nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
An evaluation of fast wafer level test methods for interconnect reliability control
|
Foley, S |
|
1999 |
39 |
11 |
p. 1707-1714 8 p. |
artikel |
2 |
Bipolar model extension for MOS transistors considering gate coupling effects in the HBM ESD domain
|
Wolf, Heinrich |
|
1999 |
39 |
11 |
p. 1541-1549 9 p. |
artikel |
3 |
Characterization and optimization of a bipolar ESD-device by measurements and simulations
|
Stricker, Andreas D. |
|
1999 |
39 |
11 |
p. 1563-1577 15 p. |
artikel |
4 |
Copper metallization reliability
|
Lloyd, J.R |
|
1999 |
39 |
11 |
p. 1595-1602 8 p. |
artikel |
5 |
Dynamics of electromigration induced void/hillock growth and precipitation/dissolution of addition elements studied by in-situ scanning electron microscopy resistance measurements
|
D’Haen, J. |
|
1999 |
39 |
11 |
p. 1617-1630 14 p. |
artikel |
6 |
Early electromigration effects and early resistance changes
|
Scorzoni, A. |
|
1999 |
39 |
11 |
p. 1647-1656 10 p. |
artikel |
7 |
Electromigration induced aluminum atom migration retarding by grain boundary structure stabilization and copper doping
|
Hasunuma, M |
|
1999 |
39 |
11 |
p. 1631-1645 15 p. |
artikel |
8 |
Electromigration performance of Al–Si–Cu filled vias with titanium glue layer
|
Kageyama, M |
|
1999 |
39 |
11 |
p. 1697-1706 10 p. |
artikel |
9 |
ESD protection for mixed-voltage I/O using NMOS transistors stacked in a cascode configuration
|
R. Anderson, Warren |
|
1999 |
39 |
11 |
p. 1521-1529 9 p. |
artikel |
10 |
Investigation into socketed CDM (SDM) tester parasitics
|
Chaine, M |
|
1999 |
39 |
11 |
p. 1531-1540 10 p. |
artikel |
11 |
Investigations on the thermal behavior of interconnects under ESD transients using a simplified thermal RC network
|
Salome, Pascal |
|
1999 |
39 |
11 |
p. 1579-1591 13 p. |
artikel |
12 |
Long term noise measurements and median time to failure test for the characterization of electromigration in metal lines
|
Ciofi, C. |
|
1999 |
39 |
11 |
p. 1691-1696 6 p. |
artikel |
13 |
Modeling and microstructural characterization of incubation, time-dependent drift and saturation during electromigration in Al–Si–Cu stripes
|
Witvrouw, A. |
|
1999 |
39 |
11 |
p. 1603-1616 14 p. |
artikel |
14 |
Modeling electromigration as a fluid–gas system
|
Schoenmaker, Wim |
|
1999 |
39 |
11 |
p. 1667-1676 10 p. |
artikel |
15 |
Non-uniform triggering of gg-nMOSt investigated by combined emission microscopy and transmission line pulsing
|
Russ, Christian |
|
1999 |
39 |
11 |
p. 1551-1561 11 p. |
artikel |
16 |
[No title]
|
Voldman, Steven H |
|
1999 |
39 |
11 |
p. 1519-1520 2 p. |
artikel |
17 |
[No title]
|
Mouthaan, Ton J |
|
1999 |
39 |
11 |
p. 1593- 1 p. |
artikel |
18 |
The excess noise in integrated circuit interconnects before and after electromigration damage
|
Guo, Jianping |
|
1999 |
39 |
11 |
p. 1677-1690 14 p. |
artikel |
19 |
The kinetics of the early stages of electromigration and concurrent temperature induced processes in thin film metallisations studied by means of an in-situ high resolution resistometric technique
|
Van Olmen, J. |
|
1999 |
39 |
11 |
p. 1657-1665 9 p. |
artikel |