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                             33 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A methodology for microcontroller signal frequency stress prediction Hsieh, Sheng-Jen
 2005
 45 7-8 p. 1243-1251
9 p.
 artikel
2 An analytical threshold voltage model of NMOSFETs with hot-carrier induced interface charge effect Ho, C.S.
 2005
 45 7-8 p. 1144-1149
6 p.
 artikel
3 An investigation of electrical and structural properties of Ni-germanosilicided Schottky diode Saha, A.R.
 2005
 45 7-8 p. 1154-1160
7 p.
 artikel
4 Bipolar mechanisms present in short channel SOI-MOSFET transistors Janczyk, G.
 2005
 45 7-8 p. 1257-1263
7 p.
 artikel
5 Carrier separation analysis for clarifying carrier conduction and degradation mechanisms in high-k stack gate dielectrics Mizubayashi, Wataru
 2005
 45 7-8 p. 1041-1050
10 p.
 artikel
6 Chip-packaging interaction: a critical concern for Cu/low k packaging Wang, Guotao
 2005
 45 7-8 p. 1079-1093
15 p.
 artikel
7 Conduction mechanisms and an evidence for phonon-assisted conduction process in thin high-k Hf x Ti y Si z O films Paskaleva, A.
 2005
 45 7-8 p. 1124-1133
10 p.
 artikel
8 Considerations for evaluating hot-electron reliability of strained Si n-channel MOSFETs Kelly, D.Q.
 2005
 45 7-8 p. 1033-1040
8 p.
 artikel
9 Copper interconnect electromigration behaviors in various structures and lifetime improvement by cap/dielectric interface treatment Lin, M.H.
 2005
 45 7-8 p. 1061-1078
18 p.
 artikel
10 Determination of self-heating and thermal resistance in polycrystalline and bulk silicon resistors by DC measurements Sauter, Martin
 2005
 45 7-8 p. 1187-1193
7 p.
 artikel
11 Development of process modeling methodology for flip chip on flex interconnections with non-conductive adhesives Zhang, Xiaowu
 2005
 45 7-8 p. 1215-1221
7 p.
 artikel
12 Dynamic NBTI lifetime model for inverter-like waveform Tan, Shyue Seng
 2005
 45 7-8 p. 1115-1118
4 p.
 artikel
13 Effect of localized traps on the anomalous behavior of the transconductance in nanocrystalline TFTs Estrada, M.
 2005
 45 7-8 p. 1161-1166
6 p.
 artikel
14 Electrical properties of highly reliable 32Mb FRAM with advanced capacitor technology Song, Y.J.
 2005
 45 7-8 p. 1150-1153
4 p.
 artikel
15 Electrostatic discharge directly to the chip surface, caused by automatic post-wafer processing Jacob, Peter
 2005
 45 7-8 p. 1174-1180
7 p.
 artikel
16 Electrostatic micromotor and its reliability Zhang, Wenming
 2005
 45 7-8 p. 1230-1242
13 p.
 artikel
17 High voltage applications and NBTI effects of DT-pMOSFETS with reverse Schottky substrate contacts Lee, Yao-Jen
 2005
 45 7-8 p. 1119-1123
5 p.
 artikel
18 Implementation, analysis and performance evaluation of the IRP replacement policy Jaragh, Mansour
 2005
 45 7-8 p. 1264-1269
6 p.
 artikel
19 Improving reliability of thick film initiators for automotive applications based on FE-analyses Smetana, W.
 2005
 45 7-8 p. 1194-1201
8 p.
 artikel
20 Lateral punch-through TVS devices for on-chip protection in low-voltage applications Urresti, J.
 2005
 45 7-8 p. 1181-1186
6 p.
 artikel
21 Modeling of NBTI saturation effect and its impact on electric field dependence of the lifetime Aono, H.
 2005
 45 7-8 p. 1109-1114
6 p.
 artikel
22 Monolithic active pixel sensor realized in SOI technology—concept and verification Niemiec, H.
 2005
 45 7-8 p. 1202-1207
6 p.
 artikel
23 New encapsulation development for fine pitch IC devices Yao, Y.F.
 2005
 45 7-8 p. 1222-1229
8 p.
 artikel
24 [No title] Stojcev, Mile
 2005
 45 7-8 p. 1272-
1 p.
 artikel
25 [No title] Stojcev, Mile
 2005
 45 7-8 p. 1270-1271
2 p.
 artikel
26 [No title] Stojcev, Mile
 2005
 45 7-8 p. 1273-1274
2 p.
 artikel
27 Optimizing the hot carrier reliability of N-LDMOS transistor arrays Brisbin, Douglas
 2005
 45 7-8 p. 1021-1032
12 p.
 artikel
28 Process improvement of 0.13μm Cu/Low K (Black DiamondTM) dual damascene interconnection Li, H.Y.
 2005
 45 7-8 p. 1134-1143
10 p.
 artikel
29 Reliability of erasing operation in NOR-Flash memories Chimenton, Andrea
 2005
 45 7-8 p. 1094-1108
15 p.
 artikel
30 Reliability study of new SnZnAl lead-free solders used in CSP packages Kitajima, Masayuki
 2005
 45 7-8 p. 1208-1214
7 p.
 artikel
31 Size effects on the DC characteristics and low frequency noise of double polysilicon NPN bipolar transistors Valdaperez, Nicolas
 2005
 45 7-8 p. 1167-1173
7 p.
 artikel
32 Study on the RF Sputtered hydrogenated amorphous silicon–germanium thin films Serényi, M.
 2005
 45 7-8 p. 1252-1256
5 p.
 artikel
33 Threshold voltage instability characteristics of HfO2 dielectrics n-MOSFETs Rhee, Se Jong
 2005
 45 7-8 p. 1051-1060
10 p.
 artikel
                             33 gevonden resultaten
 
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