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                             16 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Board level reliability of PBGA using flex substrate Hung, S.C
2001
41 5 p. 677-687
11 p.
artikel
2 Conversion of the under bump metallurgy into intermetallics: the impact on flip chip reliability Stepniak, Frank
2001
41 5 p. 735-744
10 p.
artikel
3 Die stress drift measurement in IC plastic packages using the piezo-Hall effect Manic, D
2001
41 5 p. 767-771
5 p.
artikel
4 Effect of trench edge on pMOSFET reliability Lee, Yung-Huei
2001
41 5 p. 689-696
8 p.
artikel
5 Effects of device passivation materials on solderable metallization of IGBTs Haque, Shatil
2001
41 5 p. 639-647
9 p.
artikel
6 Effects of the sputtering deposition process of metal gate electrode on the gate dielectric characteristics Yamada, Takayuki
2001
41 5 p. 697-704
8 p.
artikel
7 Electrical and stability properties and ultrasonic microscope characterisation of low temperature co-fired ceramics resistors Dziedzic, Andrzej
2001
41 5 p. 669-676
8 p.
artikel
8 Impact of ESD protection device trigger transient on the reliability of ultra-thin gate oxide Cheung, Kin P
2001
41 5 p. 745-749
5 p.
artikel
9 Influence of the lightly doped drain resistance on the worst-case hot-carrier stress condition for NMOS devices King, Everett E
2001
41 5 p. 649-660
12 p.
artikel
10 Plasma process-induced damage on thick (6.8 nm) and thin (3.5 nm) gate oxide: parametric shifts, hot-carrier response, and dielectric integrity degradation Hook, Terence B.
2001
41 5 p. 751-765
15 p.
artikel
11 Rapid power cycling of flip-chip and CSP components on ceramic substrates Lenkkeri, Jaakko
2001
41 5 p. 661-668
8 p.
artikel
12 Reliability of 80 μm pitch flip chip attachment on flex Palm, Petteri
2001
41 5 p. 633-638
6 p.
artikel
13 Thermoelectrical degradation processes in NTC thermistors for in-rush current protection of electronic circuits Mrooz, O
2001
41 5 p. 773-777
5 p.
artikel
14 Tradeoffs in multichip module yield and cost with known good die probability and repair Charles Jr., H.K.
2001
41 5 p. 715-733
19 p.
artikel
15 Trap generation and breakdown processes in very thin gate oxides Rosenbaum, Elyse
2001
41 5 p. 625-632
8 p.
artikel
16 Wafer level packaging of a tape flip-chip chip scale packages Hotchkiss, Greg
2001
41 5 p. 705-713
9 p.
artikel
                             16 gevonden resultaten
 
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