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                             43 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A hydrogen sensor based on a metamorphic high electron mobility transistor (MHEMT) Tsai, Tsung-Han
2010
50 5 p. 734-737
4 p.
artikel
2 A 0.35μm CMOS divide-by-2 quadrature injection-locked frequency divider based on voltage–current feedback topology Jang, Sheng-Lyang
2010
50 5 p. 594-598
5 p.
artikel
3 Analysis of ESD discharge current distribution and area optimization of VDMOS gate protection structure Tam, Wing-Shan
2010
50 5 p. 622-626
5 p.
artikel
4 Analysis of optical properties of fundamental-mode in waveguide tapered fibers Lee, Cheng-Ling
2010
50 5 p. 726-729
4 p.
artikel
5 An investigation of drain pulse induced hot carrier degradation in n-type low temperature polycrystalline silicon thin film transistors Zhang, Meng
2010
50 5 p. 713-716
4 p.
artikel
6 A process for high yield and high performance carbon nanotube field effect transistors Lee, Tseng-Chin
2010
50 5 p. 666-669
4 p.
artikel
7 A simple method for sub-100nm pattern generation with I-line double-patterning technique Tsai, Tzu-I
2010
50 5 p. 584-588
5 p.
artikel
8 Calendar 2010
50 5 p. I-III
nvt p.
artikel
9 Characteristics of pH sensors fabricated by using protein-mediated CdSe/ZnS quantum dots Maikap, S.
2010
50 5 p. 747-752
6 p.
artikel
10 Characteristics optimization of N2O annealing on tungsten nanocrystal with W/Si dual-sputtered method for nonvolatile memory application Wang, Jer-Chyi
2010
50 5 p. 639-642
4 p.
artikel
11 Device and circuit level suppression techniques for random-dopant-induced static noise margin fluctuation in 16-nm-gate SRAM cell Lee, Kuo-Fu
2010
50 5 p. 647-651
5 p.
artikel
12 Effects of RF power on the structural, optical and electrical properties of Al-doped zinc oxide films Kuo, Shou-Yi
2010
50 5 p. 730-733
4 p.
artikel
13 Electrical and reliability characteristics of GaAs MOSHEMTs utilizing high-k IIIB and IVB oxide layers Chiu, Hsien-Chin
2010
50 5 p. 631-634
4 p.
artikel
14 Electrical characteristics and reliability properties of metal–oxide–semiconductor capacitors with HfZrLaO gate dielectrics Liu, C.H.
2010
50 5 p. 599-602
4 p.
artikel
15 Electrical characteristics of nMOSFETs fabricated on hybrid orientation substrate with amorphization/templated recrystallization method Huang, Po Chin
2010
50 5 p. 662-665
4 p.
artikel
16 Fabrication and thermal analysis of flip-chip light-emitting diodes with different numbers of Au stub bumps Lin, Cheng-Chen
2010
50 5 p. 683-687
5 p.
artikel
17 Fabrication of Au/PEDOT stacked electrodes for organic thin film transistors by imprinting technology Chen, Henry J.H.
2010
50 5 p. 717-721
5 p.
artikel
18 Field enhancement of omega-shaped-gated poly-Si TFT SONOS memory fabricated by a simple sidewall spacer formation Wu, Chun-Yu
2010
50 5 p. 704-708
5 p.
artikel
19 Flexible metal–insulator–metal capacitor using plasma enhanced binary hafnium–zirconium–oxide as gate dielectric layer Meena, Jagan Singh
2010
50 5 p. 652-656
5 p.
artikel
20 Gate tunneling leakage current behavior of 40nm PD SOI NMOS device considering the floating body effect Hung, H.J.
2010
50 5 p. 607-609
3 p.
artikel
21 Ge based nanostructures for electronic and photonic devices Ray, S.K.
2010
50 5 p. 674-678
5 p.
artikel
22 Glucose biosensor of ruthenium-doped TiO2 sensing electrode by co-sputtering system Chou, Jung-Chuan
2010
50 5 p. 753-756
4 p.
artikel
23 High efficiency p–i–n organic light-emitting diodes with a novel n-doping layer Chen, Peng Yu
2010
50 5 p. 696-698
3 p.
artikel
24 High-power broad-area InGaNAs/GaAs quantum-well lasers in the 1200nm range Yang, Hung-Pin D.
2010
50 5 p. 722-725
4 p.
artikel
25 Hysteresis effect on traps of Si3N4 sensing membranes for pH difference sensitivity Lue, Cheng-En
2010
50 5 p. 738-741
4 p.
artikel
26 Impact of Hf content on positive bias temperature instability reliability of HfSiON gate dielectrics Chen, H.W.
2010
50 5 p. 614-617
4 p.
artikel
27 Improvement of TDDB reliability, characteristics of HfO2 high-k/metal gate MOSFET device with oxygen post deposition annealing Hsu, Chia-Wei
2010
50 5 p. 618-621
4 p.
artikel
28 InGaAs submonolayer quantum-dot photonic-crystal LEDs for fiber-optic communications Yang, Hung-Pin D.
2010
50 5 p. 688-691
4 p.
artikel
29 Inserting a low-temperature n-GaN underlying layer to separate nonradiative recombination centers improves the luminescence efficiency of blue InGaN/GaN LEDs Lin, Ray-Ming
2010
50 5 p. 679-682
4 p.
artikel
30 Inside front cover - Editorial board 2010
50 5 p. IFC-
1 p.
artikel
31 Low power resistive switching memory using Cu metallic filament in Ge0.2Se0.8 solid-electrolyte Rahaman, S.Z.
2010
50 5 p. 643-646
4 p.
artikel
32 Modeling of high-frequency characteristics for epoxy-sealed micro vacuum capacitors Wong, Oi Ying
2010
50 5 p. 627-630
4 p.
artikel
33 Multi-gate non-volatile memories with nanowires as charge storage material Tsui, Bing-Yue
2010
50 5 p. 603-606
4 p.
artikel
34 Non-ideal effects improvement of SF6 plasma treated hafnium oxide film based on electrolyte–insulator–semiconductor structure for pH-sensor application Lu, Tseng-Fu
2010
50 5 p. 742-746
5 p.
artikel
35 [No title] Liou, Juin J.
2010
50 5 p. 583-
1 p.
artikel
36 On the injection methods in a top-series-injection-locked frequency divider Jang, Sheng-Lyang
2010
50 5 p. 589-593
5 p.
artikel
37 Optimization on configuration of surface conduction electron-emitters Cheng, Hui-Wen
2010
50 5 p. 699-703
5 p.
artikel
38 Physical and electrical characteristics of the high-k Nd2O3 polyoxide deposited on polycrystalline silicon Kao, Chyuan-Haur
2010
50 5 p. 709-712
4 p.
artikel
39 Red polymer light-emitting devices based on dye-dispersed poly (9,9-dioctylfluorene-alt-benzothiadiazole) Chiu, Pin-Hsiang
2010
50 5 p. 692-695
4 p.
artikel
40 Statistical variability in FinFET devices with intrinsic parameter fluctuations Hwang, Chih-Hong
2010
50 5 p. 635-638
4 p.
artikel
41 Tensile CESL-induced strain dependence on impact ionization efficiency in nMOSFETs Wang, Bo-Chin
2010
50 5 p. 610-613
4 p.
artikel
42 The impact of high-frequency characteristics induced by intrinsic parameter fluctuations in nano-MOSFET device and circuit Han, Ming-Hung
2010
50 5 p. 657-661
5 p.
artikel
43 The resistive switching characteristics of a Ti/Gd2O3/Pt RRAM device Liu, Kou-Chen
2010
50 5 p. 670-673
4 p.
artikel
                             43 gevonden resultaten
 
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