nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A 28,000 channel frequency synthesizer in 10 cubic inches
|
|
|
1966 |
5 |
4 |
p. 360- 1 p. |
artikel |
2 |
A digital I.F. system for use in a thin-film radar receiver
|
|
|
1966 |
5 |
4 |
p. 359- 1 p. |
artikel |
3 |
A new functional device performing a flip-flop circuit function
|
Ambroziak, A. |
|
1966 |
5 |
4 |
p. 343-344 2 p. |
artikel |
4 |
An experimental computer controlled trunk exchange
|
|
|
1966 |
5 |
4 |
p. 359- 1 p. |
artikel |
5 |
An investigation of instability and charge motion in metal-silicon oxide-silicon structures
|
|
|
1966 |
5 |
4 |
p. 353-354 2 p. |
artikel |
6 |
Applications of MOS Fet's in microelectronics
|
|
|
1966 |
5 |
4 |
p. 356- 1 p. |
artikel |
7 |
Applications of photo-etching in the manufacture, interconnection and packaging of microcircuits
|
|
|
1966 |
5 |
4 |
p. 358- 1 p. |
artikel |
8 |
A revolving multiple electron gun for use in the deposition of thin polymer films
|
|
|
1966 |
5 |
4 |
p. 358- 1 p. |
artikel |
9 |
A solid state store
|
|
|
1966 |
5 |
4 |
p. 360- 1 p. |
artikel |
10 |
A 180-stage integrated thin-film scan generator
|
|
|
1966 |
5 |
4 |
p. 360-361 2 p. |
artikel |
11 |
Automatic control and monitoring system for thin-film deposition
|
|
|
1966 |
5 |
4 |
p. 358- 1 p. |
artikel |
12 |
A vapour etching technique for the photolithography of silicon dioxide
|
Holmes, P.J. |
|
1966 |
5 |
4 |
p. 337-341 5 p. |
artikel |
13 |
Better quality, lower costs, through designer-fabricator communication
|
|
|
1966 |
5 |
4 |
p. 350-351 2 p. |
artikel |
14 |
Continuous electron beam processing plant for plane thin-film resistors
|
von Ardenne, M. |
|
1966 |
5 |
4 |
p. 255-256 2 p. |
artikel |
15 |
Defect interactions and precipitation in semiconductors
|
|
|
1966 |
5 |
4 |
p. 349- 1 p. |
artikel |
16 |
Dielectric relaxation in thermally grown SiO2 films
|
|
|
1966 |
5 |
4 |
p. 355- 1 p. |
artikel |
17 |
Diffusion-induced imperfections in silicon
|
|
|
1966 |
5 |
4 |
p. 354- 1 p. |
artikel |
18 |
Electron microscopic study of precipitates and defects in germanium and silicon
|
|
|
1966 |
5 |
4 |
p. 349-350 2 p. |
artikel |
19 |
Failure mechanisms in silicon transistors deduced from step stress tests
|
Young, M.R.P. |
|
1966 |
5 |
4 |
p. 271-274 4 p. |
artikel |
20 |
Field effect studies of the oxidized silicon surface
|
|
|
1966 |
5 |
4 |
p. 353- 1 p. |
artikel |
21 |
Fundamental properties of microsystems with distributed resistances and capacities (Part 1)
|
|
|
1966 |
5 |
4 |
p. 349- 1 p. |
artikel |
22 |
High resistivity tantalum films
|
|
|
1966 |
5 |
4 |
p. 357- 1 p. |
artikel |
23 |
High-speed, cost-orientated integrated circuits
|
|
|
1966 |
5 |
4 |
p. 356-357 2 p. |
artikel |
24 |
Influence of heat treatments and ionizing irradiations on the charge distribution and the number of surface states in the Si-SiO2 system
|
|
|
1966 |
5 |
4 |
p. 354- 1 p. |
artikel |
25 |
Infra-red testing of microcircuits
|
|
|
1966 |
5 |
4 |
p. 351- 1 p. |
artikel |
26 |
Integrated circuits for high-speed digital systems
|
|
|
1966 |
5 |
4 |
p. 352- 1 p. |
artikel |
27 |
Introducing m.o.s.t. devices
|
|
|
1966 |
5 |
4 |
p. 356- 1 p. |
artikel |
28 |
Laser machining of thin films
|
Board, K. |
|
1966 |
5 |
4 |
p. 251-254 4 p. |
artikel |
29 |
Liquid cooling of microcircuits, including the use of nucleate boiling
|
|
|
1966 |
5 |
4 |
p. 357-358 2 p. |
artikel |
30 |
Liquid cooling of semiconductor devices
|
|
|
1966 |
5 |
4 |
p. 357- 1 p. |
artikel |
31 |
Localized breakdown in Ge mesa diodes due to inclusions
|
Sulway, D.V. |
|
1966 |
5 |
4 |
p. 323-324 2 p. |
artikel |
32 |
Measurement of minority carrier lifetime with a non-ohmic contact and an electron beam
|
Munakata, C. |
|
1966 |
5 |
4 |
p. 267-268 2 p. |
artikel |
33 |
Measurement of resistivity and mobility in silicon epitaxial layers on a control wafer
|
|
|
1966 |
5 |
4 |
p. 352- 1 p. |
artikel |
34 |
Metal oxide silicon integrated circuits
|
|
|
1966 |
5 |
4 |
p. 356- 1 p. |
artikel |
35 |
Microelectronic integrated system cells (MISC)
|
|
|
1966 |
5 |
4 |
p. 361- 1 p. |
artikel |
36 |
Micromachining with a pulsed gas laser
|
|
|
1966 |
5 |
4 |
p. 352- 1 p. |
artikel |
37 |
Microstructural properties of thermally grown silicon dioxide layers
|
|
|
1966 |
5 |
4 |
p. 355- 1 p. |
artikel |
38 |
Modern basic concepts in component part reliability
|
Ryerson, C.M. |
|
1966 |
5 |
4 |
p. 239-250 12 p. |
artikel |
39 |
Multiple faults and confidence levels resolution of a paradox
|
Briggs, N.H. |
|
1966 |
5 |
4 |
p. 265-266 2 p. |
artikel |
40 |
Observation of double injection in long p+pn+ diffused silicon junctions and some related effects
|
|
|
1966 |
5 |
4 |
p. 352- 1 p. |
artikel |
41 |
Observations on phosphorus stabilized SiO2 films
|
|
|
1966 |
5 |
4 |
p. 354-355 2 p. |
artikel |
42 |
On the reliability of polymorphic systems
|
|
|
1966 |
5 |
4 |
p. 351- 1 p. |
artikel |
43 |
Open-base breakdown in diffused n-p-n junction transistors
|
|
|
1966 |
5 |
4 |
p. 350- 1 p. |
artikel |
44 |
Optical alignment equipment for interconnecting semiconductor integrated circuits at slice level
|
Price, T.E. |
|
1966 |
5 |
4 |
p. 347-348 2 p. |
artikel |
45 |
Optimizing the location of faults of electronic equipment using the theory of information
|
|
|
1966 |
5 |
4 |
p. 350- 1 p. |
artikel |
46 |
Physics of failure and accelerated testing
|
|
|
1966 |
5 |
4 |
p. 349- 1 p. |
artikel |
47 |
Possibilities and limits of increasing reliability in communication engineering by redundancy (Part 1)
|
|
|
1966 |
5 |
4 |
p. 351- 1 p. |
artikel |
48 |
Principles of majority logic passive redundancy
|
|
|
1966 |
5 |
4 |
p. 351- 1 p. |
artikel |
49 |
Programmed testing of integrated circuits
|
|
|
1966 |
5 |
4 |
p. 351- 1 p. |
artikel |
50 |
Properties of gold in silicon
|
|
|
1966 |
5 |
4 |
p. 355- 1 p. |
artikel |
51 |
Quantitative measurements by scanning electron microscopy-II. The use of emissive micrographs
|
Thornton, P.R. |
|
1966 |
5 |
4 |
p. 299-300 2 p. |
artikel |
52 |
Quantitative measurements by scanning electron microscopy—I. The use of conductivity maps
|
Thornton, P.R. |
|
1966 |
5 |
4 |
p. 291-292 2 p. |
artikel |
53 |
Reducing analog IC cost with multipurpose chips
|
|
|
1966 |
5 |
4 |
p. 359- 1 p. |
artikel |
54 |
Reliability of communication equipment as seen from an economic point of view
|
|
|
1966 |
5 |
4 |
p. 349- 1 p. |
artikel |
55 |
Resistances and capacitors for semiconductor block circuits
|
|
|
1966 |
5 |
4 |
p. 352- 1 p. |
artikel |
56 |
Solid circuit design considerations
|
|
|
1966 |
5 |
4 |
p. 360- 1 p. |
artikel |
57 |
Some of the papers to be published in future issues
|
|
|
1966 |
5 |
4 |
p. 363- 1 p. |
artikel |
58 |
Surface photovoltage measurements in vapour-deposited CdS
|
|
|
1966 |
5 |
4 |
p. 358- 1 p. |
artikel |
59 |
Test-system design
|
|
|
1966 |
5 |
4 |
p. 350- 1 p. |
artikel |
60 |
The chemistry of failure of aluminium electrolytic capacitors
|
|
|
1966 |
5 |
4 |
p. 349- 1 p. |
artikel |
61 |
The design of a 100 Mc/s thin-film integrated amplifier
|
|
|
1966 |
5 |
4 |
p. 359- 1 p. |
artikel |
62 |
The direct observation of electrical leakage paths due to crystal defects by use of the scanning electron microscope
|
|
|
1966 |
5 |
4 |
p. 350- 1 p. |
artikel |
63 |
The effect of composition on the temperature coefficient of resistance of NiCr films
|
|
|
1966 |
5 |
4 |
p. 357- 1 p. |
artikel |
64 |
The effect of heavy doping on the diffusion of impurities in silicon
|
|
|
1966 |
5 |
4 |
p. 353- 1 p. |
artikel |
65 |
The electrical properties of vacuum and chemically deposited thin and thick resistive films
|
Jones, D.E.H. |
|
1966 |
5 |
4 |
p. 305-321 17 p. |
artikel |
66 |
The fly's-eye camera
|
|
|
1966 |
5 |
4 |
p. 351- 1 p. |
artikel |
67 |
The influence of oxidation rate and heat treatment on the Si surface potential in the Si-SiO2 system
|
|
|
1966 |
5 |
4 |
p. 354- 1 p. |
artikel |
68 |
The manufacture of thin-film circuits for use in airborne equipment
|
|
|
1966 |
5 |
4 |
p. 361- 1 p. |
artikel |
69 |
The origin of channel currents associated with p+ regions in silicon
|
|
|
1966 |
5 |
4 |
p. 353- 1 p. |
artikel |
70 |
The problem of silicon evaporation in producing epitaxial films
|
|
|
1966 |
5 |
4 |
p. 356- 1 p. |
artikel |
71 |
Thermal growth and chemical etching of silicon dioxide films
|
|
|
1966 |
5 |
4 |
p. 353- 1 p. |
artikel |
72 |
The role of the ionization of defects in causing systematic differences in the semiconductor properties of undoped compounds
|
|
|
1966 |
5 |
4 |
p. 350- 1 p. |
artikel |
73 |
The transient response of insulated-gate field-effect transistors
|
|
|
1966 |
5 |
4 |
p. 356- 1 p. |
artikel |
74 |
The use of amplifier blocks as standard components
|
|
|
1966 |
5 |
4 |
p. 361- 1 p. |
artikel |
75 |
The use of equivalent networks to minimize the tolerance of passive thin film circuits
|
Neuman, M.R. |
|
1966 |
5 |
4 |
p. 329-335 7 p. |
artikel |
76 |
Transients in thin-film RC networks
|
|
|
1966 |
5 |
4 |
p. 357- 1 p. |
artikel |
77 |
Å university clean room
|
|
|
1966 |
5 |
4 |
p. 352- 1 p. |
artikel |
78 |
Worst-case circuit design
|
|
|
1966 |
5 |
4 |
p. 351- 1 p. |
artikel |