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                             23 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A hierarchical defect repair approach for hybrid nano/CMOS memory reliability enhancement Habibi, Mehdi
2014
54 2 p. 475-484
artikel
2 Editorial Ersland, Peter
2014
54 2 p. 341
artikel
3 Effects of latent damage of recrystallization on lead free solder joints Mayyas, Ahmad
2014
54 2 p. 447-456
artikel
4 Electrical properties and electrochemical migration characteristics of directly printed Ag patterns with various sintering conditions Yoon, Jeong-Won
2014
54 2 p. 410-416
artikel
5 Estimating activation energies for multi-mode failures Nappa, Dario
2014
54 2 p. 349-353
artikel
6 High temperature bias-stress-induced instability in power trench-gated MOSFETs Hao, J.
2014
54 2 p. 374-380
artikel
7 Impact of Ni concentration on the intermetallic compound formation and brittle fracture strength of Sn–Cu–Ni (SCN) lead-free solder joints Yang, Chaoran
2014
54 2 p. 435-446
artikel
8 Improved performance by using TaON/SiO2 as dual tunnel layer in Charge-Trapping nonvolatile memory Chen, J.X.
2014
54 2 p. 393-396
artikel
9 Influence of rapid thermal annealing temperature on structure and electrical properties of high permittivity HfTiO thin film used in MOSFET Ye, Cong
2014
54 2 p. 388-392
artikel
10 Inside front cover - Editorial board 2014
54 2 p. IFC
artikel
11 Lifetime prediction of thick aluminium wire bonds for mechanical cyclic loads Merkle, L.
2014
54 2 p. 417-424
artikel
12 Methodology for predicting off-state reliability in GaN power transistors Whitman, Charles S.
2014
54 2 p. 354-359
artikel
13 Modelling the self-alignment of passive chip components during reflow soldering Krammer, Olivér
2014
54 2 p. 457-463
artikel
14 Monte Carlo Static Timing Analysis with statistical sampling Merrett, Michael
2014
54 2 p. 464-474
artikel
15 [No title] Gan, Chong Leong
2014
54 2 p. 490
artikel
16 Parametric defect localization on integrated circuits – From static laser stimulation to real-time variation mapping (RTVM) Saury, L.
2014
54 2 p. 366-373
artikel
17 Process reliability screening in situ Marchut, Leslie
2014
54 2 p. 342-348
artikel
18 Quantum coupling effects on charging dynamics of nanocrystalline memory devices Mao, Ling-Feng
2014
54 2 p. 404-409
artikel
19 Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena Afacan, Engin
2014
54 2 p. 397-403
artikel
20 Reliability of the doping concentration in an ultra-thin body and buried oxide silicon on insulator (SOI) and comparison with a partially depleted SOI Chang, Wen-Teng
2014
54 2 p. 485-489
artikel
21 Separating HBT wearout from defects during early life operation Roesch, William J.
2014
54 2 p. 360-365
artikel
22 The development of effective model for thermal conduction analysis for 2.5D packaging using TSV interposer Ma, He
2014
54 2 p. 425-434
artikel
23 Time-dependent-dielectric-breakdown characteristics of Hf-doped Ta2O5/SiO2 stack Atanassova, E.
2014
54 2 p. 381-387
artikel
                             23 gevonden resultaten
 
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