no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
1 |
An anti-snapback circuit technique for inhibiting parasitic bipolar conduction during EOS/ESD events
|
Smith, Jeremy C. |
|
2001 |
41 |
3 |
p. 349-357 9 p. |
article |
2 |
A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation
|
Dreesen, R. |
|
2001 |
41 |
3 |
p. 437-443 7 p. |
article |
3 |
An in-line process monitoring method using electron beam induced substrate current
|
Yamada, Keizo |
|
2001 |
41 |
3 |
p. 455-459 5 p. |
article |
4 |
A strategy for characterization and evaluation of ESD robustness of CMOS semiconductor technologies
|
Voldman, S |
|
2001 |
41 |
3 |
p. 335-348 14 p. |
article |
5 |
Editorial
|
Verhaege, Koen G. |
|
2001 |
41 |
3 |
p. 333- 1 p. |
article |
6 |
Hardware/firmware co-design in an 8-bits microcontroller to solve the system-level ESD issue on keyboard
|
Ker, Ming-Dou |
|
2001 |
41 |
3 |
p. 417-429 13 p. |
article |
7 |
Improved reliability in small multichip ball grid arrays
|
Moore, Thomas D. |
|
2001 |
41 |
3 |
p. 461-469 9 p. |
article |
8 |
Influence of gate length on ESD-performance for deep submicron CMOS technology
|
Bock, K. |
|
2001 |
41 |
3 |
p. 375-383 9 p. |
article |
9 |
Investigations on double-diffused MOS transistors under ESD zap conditions
|
Boselli, Gianluca |
|
2001 |
41 |
3 |
p. 395-405 11 p. |
article |
10 |
Issues concerning charged device model ESD verification modules − the need to move to alumina
|
Henry, L.G. |
|
2001 |
41 |
3 |
p. 407-415 9 p. |
article |
11 |
Modeling bimodal electromigration failure distributions
|
Fischer, A.H |
|
2001 |
41 |
3 |
p. 445-453 9 p. |
article |
12 |
Reliability considerations for ESD protection under wire bonding pads
|
Anderson, Warren R. |
|
2001 |
41 |
3 |
p. 367-373 7 p. |
article |
13 |
Stacked PMOS clamps for high voltage power supply protection
|
Maloney, Timothy J |
|
2001 |
41 |
3 |
p. 359-366 8 p. |
article |
14 |
Testing and improvement of micro-optical-switch dynamics
|
Rembe, Christian |
|
2001 |
41 |
3 |
p. 471-480 10 p. |
article |
15 |
Transport and noise properties of CdTe(Cl) crystals
|
Schauer, P. |
|
2001 |
41 |
3 |
p. 431-436 6 p. |
article |
16 |
Wide range control of the sustaining voltage of electrostatic discharge protection elements realized in a smart power technology
|
Goßner, H. |
|
2001 |
41 |
3 |
p. 385-393 9 p. |
article |