
| 4 |
A class of shrinkage estimators for the scale parameter of the exponential distribution
|
|
|
1992
|
76-77 |
1-2 |
p. 290-
1 p.
|
artikel
|
| 5 |
A compact high power semiconductor laser array
|
Douglas, P.E.
|
|
1978
|
76-77 |
1-2 |
p. 163-174
12 p.
|
artikel
|
| 6 |
A comparison study of the reliability of the two majority-vote instrumentation systems
|
Nieuwhof, G.W.E
|
|
1980
|
76-77 |
1-2 |
p. 13-24
12 p.
|
artikel
|
| 7 |
A confidence interval for the availability ratio for systems with weibull operating time and lognormal repair time
|
Masters, B.N.
|
|
1992
|
76-77 |
1-2 |
p. 89-99
11 p.
|
artikel
|
| 8 |
A- consecutive-k-out-of-n: G system: the mirror image of a consecutive-k-out-of-n: F system
|
|
|
1992
|
76-77 |
1-2 |
p. 292-
1 p.
|
artikel
|
| 9 |
Ada's fundamental language structures build reliable systems
|
|
|
1992
|
76-77 |
1-2 |
p. 283-
1 p.
|
artikel
|
| 10 |
Addendum
|
Nieuwhof, G.W.E.
|
|
1979
|
76-77 |
1-2 |
p. 161-168
8 p.
|
artikel
|
| 11 |
A design review approach toward dynamic RAM reliability
|
Roberts, J.A.
|
|
1979
|
76-77 |
1-2 |
p. 97-105
9 p.
|
artikel
|
| 12 |
Ag-Pd thick film conductor for AIN ceramics
|
|
|
1992
|
76-77 |
1-2 |
p. 298-
1 p.
|
artikel
|
| 13 |
A look at optoelectronic integrated circuits
|
|
|
1992
|
76-77 |
1-2 |
p. 292-
1 p.
|
artikel
|
| 14 |
A low cost reliability test specification
|
de Corlieu, Jacques
|
|
1979
|
76-77 |
1-2 |
p. 11-14
4 p.
|
artikel
|
| 15 |
A microcomputer for control applications
|
Walsh, M.J.
|
|
1978
|
76-77 |
1-2 |
p. 5-8
4 p.
|
artikel
|
| 16 |
A model for moisture induced corrosion failures in microelectronic packages
|
|
|
1992
|
76-77 |
1-2 |
p. 284-
1 p.
|
artikel
|
| 17 |
A model of charge transport in thermal SiO2 implanted with Si
|
|
|
1992
|
76-77 |
1-2 |
p. 301-
1 p.
|
artikel
|
| 18 |
A model of 1/f noise in polysilicon resistors
|
|
|
1992
|
76-77 |
1-2 |
p. 299-
1 p.
|
artikel
|
| 19 |
Analyzing the mechanical strength of SMT attached solder joints
|
|
|
1992
|
76-77 |
1-2 |
p. 285-
1 p.
|
artikel
|
| 20 |
An approximation analysis for the availability of a parallel redundant system with general distributions
|
Yanagi, Shigeru
|
|
1992
|
76-77 |
1-2 |
p. 143-157
15 p.
|
artikel
|
| 21 |
An efficient algorithm to solve inter-programming problems arising in system-reliability design
|
|
|
1992
|
76-77 |
1-2 |
p. 292-
1 p.
|
artikel
|
| 22 |
A new approach toward evaluation of reliability of electronic equipment during maintenance and designing
|
Lerner, Moisey M
|
|
1980
|
76-77 |
1-2 |
p. 147-151
5 p.
|
artikel
|
| 23 |
A new ERA in reliability
|
Balke, Nicholas
|
|
1979
|
76-77 |
1-2 |
p. iii-
1 p.
|
artikel
|
| 24 |
A new intelligent one-chip microcomputer: the application-specific microcomputer
|
|
|
1992
|
76-77 |
1-2 |
p. 295-296
2 p.
|
artikel
|
| 25 |
A new recursive algorithm for the reliability evaluation of a distributed program
|
Chen, Den-Jyi
|
|
1992
|
76-77 |
1-2 |
p. 25-33
9 p.
|
artikel
|
| 26 |
An introduction to assemblers and loaders for microprocessor systems
|
Spratt, E.B.
|
|
1978
|
76-77 |
1-2 |
p. 133-142
10 p.
|
artikel
|
| 27 |
An investigation of pnp polysilicon emitter transistors
|
|
|
1992
|
76-77 |
1-2 |
p. 297-
1 p.
|
artikel
|
| 28 |
A note on recursive estimator of the density function which is not necessarily continuous
|
El-Fahham, M.M.
|
|
1992
|
76-77 |
1-2 |
p. 79-87
9 p.
|
artikel
|
| 29 |
A novel Lossy and dispersive interconnect model for integrated circuit simulation
|
|
|
1992
|
76-77 |
1-2 |
p. 296-
1 p.
|
artikel
|
| 30 |
A PABX model using the 6800 MPU
|
Marclay, Bernard
|
|
1978
|
76-77 |
1-2 |
p. 15-33
19 p.
|
artikel
|
| 31 |
Application of DIN ISO 9000 through 9004 to the practice of nondestructive testing
|
|
|
1992
|
76-77 |
1-2 |
p. 283-
1 p.
|
artikel
|
| 32 |
A proportional hazards approach to correlate SiO2—breakdown voltage and time distributions
|
|
|
1992
|
76-77 |
1-2 |
p. 288-
1 p.
|
artikel
|
| 33 |
A review of the properties of aluminium alloy films used during silicon device fabrication
|
|
|
1992
|
76-77 |
1-2 |
p. 300-
1 p.
|
artikel
|
| 34 |
A self optimising central heating control system
|
Leiper, Dave
|
|
1978
|
76-77 |
1-2 |
p. 101-109
9 p.
|
artikel
|
| 35 |
A simple expression for band gap narrowing (BGN) in heavily doped Si, Ge, GaAs and GexSi1−x strained layers
|
|
|
1992
|
76-77 |
1-2 |
p. 297-
1 p.
|
artikel
|
| 36 |
A simple model for life cycle cost vs maintainability function
|
Govil, K.K.
|
|
1992
|
76-77 |
1-2 |
p. 269-270
2 p.
|
artikel
|
| 37 |
A submicron electron-beam tester for VLSI circuits beyond the 4-Mb DRAM
|
|
|
1992
|
76-77 |
1-2 |
p. 301-
1 p.
|
artikel
|
| 38 |
A system safety approach to the design of an Intermediate Capacity Transit System
|
Rumsey, A.F
|
|
1980
|
76-77 |
1-2 |
p. 123-129
7 p.
|
artikel
|
| 39 |
A unified performance reliability analysis of a system with a cumulative down time constraint
|
Nicola, Victor
|
|
1992
|
76-77 |
1-2 |
p. 49-65
17 p.
|
artikel
|
| 40 |
Automated analysis of phased-mission reliability
|
|
|
1992
|
76-77 |
1-2 |
p. 291-
1 p.
|
artikel
|
| 41 |
Automated apparatus for long-term testing of electrical brushes
|
|
|
1992
|
76-77 |
1-2 |
p. 285-286
2 p.
|
artikel
|
| 42 |
Automatic soldering technology accommodates computer needs
|
|
|
1992
|
76-77 |
1-2 |
p. 295-
1 p.
|
artikel
|
| 43 |
Availability of k-out-of-m:G repairable system with non-identical elements
|
Gadani, J.P.
|
|
1979
|
76-77 |
1-2 |
p. 65-71
7 p.
|
artikel
|
| 44 |
A VLSI design for an efficient multiprocessor cache memory
|
|
|
1992
|
76-77 |
1-2 |
p. 296-
1 p.
|
artikel
|
| 45 |
A Weibull model to characterize lifetimes of aluminum alloy electrical wire connections
|
|
|
1992
|
76-77 |
1-2 |
p. 290-
1 p.
|
artikel
|
| 46 |
Bayes credibility estimation of an exponential parameter for random censoring and incomplete information
|
|
|
1992
|
76-77 |
1-2 |
p. 286-287
2 p.
|
artikel
|
| 47 |
Bayes estimates under asymmetric loss
|
|
|
1992
|
76-77 |
1-2 |
p. 290-
1 p.
|
artikel
|
| 48 |
Bayes predictive analysis of a fundamental software-reliability model
|
|
|
1992
|
76-77 |
1-2 |
p. 289-
1 p.
|
artikel
|
| 49 |
Behavioral prediction of materials degradation in load-bearing structures
|
Hay, D.Robert
|
|
1979
|
76-77 |
1-2 |
p. 127-132
6 p.
|
artikel
|
| 50 |
Benzocyclobutene interlayer dielectrics for thin film multichip modules
|
|
|
1992
|
76-77 |
1-2 |
p. 298-299
2 p.
|
artikel
|
| 51 |
Biographies
|
|
|
1979
|
76-77 |
1-2 |
p. 151-160
10 p.
|
artikel
|
| 52 |
Biographies
|
|
|
1980
|
76-77 |
1-2 |
p. 163-167
5 p.
|
artikel
|
| 53 |
Calculation of the Binomial survivor function
|
|
|
1992
|
76-77 |
1-2 |
p. 287-
1 p.
|
artikel
|
| 54 |
Calculation of the Poisson cumulative distribution function
|
|
|
1992
|
76-77 |
1-2 |
p. 289-
1 p.
|
artikel
|
| 55 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1992
|
76-77 |
1-2 |
p. 277-280
4 p.
|
artikel
|
| 56 |
Can a noninvasive reliability prediction of electronic boards be accurate?
|
Rawicz, Andrew H.
|
|
1992
|
76-77 |
1-2 |
p. 223-232
10 p.
|
artikel
|
| 57 |
Chairman's message
|
Lewis, Neville
|
|
1980
|
76-77 |
1-2 |
p. iii-
1 p.
|
artikel
|
| 58 |
Characterization of the Pearson family of distributions
|
|
|
1992
|
76-77 |
1-2 |
p. 291-
1 p.
|
artikel
|
| 59 |
Chip tantalum capacitors take center stage among SMDs
|
|
|
1992
|
76-77 |
1-2 |
p. 296-
1 p.
|
artikel
|
| 60 |
Chip technology now available for aluminum electro-lytic capacitors
|
|
|
1992
|
76-77 |
1-2 |
p. 286-
1 p.
|
artikel
|
| 61 |
Clustered defects in IC fabrication: impact on process control charts
|
|
|
1992
|
76-77 |
1-2 |
p. 293-294
2 p.
|
artikel
|
| 62 |
Combining analog simulation techniques optimizes designs
|
|
|
1992
|
76-77 |
1-2 |
p. 293-
1 p.
|
artikel
|
| 63 |
Comment on: an efficient non-recursive algorithm for computing the reliability of k-out-of-n systems
|
|
|
1992
|
76-77 |
1-2 |
p. 291-
1 p.
|
artikel
|
| 64 |
Communication and transportation network reliability using routing models
|
|
|
1992
|
76-77 |
1-2 |
p. 288-
1 p.
|
artikel
|
| 65 |
Comparison of Bayesian nonparametric estimates of the reliability with rival estimates
|
Papadopoulos, Alex S.
|
|
1992
|
76-77 |
1-2 |
p. 233-240
8 p.
|
artikel
|
| 66 |
Comparison of phosphorus, arsenic and boron implants into bulk silicon and SOS
|
|
|
1992
|
76-77 |
1-2 |
p. 301-
1 p.
|
artikel
|
| 67 |
Component replacement and the use of Relcode
|
Hastings, N.A.J.
|
|
1979
|
76-77 |
1-2 |
p. 49-56
8 p.
|
artikel
|
| 68 |
Computer operations — An introduction
|
Woollons, D.J.
|
|
1978
|
76-77 |
1-2 |
p. 153-162
10 p.
|
artikel
|
| 69 |
Cost-benefit analysis of a 2-unit priority-standby system with patience-time for repair
|
|
|
1992
|
76-77 |
1-2 |
p. 290-
1 p.
|
artikel
|
| 70 |
Cost-benefit analysis of single server n-unit imperfect switch system with delayed repair
|
Gopalan, M.N.
|
|
1992
|
76-77 |
1-2 |
p. 5-9
5 p.
|
artikel
|
| 71 |
CP-140 aircraft reliability program — A “tailored” management approach
|
Steiner, R.F.
|
|
1979
|
76-77 |
1-2 |
p. 133-139
7 p.
|
artikel
|
| 72 |
Data acquisition — Acquiring a little of the data
|
Brown, Dave
|
|
1978
|
76-77 |
1-2 |
p. 87-91
5 p.
|
artikel
|
| 73 |
Design a digital synchronizer with a low metastable-failure rate
|
|
|
1992
|
76-77 |
1-2 |
p. 296-
1 p.
|
artikel
|
| 74 |
Design guidelines for polymer thick-film technology
|
|
|
1992
|
76-77 |
1-2 |
p. 300-
1 p.
|
artikel
|
| 75 |
Designs meet needs of high-speed, high-density systems
|
|
|
1992
|
76-77 |
1-2 |
p. 293-
1 p.
|
artikel
|
| 76 |
Detection of multiple input bridging and stuck-on faults in CMOS logic circuits using current monitoring
|
|
|
1992
|
76-77 |
1-2 |
p. 287-
1 p.
|
artikel
|
| 77 |
Development of a maintenance plan for the intermediate capacity transit system
|
Keith, Brian
|
|
1980
|
76-77 |
1-2 |
p. 25-31
7 p.
|
artikel
|
| 78 |
Development of the DHC-7 aircraft maintenance program
|
Oates, D.L
|
|
1980
|
76-77 |
1-2 |
p. 11-
1 p.
|
artikel
|
| 79 |
Diffusion of ion implanted phosphorus in silicon in inert ambient
|
|
|
1992
|
76-77 |
1-2 |
p. 300-
1 p.
|
artikel
|
| 80 |
Drain engineering of hot-carrier-resistant MOSFETs using concave silicon surfaces for deep submicron VLSI technology
|
|
|
1992
|
76-77 |
1-2 |
p. 298-
1 p.
|
artikel
|
| 81 |
Dynamic behaviour of SMT chip capacitors during solder reflow
|
|
|
1992
|
76-77 |
1-2 |
p. 286-
1 p.
|
artikel
|
| 82 |
Editorial Board
|
|
|
1978
|
76-77 |
1-2 |
p. IFC-
1 p.
|
artikel
|
| 83 |
Editorial Board
|
|
|
1992
|
76-77 |
1-2 |
p. IFC-
1 p.
|
artikel
|
| 84 |
Editorial Board
|
|
|
1979
|
76-77 |
1-2 |
p. IFC-
1 p.
|
artikel
|
| 85 |
Effect of system peak load forecast uncertainty on annualized reliability indices of composite generation and transmission systems
|
Billinton, R
|
|
1980
|
76-77 |
1-2 |
p. 91-100
10 p.
|
artikel
|
| 86 |
Efficient modeling parameter extraction for dual Pearson approach to simulation of implanted impurity profiles in silicon
|
|
|
1992
|
76-77 |
1-2 |
p. 297-298
2 p.
|
artikel
|
| 87 |
Electrical inhomogeneity in alloyed AuGe-Ni contact formed on GaAs
|
|
|
1992
|
76-77 |
1-2 |
p. 298-
1 p.
|
artikel
|
| 88 |
Electronic system packaging: the search for manufacturing the optimum in a sea of constraints
|
|
|
1992
|
76-77 |
1-2 |
p. 292-
1 p.
|
artikel
|
| 89 |
Electro-optic sampling of high-speed devices and integrated circuits
|
|
|
1992
|
76-77 |
1-2 |
p. 286-
1 p.
|
artikel
|
| 90 |
Empirically based analysis of failures in software systems
|
|
|
1992
|
76-77 |
1-2 |
p. 288-
1 p.
|
artikel
|
| 91 |
Empirical studies of software validation
|
Howden, William E.
|
|
1979
|
76-77 |
1-2 |
p. 39-47
9 p.
|
artikel
|
| 92 |
Enhancement of flip-chip fatigue life by encapsulation
|
|
|
1992
|
76-77 |
1-2 |
p. 284-
1 p.
|
artikel
|
| 93 |
Error log analysis: statistical modeling and heuristic trend analysis
|
|
|
1992
|
76-77 |
1-2 |
p. 287-
1 p.
|
artikel
|
| 94 |
Establishing and confirming R and M requirements for DND vehicles
|
Harris, A.P
|
|
1980
|
76-77 |
1-2 |
p. 55-73
19 p.
|
artikel
|
| 95 |
Evaluating fault trees (AND and OR gates only) with repeated events
|
|
|
1992
|
76-77 |
1-2 |
p. 289-
1 p.
|
artikel
|
| 96 |
Evaluation and design of an ultra-reliable distributed architecture for fault tolerance
|
|
|
1992
|
76-77 |
1-2 |
p. 289-
1 p.
|
artikel
|
| 97 |
Evaluation of fuzzy reliability of a non-series parallel network
|
Chowdhury, Sumandra Ghosh
|
|
1992
|
76-77 |
1-2 |
p. 1-4
4 p.
|
artikel
|
| 98 |
Event-tree analysis by fuzzy probability
|
|
|
1992
|
76-77 |
1-2 |
p. 291-
1 p.
|
artikel
|
| 99 |
Experimental evaluation of the fault tolerance of an atomic multicast system
|
|
|
1992
|
76-77 |
1-2 |
p. 291-
1 p.
|
artikel
|
| 100 |
Extended behavioral decomposition for estimating ultrahigh reliability
|
|
|
1992
|
76-77 |
1-2 |
p. 283-
1 p.
|
artikel
|
| 101 |
Extrapolation of high-voltage stress measurements to lowvoltage operation for thin silicon-oxide films
|
|
|
1992
|
76-77 |
1-2 |
p. 299-
1 p.
|
artikel
|
| 102 |
Fabrication of high density multichip modules
|
|
|
1992
|
76-77 |
1-2 |
p. 293-
1 p.
|
artikel
|
| 103 |
Fault-tolerant programs and their reliability
|
|
|
1992
|
76-77 |
1-2 |
p. 288-289
2 p.
|
artikel
|
| 104 |
Fault-trees for a voting circuit; synthesis and joint analysis
|
Schneeweiss, Winfrid G.
|
|
1992
|
76-77 |
1-2 |
p. 35-47
13 p.
|
artikel
|
| 105 |
Fibre optics in data transmission
|
Yarker, Colin A.
|
|
1978
|
76-77 |
1-2 |
p. 179-189
11 p.
|
artikel
|
| 106 |
Fitting maintenance cost vs maintainability data to a standard curve
|
Govil, K.K.
|
|
1992
|
76-77 |
1-2 |
p. 267-268
2 p.
|
artikel
|
| 107 |
Flexible picosecond probing of integrated circuits with chopped electron beams
|
|
|
1992
|
76-77 |
1-2 |
p. 294-
1 p.
|
artikel
|
| 108 |
1/f noise in ceramic superconductors and granular resistors
|
|
|
1992
|
76-77 |
1-2 |
p. 299-
1 p.
|
artikel
|
| 109 |
Focused ion beam technology
|
|
|
1992
|
76-77 |
1-2 |
p. 300-
1 p.
|
artikel
|
| 110 |
Formation of voids in silicone RTV dispersion under beam-leaded silicon integrated circuits
|
|
|
1992
|
76-77 |
1-2 |
p. 284-285
2 p.
|
artikel
|
| 111 |
Fundamentals of manipulator calibration
|
G.W.A.D.,
|
|
1992
|
76-77 |
1-2 |
p. 275-276
2 p.
|
artikel
|
| 112 |
Gidep assists in solving reliability/quality problems
|
Richards, Edwin T
|
|
1980
|
76-77 |
1-2 |
p. 83-90
8 p.
|
artikel
|
| 113 |
Hardware and software reliability and confidence limits for computer-controlled systems
|
Haynes, Robert D
|
|
1980
|
76-77 |
1-2 |
p. 109-122
14 p.
|
artikel
|
| 114 |
Hierarchical Bayesian approach to reliability estimation under competing risk
|
Badarinathi, Ravija
|
|
1992
|
76-77 |
1-2 |
p. 249-258
10 p.
|
artikel
|
| 115 |
Hierarchical Bayesian reliability analysis using Erlang families of priors and hyperpriors
|
Bhattacharya, Samir K.
|
|
1992
|
76-77 |
1-2 |
p. 241-247
7 p.
|
artikel
|
| 116 |
Highly integrated microcomputers
|
Kornstein, Howard
|
|
1978
|
76-77 |
1-2 |
p. 3-4
2 p.
|
artikel
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| 117 |
High-speed GaAs/AIGaAs optoelectronic devices for computer applications
|
|
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1992
|
76-77 |
1-2 |
p. 296-
1 p.
|
artikel
|
| 118 |
High temperature millisecond annealing of arsenic implanted silicon
|
|
|
1992
|
76-77 |
1-2 |
p. 301-302
2 p.
|
artikel
|
| 119 |
High thermal conductivity aluminum nitride ceramic substrates and packages
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|
|
1992
|
76-77 |
1-2 |
p. 294-
1 p.
|
artikel
|
| 120 |
Hi-Q chip model ceramic capacitors handle high frequencies
|
|
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1992
|
76-77 |
1-2 |
p. 286-
1 p.
|
artikel
|
| 121 |
Hybrid ICs find market, adopt new technology
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|
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1992
|
76-77 |
1-2 |
p. 300-
1 p.
|
artikel
|
| 122 |
IC tester industry gears up for large-memory DRAMs
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|
|
1992
|
76-77 |
1-2 |
p. 292-
1 p.
|
artikel
|
| 123 |
Impact ionization in silicon: a review and update
|
|
|
1992
|
76-77 |
1-2 |
p. 301-
1 p.
|
artikel
|
| 124 |
Impact of network failures on the performance degradation of a class of cluster-based multiprocessors
|
|
|
1992
|
76-77 |
1-2 |
p. 285-
1 p.
|
artikel
|
| 125 |
Implementing fault-tolerance via modular redundancy with comparison
|
|
|
1992
|
76-77 |
1-2 |
p. 287-288
2 p.
|
artikel
|
| 126 |
In-line statistical process control and feedback for VLSI integrated circuit manufacturing
|
|
|
1992
|
76-77 |
1-2 |
p. 294-295
2 p.
|
artikel
|
| 127 |
Integrated circuits in radio transceivers
|
Bryant, James M.
|
|
1978
|
76-77 |
1-2 |
p. 77-85
9 p.
|
artikel
|
| 128 |
Integrated circuits take the cams out of cameras
|
Anderson, David
|
|
1978
|
76-77 |
1-2 |
p. 35-47
13 p.
|
artikel
|
| 129 |
Integrated components for fiber optic data links in industrial applications
|
Hanson, Del
|
|
1978
|
76-77 |
1-2 |
p. 175-178
4 p.
|
artikel
|
| 130 |
Intermetallic formation on the fracture of Sn/Pb solder and Pd/Ag conductor interfaces
|
|
|
1992
|
76-77 |
1-2 |
p. 284-
1 p.
|
artikel
|
| 131 |
Introduction and certification of a quality assurance system
|
|
|
1992
|
76-77 |
1-2 |
p. 291-
1 p.
|
artikel
|
| 132 |
Introduction to programming
|
Monk, J.
|
|
1978
|
76-77 |
1-2 |
p. 143-152
10 p.
|
artikel
|
| 133 |
Investigation of arsenic-implanted silicon by optical reflectometry
|
|
|
1992
|
76-77 |
1-2 |
p. 301-
1 p.
|
artikel
|
| 134 |
Laptop PCs propel progress in half-pitch connectors
|
|
|
1992
|
76-77 |
1-2 |
p. 285-
1 p.
|
artikel
|
| 135 |
Large-scale GaAs ICs challenge bipolar ICs in speed, power, cost
|
|
|
1992
|
76-77 |
1-2 |
p. 296-
1 p.
|
artikel
|
| 136 |
Laser trimming of thick film metal resistors on aluminum nitride substrates
|
|
|
1992
|
76-77 |
1-2 |
p. 299-
1 p.
|
artikel
|
| 137 |
LED array modules by new technology microbump bonding method
|
|
|
1992
|
76-77 |
1-2 |
p. 294-
1 p.
|
artikel
|
| 138 |
Light simulation of molecular beam epitaxy
|
|
|
1992
|
76-77 |
1-2 |
p. 301-
1 p.
|
artikel
|
| 139 |
Makers expect ASICs to reverse computer slump
|
|
|
1992
|
76-77 |
1-2 |
p. 292-
1 p.
|
artikel
|
| 140 |
Management of satellite systems reliability program
|
Behmann, François
|
|
1979
|
76-77 |
1-2 |
p. 15-21
7 p.
|
artikel
|
| 141 |
Management of total reliability
|
Puri, S.C.
|
|
1979
|
76-77 |
1-2 |
p. 7-10
4 p.
|
artikel
|
| 142 |
Manual backup operations: Some behavioral aspects of human reliability
|
Abo El-Ela, Maged A.
|
|
1979
|
76-77 |
1-2 |
p. 141-149
9 p.
|
artikel
|
| 143 |
Mass production back-grinding/wafer-thinning technology for GaAs devices
|
|
|
1992
|
76-77 |
1-2 |
p. 295-
1 p.
|
artikel
|
| 144 |
Measurement of the standoff height between a flip-mounted IC chip and its substrate
|
|
|
1992
|
76-77 |
1-2 |
p. 293-
1 p.
|
artikel
|
| 145 |
Mechanical component reliability under environmental stress
|
Dhillon, Balbir S
|
|
1980
|
76-77 |
1-2 |
p. 153-160
8 p.
|
artikel
|
| 146 |
Microprocessors for high accuracy component measurement
|
Bond, D.F.
|
|
1978
|
76-77 |
1-2 |
p. 53-63
11 p.
|
artikel
|
| 147 |
Modelling of epitaxial growth rate of silicon by vapour phase epitaxy
|
|
|
1992
|
76-77 |
1-2 |
p. 298-
1 p.
|
artikel
|
| 148 |
Monte Carlo analysis of semiconductor devices: the DAMOCLES program
|
|
|
1992
|
76-77 |
1-2 |
p. 284-
1 p.
|
artikel
|
| 149 |
MOS semiconductor random access memory failure rate
|
Arsenault, J.E.
|
|
1979
|
76-77 |
1-2 |
p. 81-88
8 p.
|
artikel
|
| 150 |
Multichip modules for advanced applications
|
|
|
1992
|
76-77 |
1-2 |
p. 294-
1 p.
|
artikel
|
| 151 |
Multilayer ceramic packaging alternatives
|
|
|
1992
|
76-77 |
1-2 |
p. 295-
1 p.
|
artikel
|
| 152 |
New development of thin plastic package with high terminal counts
|
|
|
1992
|
76-77 |
1-2 |
p. 295-
1 p.
|
artikel
|
| 153 |
New developments in high voltage planar thyristors for use in automobile
|
Ethenoz, Pierre
|
|
1978
|
76-77 |
1-2 |
p. 193-203
11 p.
|
artikel
|
| 154 |
Nonparametric confidence bounds, using censored data on the mean residual life
|
|
|
1992
|
76-77 |
1-2 |
p. 287-
1 p.
|
artikel
|
| 155 |
Ohmic contact electromigration
|
Scorzoni, Andrea
|
|
1992
|
76-77 |
1-2 |
p. 167-174
8 p.
|
artikel
|
| 156 |
On comparison of estimators in a generalized life model
|
Dey, Dipak K.
|
|
1992
|
76-77 |
1-2 |
p. 207-221
15 p.
|
artikel
|
| 157 |
On fault trees and other reliability evaluation methods
|
Dhillon, Balbir S.
|
|
1979
|
76-77 |
1-2 |
p. 57-63
7 p.
|
artikel
|
| 158 |
On optimizing yield reliability and area overhead in large memory arrays
|
Noore, A.
|
|
1992
|
76-77 |
1-2 |
p. 67-77
11 p.
|
artikel
|
| 159 |
On the analysis of accelerated life-testing experiments
|
|
|
1992
|
76-77 |
1-2 |
p. 291-
1 p.
|
artikel
|
| 160 |
On the possibility of internal gettering in commercially available silicon wafers
|
|
|
1992
|
76-77 |
1-2 |
p. 295-
1 p.
|
artikel
|
| 161 |
On the robustness of LDD and nMOS transistors subjected to measurement of drain breakdown voltage
|
|
|
1992
|
76-77 |
1-2 |
p. 286-
1 p.
|
artikel
|
| 162 |
Optically controlled current-voltage characteristics of ion-implanted MESFETs
|
|
|
1992
|
76-77 |
1-2 |
p. 301-
1 p.
|
artikel
|
| 163 |
Optimal allocation and control problems for software-testing resources
|
|
|
1992
|
76-77 |
1-2 |
p. 288-
1 p.
|
artikel
|
| 164 |
Optimal design of k-out-of-n redundant systems
|
Pham, Hoang
|
|
1992
|
76-77 |
1-2 |
p. 119-126
8 p.
|
artikel
|
| 165 |
Optimal maintainability allocation using the geometric programming method
|
Govil, K.K.
|
|
1992
|
76-77 |
1-2 |
p. 265-266
2 p.
|
artikel
|
| 166 |
Optimum reliability investment in the electronics industry
|
Sultan, Torky I.
|
|
1992
|
76-77 |
1-2 |
p. 159-166
8 p.
|
artikel
|
| 167 |
Optimum software release policy with random life-cycle
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|
|
1992
|
76-77 |
1-2 |
p. 289-
1 p.
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artikel
|
| 168 |
Optimum test design strategies
|
Kapur, Kailash C
|
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1980
|
76-77 |
1-2 |
p. 75-81
7 p.
|
artikel
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| 169 |
Origin of gas impurities in sputtering plasmas during thin film deposition
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|
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1992
|
76-77 |
1-2 |
p. 299-
1 p.
|
artikel
|
| 170 |
Parallel Petri net path searching on a local area network—Object oriented Pascal implementation
|
Anneberg, L.
|
|
1992
|
76-77 |
1-2 |
p. 199-206
8 p.
|
artikel
|
| 171 |
Passive chip components follow high-density trends
|
|
|
1992
|
76-77 |
1-2 |
p. 293-
1 p.
|
artikel
|
| 172 |
Picosecond noninvasive optical detection of internal electrical signals in flip-chip-mounted silicon integrated circuits
|
|
|
1992
|
76-77 |
1-2 |
p. 296-
1 p.
|
artikel
|
| 173 |
Picosecond photoemission probing of integrated circuits: capabilities, limitations, and applications
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|
|
1992
|
76-77 |
1-2 |
p. 284-
1 p.
|
artikel
|
| 174 |
Point defect generation and arsenic diffusion in silicon in inert ambient
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|
|
1992
|
76-77 |
1-2 |
p. 297-
1 p.
|
artikel
|
| 175 |
Point defect populations in amorphous and crystalline silicon
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|
|
1992
|
76-77 |
1-2 |
p. 298-
1 p.
|
artikel
|
| 176 |
Potential and problems of high-temperature electronics and CMOS integrated circuits (25–250°C)—an overview
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|
|
1992
|
76-77 |
1-2 |
p. 292-
1 p.
|
artikel
|
| 177 |
Practical experimental designs applied to haloing (Measling) on Teflon circuit boards
|
|
|
1992
|
76-77 |
1-2 |
p. 284-
1 p.
|
artikel
|
| 178 |
Predicting and eliminating built-in test false alarms
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|
|
1992
|
76-77 |
1-2 |
p. 288-
1 p.
|
artikel
|
| 179 |
Prediction of the reliability of mechanical components subjected to combined alternating and mean stresses with non-constant stress ratio
|
Kececioglu, D
|
|
1980
|
76-77 |
1-2 |
p. 45-54
10 p.
|
artikel
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| 180 |
Principles of wet chemical processing in ULSI microfabrication
|
|
|
1992
|
76-77 |
1-2 |
p. 293-
1 p.
|
artikel
|
| 181 |
Printed wiring board inner layer contamination study
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|
|
1992
|
76-77 |
1-2 |
p. 285-
1 p.
|
artikel
|
| 182 |
Product audit: quality assurance of quality assurance
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|
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1992
|
76-77 |
1-2 |
p. 283-
1 p.
|
artikel
|
| 183 |
Publications, notices, calls for papers, Etc.
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|
|
1992
|
76-77 |
1-2 |
p. 281-
1 p.
|
artikel
|
| 184 |
Quality assurance and the consumer
|
Heslop, Louise A
|
|
1980
|
76-77 |
1-2 |
p. 1-9
9 p.
|
artikel
|
| 185 |
“Real world” interfacing to microprocessors
|
Rabin, Neville
|
|
1978
|
76-77 |
1-2 |
p. 111-117
7 p.
|
artikel
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| 186 |
Redundancy optimization of k-out-of-n systems with common-cause failures
|
|
|
1992
|
76-77 |
1-2 |
p. 290-
1 p.
|
artikel
|
| 187 |
Redundant-system demonstrated-reliability approximation using piece-part failure rates
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|
|
1992
|
76-77 |
1-2 |
p. 285-
1 p.
|
artikel
|
| 188 |
Reliability analysis of a human operator under different levels of stress
|
Chung, Who Kee
|
|
1992
|
76-77 |
1-2 |
p. 127-131
5 p.
|
artikel
|
| 189 |
Reliability analysis of two-unit warm standby system with partial failure mode and inspection time
|
Pandey, D.K.
|
|
1992
|
76-77 |
1-2 |
p. 17-19
3 p.
|
artikel
|
| 190 |
Reliability and maintainability growth of a modern, high performance aircraft, the F-14A
|
Bigel, Gary
|
|
1979
|
76-77 |
1-2 |
p. 31-38
8 p.
|
artikel
|
| 191 |
Reliability assessment of small signal GaAs FETs
|
Behmann, François
|
|
1979
|
76-77 |
1-2 |
p. 107-115
9 p.
|
artikel
|
| 192 |
Reliability based quality (RBQ) technique for evaluating the degradation of reliability during manufacturing
|
Neri, Lewis
|
|
1979
|
76-77 |
1-2 |
p. 117-126
10 p.
|
artikel
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| 193 |
Reliability demonstration testing for software
|
|
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1992
|
76-77 |
1-2 |
p. 290-
1 p.
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artikel
|
| 194 |
Reliability in the dormant condition
|
Harris, A.P
|
|
1980
|
76-77 |
1-2 |
p. 33-44
12 p.
|
artikel
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| 195 |
Reliability learning model: Application to color TV
|
Imai, J.
|
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1979
|
76-77 |
1-2 |
p. 73-80
8 p.
|
artikel
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| 196 |
Reliability of modified designs: a Bayes analysis of an accelerated test of electronic assemblies
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|
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1992
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76-77 |
1-2 |
p. 287-
1 p.
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artikel
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| 197 |
Reliability optimization in generalized stochastic-flow networks
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|
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1992
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76-77 |
1-2 |
p. 287-
1 p.
|
artikel
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| 198 |
Reliability pays off
|
Kindig, William G
|
|
1980
|
76-77 |
1-2 |
p. 101-108
8 p.
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artikel
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| 199 |
Remote data conversion
|
Watson, David
|
|
1978
|
76-77 |
1-2 |
p. 119-125
7 p.
|
artikel
|
| 200 |
Resistor networks increasing overall mounting density
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|
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1992
|
76-77 |
1-2 |
p. 299-
1 p.
|
artikel
|
| 201 |
Rules and criteria for when to stop testing a piece of software
|
Petrova, E.
|
|
1992
|
76-77 |
1-2 |
p. 101-117
17 p.
|
artikel
|
| 202 |
SCRUMPI 3—A microprocessor with low cost I/O
|
Miller-Kirkpatrick, John H.
|
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1978
|
76-77 |
1-2 |
p. 65-76
12 p.
|
artikel
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| 203 |
Selecting, under type-II censoring, Weibull populations that are more reliable
|
|
|
1992
|
76-77 |
1-2 |
p. 287-
1 p.
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artikel
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| 204 |
Self-annealing in ion-implanted Si and GaAs
|
|
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1992
|
76-77 |
1-2 |
p. 301-
1 p.
|
artikel
|
| 205 |
Selling reliability engineering to the company
|
Darch, M.B.
|
|
1979
|
76-77 |
1-2 |
p. 1-5
5 p.
|
artikel
|
| 206 |
Silicon micromechanics: sensors and actuators on a chip
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|
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1992
|
76-77 |
1-2 |
p. 292-
1 p.
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artikel
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| 207 |
Simulated fault injection: a methodology to evaluate fault tolerant microprocessor architectures
|
|
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1992
|
76-77 |
1-2 |
p. 290-
1 p.
|
artikel
|
| 208 |
Simulation and design of Lossy transmission lines in a thin-film multichip package
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|
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1992
|
76-77 |
1-2 |
p. 300-
1 p.
|
artikel
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| 209 |
Simulation of electromigration behaviour in Al metallization of integrated circuits
|
Scherge, M.
|
|
1992
|
76-77 |
1-2 |
p. 21-24
4 p.
|
artikel
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| 210 |
Solder joint reliability of fine pitch surface mount technology assemblies
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1992
|
76-77 |
1-2 |
p. 285-
1 p.
|
artikel
|
| 211 |
Special seminex 1978 edition semiconductors and microprocessors
|
Dummer, G.W.A.
|
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1978
|
76-77 |
1-2 |
p. 1-
1 p.
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artikel
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| 212 |
Stochastic modelling of a two-stage transfer-line production system with end buffer and random demand
|
Gopalan, M.N.
|
|
1992
|
76-77 |
1-2 |
p. 11-15
5 p.
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artikel
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| 213 |
Strategies of file redundancy in information systems
|
Turksen, I.B
|
|
1980
|
76-77 |
1-2 |
p. 131-144
14 p.
|
artikel
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| 214 |
Submicron-gate-length GaAs MESFETs
|
|
|
1992
|
76-77 |
1-2 |
p. 296-
1 p.
|
artikel
|
| 215 |
Supply formats change with chip use trends
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|
1992
|
76-77 |
1-2 |
p. 292-293
2 p.
|
artikel
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| 216 |
Synchronization techniques for distributed systems: An overview
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Jeffrey Mee, W.
|
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1992
|
76-77 |
1-2 |
p. 175-197
23 p.
|
artikel
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| 217 |
System availability monitoring
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1992
|
76-77 |
1-2 |
p. 288-
1 p.
|
artikel
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| 218 |
Technical trends in optical connector development
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1992
|
76-77 |
1-2 |
p. 296-
1 p.
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artikel
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| 219 |
Technology prevents reflow soldering defects linked to miniaturization
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1992
|
76-77 |
1-2 |
p. 295-
1 p.
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artikel
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| 220 |
Temperature cycling effects between Sn/Pb solder and thick film Pd/Ag conductor metallization
|
|
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1992
|
76-77 |
1-2 |
p. 299-
1 p.
|
artikel
|
| 221 |
Test generation for VLSI chips with embedded memories
|
|
|
1992
|
76-77 |
1-2 |
p. 294-
1 p.
|
artikel
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| 222 |
Testing printed board assemblies in SMD technology
|
|
|
1992
|
76-77 |
1-2 |
p. 284-
1 p.
|
artikel
|
| 223 |
Testing whether one distribution is more IFR than another
|
Wei, Xianhua
|
|
1992
|
76-77 |
1-2 |
p. 271-273
3 p.
|
artikel
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| 224 |
Test planning as a basis for process control
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1992
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76-77 |
1-2 |
p. 290-
1 p.
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artikel
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| 225 |
The accession of the monolithic analogue to digital converter
|
Jenkins, Andrew
|
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1978
|
76-77 |
1-2 |
p. 93-99
7 p.
|
artikel
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| 226 |
The anisotropic model for simulation of a multilayer structure dry etching
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1992
|
76-77 |
1-2 |
p. 293-
1 p.
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artikel
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| 227 |
The 1978 Canadian SRE Reliability Symposium Committee
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1979
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76-77 |
1-2 |
p. v-
1 p.
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artikel
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| 228 |
The case for full convection reflow
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1992
|
76-77 |
1-2 |
p. 294-
1 p.
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artikel
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| 229 |
The combined effects of strain and heavy doping on the indirect band gap of Si and GexSi1−x alloys
|
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1992
|
76-77 |
1-2 |
p. 297-
1 p.
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artikel
|
| 230 |
The computer in the street
|
Curry, Chris
|
|
1978
|
76-77 |
1-2 |
p. 9-13
5 p.
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artikel
|
| 231 |
The design of microcomputer systems
|
Cooke, P.
|
|
1978
|
76-77 |
1-2 |
p. 127-131
5 p.
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artikel
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| 232 |
The development of ultra-high-frequency VLSI device test systems
|
|
|
1992
|
76-77 |
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The effects of localized hot-carrier-induced charge in VLSI switching circuits
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The effects of variables sampling on component reliability
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The modeling of multi-layer structures and the impact of emitter-base coupling on the determination of base recombination parameters
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Thermal fatigue life of Pb-Sn alloy interconnections
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The single-board computer approach to business machine control
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The status of magnetic bubble memories
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The zero-truncated negative binomial distribution as a failure model from the Bayesian approach
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Ultra high reliable spacecraft computer system design considerations
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Ultra-thin dielectrics for semiconductor applications—growth and characteristics
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Vacuum mechatronics and self-contained manufacturing for microelectronics processing
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Volume contents
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VXI packaging and power issues heat up
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