| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
An anti-snapback circuit technique for inhibiting parasitic bipolar conduction during EOS/ESD events
|
Smith, Jeremy C.
|
|
2001
|
41 |
3 |
p. 349-357
9 p.
|
artikel
|
| 2 |
A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation
|
Dreesen, R.
|
|
2001
|
41 |
3 |
p. 437-443
7 p.
|
artikel
|
| 3 |
An in-line process monitoring method using electron beam induced substrate current
|
Yamada, Keizo
|
|
2001
|
41 |
3 |
p. 455-459
5 p.
|
artikel
|
| 4 |
A strategy for characterization and evaluation of ESD robustness of CMOS semiconductor technologies
|
Voldman, S
|
|
2001
|
41 |
3 |
p. 335-348
14 p.
|
artikel
|
| 5 |
Editorial
|
Verhaege, Koen G.
|
|
2001
|
41 |
3 |
p. 333-
1 p.
|
artikel
|
| 6 |
Hardware/firmware co-design in an 8-bits microcontroller to solve the system-level ESD issue on keyboard
|
Ker, Ming-Dou
|
|
2001
|
41 |
3 |
p. 417-429
13 p.
|
artikel
|
| 7 |
Improved reliability in small multichip ball grid arrays
|
Moore, Thomas D.
|
|
2001
|
41 |
3 |
p. 461-469
9 p.
|
artikel
|
| 8 |
Influence of gate length on ESD-performance for deep submicron CMOS technology
|
Bock, K.
|
|
2001
|
41 |
3 |
p. 375-383
9 p.
|
artikel
|
| 9 |
Investigations on double-diffused MOS transistors under ESD zap conditions
|
Boselli, Gianluca
|
|
2001
|
41 |
3 |
p. 395-405
11 p.
|
artikel
|
| 10 |
Issues concerning charged device model ESD verification modules − the need to move to alumina
|
Henry, L.G.
|
|
2001
|
41 |
3 |
p. 407-415
9 p.
|
artikel
|
| 11 |
Modeling bimodal electromigration failure distributions
|
Fischer, A.H
|
|
2001
|
41 |
3 |
p. 445-453
9 p.
|
artikel
|
| 12 |
Reliability considerations for ESD protection under wire bonding pads
|
Anderson, Warren R.
|
|
2001
|
41 |
3 |
p. 367-373
7 p.
|
artikel
|
| 13 |
Stacked PMOS clamps for high voltage power supply protection
|
Maloney, Timothy J
|
|
2001
|
41 |
3 |
p. 359-366
8 p.
|
artikel
|
| 14 |
Testing and improvement of micro-optical-switch dynamics
|
Rembe, Christian
|
|
2001
|
41 |
3 |
p. 471-480
10 p.
|
artikel
|
| 15 |
Transport and noise properties of CdTe(Cl) crystals
|
Schauer, P.
|
|
2001
|
41 |
3 |
p. 431-436
6 p.
|
artikel
|
| 16 |
Wide range control of the sustaining voltage of electrostatic discharge protection elements realized in a smart power technology
|
Goßner, H.
|
|
2001
|
41 |
3 |
p. 385-393
9 p.
|
artikel
|
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