Digitale Bibliotheek
Sluiten Bladeren door artikelen uit een tijdschrift
     Tijdschrift beschrijving
       Alle jaargangen van het bijbehorende tijdschrift
         Alle afleveringen van het bijbehorende jaargang
                                       Alle artikelen van de bijbehorende aflevering
 
                             19 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A compact test structure for characterisation of leakage currents in sub-micron CMOS technologies Ning, Zhenqiu
2001
41 12 p. 1939-1945
7 p.
artikel
2 A hierarchical approach to large circuit symbolic simulation Đorđević, S.
2001
41 12 p. 2041-2049
9 p.
artikel
3 A reliability comparison of InGaP/GaAs HBTs with and without passivation ledge Yan, B.P
2001
41 12 p. 1959-1963
5 p.
artikel
4 Author Index 2001
41 12 p. 2091-2095
5 p.
artikel
5 Characteristic study of anisotropic-conductive film for chip-on-film packaging Chang, Shyh-Ming
2001
41 12 p. 2001-2009
9 p.
artikel
6 Degradation of thin oxides during electrical stress Bersuker, Gennadi
2001
41 12 p. 1923-1931
9 p.
artikel
7 Effect of solder creep on the reliability of large area die attachment Zhuang, W.D.
2001
41 12 p. 2011-2021
11 p.
artikel
8 Extraction of the lateral distribution of interface traps in MOSFETs by a novel combined gated-diode technique He, Jin
2001
41 12 p. 1953-1957
5 p.
artikel
9 Flip-chip structure transient thermal model Fedasyuk, D.
2001
41 12 p. 1965-1970
6 p.
artikel
10 Impact of gate oxide nitridation process on 1/f noise in 0.18 μm CMOS Da Rold, M
2001
41 12 p. 1933-1938
6 p.
artikel
11 Low and high temperature device reliability investigations of buried p-channel MOSFETs of a 0.17 μm technology Ambatiello, Alexander
2001
41 12 p. 1915-1921
7 p.
artikel
12 Monitoring of power dissipated in microelectronic structures Dziurdzia, Piotr
2001
41 12 p. 1971-1978
8 p.
artikel
13 Noise as a tool for non-destructive testing of single-crystal silicon solar cells Chobola, Z
2001
41 12 p. 1947-1952
6 p.
artikel
14 Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement Blyzniuk, M.
2001
41 12 p. 2023-2040
18 p.
artikel
15 Process capability indices and product reliability Ramakrishnan, Bharatwaj
2001
41 12 p. 2067-2070
4 p.
artikel
16 Reliability of microBGA assembly using no-flow underfill Tu, P.L.
2001
41 12 p. 1993-2000
8 p.
artikel
17 SIMS study of silicon oxynitride prepared by oxidation of silicon-rich silicon nitride layer Poon, M.C
2001
41 12 p. 2071-2074
4 p.
artikel
18 Stacked solder bumping technology for improved solder joint reliability Liu, Xingsheng
2001
41 12 p. 1979-1992
14 p.
artikel
19 The Hi-noon neural simulator and its applications Damper, R.I.
2001
41 12 p. 2051-2065
15 p.
artikel
                             19 gevonden resultaten
 
 Koninklijke Bibliotheek - Nationale Bibliotheek van Nederland