nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Adhesion of arbitrary-shaped thin-film microstructures
|
Bhate, Dhruv |
|
2007 |
47 |
12 |
p. 2014-2024 11 p. |
artikel |
2 |
Advanced electronic prognostics through system telemetry and pattern recognition methods
|
Lopez, Leon |
|
2007 |
47 |
12 |
p. 1865-1873 9 p. |
artikel |
3 |
A maintenance planning and business case development model for the application of prognostics and health management (PHM) to electronic systems
|
Sandborn, Peter A. |
|
2007 |
47 |
12 |
p. 1889-1901 13 p. |
artikel |
4 |
Analysis of interior degradation of a laser waveguide using an OBIC monitor
|
Takeshita, Tatsuya |
|
2007 |
47 |
12 |
p. 2135-2140 6 p. |
artikel |
5 |
An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors
|
Michalas, L. |
|
2007 |
47 |
12 |
p. 2058-2064 7 p. |
artikel |
6 |
A straightforward analytical method for extraction of semiconductor device transient thermal parameters
|
Masana, F.N. |
|
2007 |
47 |
12 |
p. 2122-2128 7 p. |
artikel |
7 |
Board level drop test and simulation of leaded and lead-free BGA-PCB assembly
|
Qu, Xin |
|
2007 |
47 |
12 |
p. 2197-2204 8 p. |
artikel |
8 |
Concept of smart integrated life consumption monitoring system for electronics
|
Rouet, Vincent |
|
2007 |
47 |
12 |
p. 1921-1927 7 p. |
artikel |
9 |
Coupled electro-thermal simulation of a DC/DC converter
|
Vellvehi, Miquel |
|
2007 |
47 |
12 |
p. 2114-2121 8 p. |
artikel |
10 |
Deformation analysis in microstructures and micro-devices
|
Liu, Zhanwei |
|
2007 |
47 |
12 |
p. 2226-2230 5 p. |
artikel |
11 |
Drop simulation/experimental verification and shock resistance improvement of TFT–LCD monitors
|
Pan, Min-Chun |
|
2007 |
47 |
12 |
p. 2249-2259 11 p. |
artikel |
12 |
Dynamic behavior of resistive faults in nanometer technology
|
Kunchwar, Mayuri |
|
2007 |
47 |
12 |
p. 2141-2146 6 p. |
artikel |
13 |
Effect of displacement rate on ball shear properties for Sn–37Pb and Sn–3.5Ag BGA solder joints during isothermal aging
|
Koo, Ja-Myeong |
|
2007 |
47 |
12 |
p. 2169-2178 10 p. |
artikel |
14 |
Effect of thermal aging on the interfacial structure of SnAgCu solder joints on Cu
|
Peng, Weiqun |
|
2007 |
47 |
12 |
p. 2161-2168 8 p. |
artikel |
15 |
Effects of width scaling and layout variation on dual damascene copper interconnect electromigration
|
Lin, M.H. |
|
2007 |
47 |
12 |
p. 2100-2108 9 p. |
artikel |
16 |
Efficient damage sensitivity analysis of advanced Cu/low-k bond pad structures by means of the area release energy criterion
|
van der Sluis, O. |
|
2007 |
47 |
12 |
p. 1975-1982 8 p. |
artikel |
17 |
Electrical measurements of voltage stressed Al2O3/GaAs MOSFET
|
Tang, Z. |
|
2007 |
47 |
12 |
p. 2082-2087 6 p. |
artikel |
18 |
Electronic prognostics – A case study using global positioning system (GPS)
|
Brown, Douglas W. |
|
2007 |
47 |
12 |
p. 1874-1881 8 p. |
artikel |
19 |
Electronic prognostics for switched mode power supplies
|
Goodman, Douglas |
|
2007 |
47 |
12 |
p. 1902-1906 5 p. |
artikel |
20 |
Evaluation of reliability and metallurgical integrity of wire bonds and lead free solder joints on flexible printed circuit board sample modules
|
Rooney, Daniel T. |
|
2007 |
47 |
12 |
p. 2152-2160 9 p. |
artikel |
21 |
Evaluation of solder joint strengths under ball impact test
|
Lai, Yi-Shao |
|
2007 |
47 |
12 |
p. 2179-2187 9 p. |
artikel |
22 |
Facing the challenge of designing for Cu/low-k reliability
|
van Driel, W.D. |
|
2007 |
47 |
12 |
p. 1969-1974 6 p. |
artikel |
23 |
Fatigue and thermal fatigue damage analysis of thin metal films
|
Zhang, G.P. |
|
2007 |
47 |
12 |
p. 2007-2013 7 p. |
artikel |
24 |
Feature extraction and damage-precursors for prognostication of lead-free electronics
|
Lall, Pradeep |
|
2007 |
47 |
12 |
p. 1907-1920 14 p. |
artikel |
25 |
Finite-element model-based fault diagnosis, a case study of a ceramic pressure sensor structure
|
Zarnik, Marina Santo |
|
2007 |
47 |
12 |
p. 1950-1957 8 p. |
artikel |
26 |
Growth of tin whiskers for lead-free plated leadframe packages in high humid environments and during thermal cycling
|
Nakadaira, Yoshikuni |
|
2007 |
47 |
12 |
p. 1928-1949 22 p. |
artikel |
27 |
High-temperature performance of state-of-the-art triple-gate transistors
|
Akarvardar, K. |
|
2007 |
47 |
12 |
p. 2065-2069 5 p. |
artikel |
28 |
Impact of board and component metallizations on microstructure and reliability of lead-free solder joints
|
Zbrzezny, A.R. |
|
2007 |
47 |
12 |
p. 2205-2214 10 p. |
artikel |
29 |
Influence of matrix viscoelastic properties on thermal conductivity of TCA – Numerical approach
|
Falat, Tomasz |
|
2007 |
47 |
12 |
p. 1989-1996 8 p. |
artikel |
30 |
Introduction to special section on electronic systems prognostics and health management
|
Sandborn, Peter |
|
2007 |
47 |
12 |
p. 1847-1848 2 p. |
artikel |
31 |
Isothermal aging effects on flex cracking of multilayer ceramic capacitors with standard and flexible terminations
|
Keimasi, Mohammadreza |
|
2007 |
47 |
12 |
p. 2215-2225 11 p. |
artikel |
32 |
Life cycle cost impact of using prognostic health management (PHM) for helicopter avionics
|
Scanff, E. |
|
2007 |
47 |
12 |
p. 1857-1864 8 p. |
artikel |
33 |
Low frequency noise in nMOSFETs with subnanometer EOT hafnium-based gate dielectrics
|
Magnone, P. |
|
2007 |
47 |
12 |
p. 2109-2113 5 p. |
artikel |
34 |
Measuring the through-plane elastic modulus of thin polymer films in situ
|
van Soestbergen, M. |
|
2007 |
47 |
12 |
p. 1983-1988 6 p. |
artikel |
35 |
Metal gates and gate-deposition-induced defects in Ta2O5 stack capacitors
|
Atanassova, E. |
|
2007 |
47 |
12 |
p. 2088-2093 6 p. |
artikel |
36 |
Microstructural considerations for ultrafine lead free solder joints
|
Huang, Zhiheng |
|
2007 |
47 |
12 |
p. 1997-2006 10 p. |
artikel |
37 |
Multiple high-voltage pulse stressing of conventional thick-film resistors
|
Stanimirović, I. |
|
2007 |
47 |
12 |
p. 2242-2248 7 p. |
artikel |
38 |
[No title]
|
Stojcev, Mile |
|
2007 |
47 |
12 |
p. 2287-2288 2 p. |
artikel |
39 |
[No title]
|
Stojcev, Mile |
|
2007 |
47 |
12 |
p. 2282-2283 2 p. |
artikel |
40 |
[No title]
|
Stojcev, Mile |
|
2007 |
47 |
12 |
p. 2289-2290 2 p. |
artikel |
41 |
[No title]
|
Stojcev, Mile |
|
2007 |
47 |
12 |
p. 2284-2286 3 p. |
artikel |
42 |
Polarity asymmetry of stress and charge trapping behavior of thin Hf- and Zr-silicate layers
|
Paskaleva, A. |
|
2007 |
47 |
12 |
p. 2094-2099 6 p. |
artikel |
43 |
Predicting the process induced warpage of electronic packages using the P–V–T–C equation and the Taguchi method
|
Teng, Shiang-Yu |
|
2007 |
47 |
12 |
p. 2231-2241 11 p. |
artikel |
44 |
Prognostics implementation of electronics under vibration loading
|
Gu, Jie |
|
2007 |
47 |
12 |
p. 1849-1856 8 p. |
artikel |
45 |
Reliability of wire-bonding and solder joint for high temperature operation of power semiconductor device
|
Yamada, Y. |
|
2007 |
47 |
12 |
p. 2147-2151 5 p. |
artikel |
46 |
Simplified terrain identification and component fatigue damage estimation model for use in a health and usage monitoring system
|
Heine, Richard |
|
2007 |
47 |
12 |
p. 1882-1888 7 p. |
artikel |
47 |
Simulation and fabrication of magnetic rotary microgenerator with multipolar Nd/Fe/B magnet
|
Pan, C.T. |
|
2007 |
47 |
12 |
p. 2129-2134 6 p. |
artikel |
48 |
Stress induced gate–drain leakage current in ultra-thin gate oxide
|
Petit, C. |
|
2007 |
47 |
12 |
p. 2070-2081 12 p. |
artikel |
49 |
Study of the electrolyte-insulator-semiconductor field-effect transistor (EISFET) with applications in biosensor design
|
Waleed Shinwari, M. |
|
2007 |
47 |
12 |
p. 2025-2057 33 p. |
artikel |
50 |
Testing process precision for truncated normal distributions
|
Pearn, W.L. |
|
2007 |
47 |
12 |
p. 2275-2281 7 p. |
artikel |
51 |
The effects of rheological and wetting properties on underfill filler settling and flow voids in flip chip packages
|
Wang, Jinlin |
|
2007 |
47 |
12 |
p. 1958-1966 9 p. |
artikel |
52 |
Thermal, mechanical and multi-physics simulation and experiments in micro-electronics and micro-systems
|
Wymysłowski, Artur |
|
2007 |
47 |
12 |
p. 1967-1968 2 p. |
artikel |
53 |
Transient analysis of drop responses of board-level electronic packages using response spectra incorporated with modal superposition
|
Yeh, Chang-Lin |
|
2007 |
47 |
12 |
p. 2188-2196 9 p. |
artikel |
54 |
Universal fatigue life prediction equation for ceramic ball grid array (CBGA) packages
|
Perkins, Andy |
|
2007 |
47 |
12 |
p. 2260-2274 15 p. |
artikel |