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                             54 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Adhesion of arbitrary-shaped thin-film microstructures Bhate, Dhruv
2007
47 12 p. 2014-2024
11 p.
artikel
2 Advanced electronic prognostics through system telemetry and pattern recognition methods Lopez, Leon
2007
47 12 p. 1865-1873
9 p.
artikel
3 A maintenance planning and business case development model for the application of prognostics and health management (PHM) to electronic systems Sandborn, Peter A.
2007
47 12 p. 1889-1901
13 p.
artikel
4 Analysis of interior degradation of a laser waveguide using an OBIC monitor Takeshita, Tatsuya
2007
47 12 p. 2135-2140
6 p.
artikel
5 An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors Michalas, L.
2007
47 12 p. 2058-2064
7 p.
artikel
6 A straightforward analytical method for extraction of semiconductor device transient thermal parameters Masana, F.N.
2007
47 12 p. 2122-2128
7 p.
artikel
7 Board level drop test and simulation of leaded and lead-free BGA-PCB assembly Qu, Xin
2007
47 12 p. 2197-2204
8 p.
artikel
8 Concept of smart integrated life consumption monitoring system for electronics Rouet, Vincent
2007
47 12 p. 1921-1927
7 p.
artikel
9 Coupled electro-thermal simulation of a DC/DC converter Vellvehi, Miquel
2007
47 12 p. 2114-2121
8 p.
artikel
10 Deformation analysis in microstructures and micro-devices Liu, Zhanwei
2007
47 12 p. 2226-2230
5 p.
artikel
11 Drop simulation/experimental verification and shock resistance improvement of TFT–LCD monitors Pan, Min-Chun
2007
47 12 p. 2249-2259
11 p.
artikel
12 Dynamic behavior of resistive faults in nanometer technology Kunchwar, Mayuri
2007
47 12 p. 2141-2146
6 p.
artikel
13 Effect of displacement rate on ball shear properties for Sn–37Pb and Sn–3.5Ag BGA solder joints during isothermal aging Koo, Ja-Myeong
2007
47 12 p. 2169-2178
10 p.
artikel
14 Effect of thermal aging on the interfacial structure of SnAgCu solder joints on Cu Peng, Weiqun
2007
47 12 p. 2161-2168
8 p.
artikel
15 Effects of width scaling and layout variation on dual damascene copper interconnect electromigration Lin, M.H.
2007
47 12 p. 2100-2108
9 p.
artikel
16 Efficient damage sensitivity analysis of advanced Cu/low-k bond pad structures by means of the area release energy criterion van der Sluis, O.
2007
47 12 p. 1975-1982
8 p.
artikel
17 Electrical measurements of voltage stressed Al2O3/GaAs MOSFET Tang, Z.
2007
47 12 p. 2082-2087
6 p.
artikel
18 Electronic prognostics – A case study using global positioning system (GPS) Brown, Douglas W.
2007
47 12 p. 1874-1881
8 p.
artikel
19 Electronic prognostics for switched mode power supplies Goodman, Douglas
2007
47 12 p. 1902-1906
5 p.
artikel
20 Evaluation of reliability and metallurgical integrity of wire bonds and lead free solder joints on flexible printed circuit board sample modules Rooney, Daniel T.
2007
47 12 p. 2152-2160
9 p.
artikel
21 Evaluation of solder joint strengths under ball impact test Lai, Yi-Shao
2007
47 12 p. 2179-2187
9 p.
artikel
22 Facing the challenge of designing for Cu/low-k reliability van Driel, W.D.
2007
47 12 p. 1969-1974
6 p.
artikel
23 Fatigue and thermal fatigue damage analysis of thin metal films Zhang, G.P.
2007
47 12 p. 2007-2013
7 p.
artikel
24 Feature extraction and damage-precursors for prognostication of lead-free electronics Lall, Pradeep
2007
47 12 p. 1907-1920
14 p.
artikel
25 Finite-element model-based fault diagnosis, a case study of a ceramic pressure sensor structure Zarnik, Marina Santo
2007
47 12 p. 1950-1957
8 p.
artikel
26 Growth of tin whiskers for lead-free plated leadframe packages in high humid environments and during thermal cycling Nakadaira, Yoshikuni
2007
47 12 p. 1928-1949
22 p.
artikel
27 High-temperature performance of state-of-the-art triple-gate transistors Akarvardar, K.
2007
47 12 p. 2065-2069
5 p.
artikel
28 Impact of board and component metallizations on microstructure and reliability of lead-free solder joints Zbrzezny, A.R.
2007
47 12 p. 2205-2214
10 p.
artikel
29 Influence of matrix viscoelastic properties on thermal conductivity of TCA – Numerical approach Falat, Tomasz
2007
47 12 p. 1989-1996
8 p.
artikel
30 Introduction to special section on electronic systems prognostics and health management Sandborn, Peter
2007
47 12 p. 1847-1848
2 p.
artikel
31 Isothermal aging effects on flex cracking of multilayer ceramic capacitors with standard and flexible terminations Keimasi, Mohammadreza
2007
47 12 p. 2215-2225
11 p.
artikel
32 Life cycle cost impact of using prognostic health management (PHM) for helicopter avionics Scanff, E.
2007
47 12 p. 1857-1864
8 p.
artikel
33 Low frequency noise in nMOSFETs with subnanometer EOT hafnium-based gate dielectrics Magnone, P.
2007
47 12 p. 2109-2113
5 p.
artikel
34 Measuring the through-plane elastic modulus of thin polymer films in situ van Soestbergen, M.
2007
47 12 p. 1983-1988
6 p.
artikel
35 Metal gates and gate-deposition-induced defects in Ta2O5 stack capacitors Atanassova, E.
2007
47 12 p. 2088-2093
6 p.
artikel
36 Microstructural considerations for ultrafine lead free solder joints Huang, Zhiheng
2007
47 12 p. 1997-2006
10 p.
artikel
37 Multiple high-voltage pulse stressing of conventional thick-film resistors Stanimirović, I.
2007
47 12 p. 2242-2248
7 p.
artikel
38 [No title] Stojcev, Mile
2007
47 12 p. 2287-2288
2 p.
artikel
39 [No title] Stojcev, Mile
2007
47 12 p. 2282-2283
2 p.
artikel
40 [No title] Stojcev, Mile
2007
47 12 p. 2289-2290
2 p.
artikel
41 [No title] Stojcev, Mile
2007
47 12 p. 2284-2286
3 p.
artikel
42 Polarity asymmetry of stress and charge trapping behavior of thin Hf- and Zr-silicate layers Paskaleva, A.
2007
47 12 p. 2094-2099
6 p.
artikel
43 Predicting the process induced warpage of electronic packages using the P–V–T–C equation and the Taguchi method Teng, Shiang-Yu
2007
47 12 p. 2231-2241
11 p.
artikel
44 Prognostics implementation of electronics under vibration loading Gu, Jie
2007
47 12 p. 1849-1856
8 p.
artikel
45 Reliability of wire-bonding and solder joint for high temperature operation of power semiconductor device Yamada, Y.
2007
47 12 p. 2147-2151
5 p.
artikel
46 Simplified terrain identification and component fatigue damage estimation model for use in a health and usage monitoring system Heine, Richard
2007
47 12 p. 1882-1888
7 p.
artikel
47 Simulation and fabrication of magnetic rotary microgenerator with multipolar Nd/Fe/B magnet Pan, C.T.
2007
47 12 p. 2129-2134
6 p.
artikel
48 Stress induced gate–drain leakage current in ultra-thin gate oxide Petit, C.
2007
47 12 p. 2070-2081
12 p.
artikel
49 Study of the electrolyte-insulator-semiconductor field-effect transistor (EISFET) with applications in biosensor design Waleed Shinwari, M.
2007
47 12 p. 2025-2057
33 p.
artikel
50 Testing process precision for truncated normal distributions Pearn, W.L.
2007
47 12 p. 2275-2281
7 p.
artikel
51 The effects of rheological and wetting properties on underfill filler settling and flow voids in flip chip packages Wang, Jinlin
2007
47 12 p. 1958-1966
9 p.
artikel
52 Thermal, mechanical and multi-physics simulation and experiments in micro-electronics and micro-systems Wymysłowski, Artur
2007
47 12 p. 1967-1968
2 p.
artikel
53 Transient analysis of drop responses of board-level electronic packages using response spectra incorporated with modal superposition Yeh, Chang-Lin
2007
47 12 p. 2188-2196
9 p.
artikel
54 Universal fatigue life prediction equation for ceramic ball grid array (CBGA) packages Perkins, Andy
2007
47 12 p. 2260-2274
15 p.
artikel
                             54 gevonden resultaten
 
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