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                             15 results found
no title author magazine year volume issue page(s) type
1 An attempt to explain thermally induced soft failures during low level ESD stresses: study of the differences between soft and hard NMOS failures Salome, P.
1998
38 11 p. 1763-1772
10 p.
article
2 Designing power supply clamps for electrostatic discharge protection of integrated circuits Maloney, T.J.
1998
38 11 p. 1691-1703
13 p.
article
3 Does the ESD-failure current obtained by transmission-line pulsing always correlate to human body model tests? Stadler, W
1998
38 11 p. 1773-1780
8 p.
article
4 Editorial 1998
38 11 p. 1647-
1 p.
article
5 ESD failure analysis methodology Colvin, J
1998
38 11 p. 1705-1714
10 p.
article
6 ESD issues in compound semiconductor high-frequency devices and circuits Bock, K.
1998
38 11 p. 1781-1793
13 p.
article
7 ESD laboratory simulations and signature analysis of a CMOS programmable logic product 1 1 The following is a condensed and revised version of the original paper presented at ISTFA-94: Proceedings of the 20th International Symposium for testing and Failure Analysis, p117 (1994), Henry et al., see ref[26]. Henry, L.G.
1998
38 11 p. 1715-1721
7 p.
article
8 ESD protection in thin film silicon on insulator technologies Smith, J.C
1998
38 11 p. 1669-1680
12 p.
article
9 ESD protection techniques for high frequency integrated circuits Croft, G.
1998
38 11 p. 1681-1689
9 p.
article
10 ESD robustness prediction and protection device design in partially depleted SOI technology Raha, P.
1998
38 11 p. 1723-1731
9 p.
article
11 Novel concept for high level overdrive tolerance of GaAs based FETs Lipka, K.M
1998
38 11 p. 1795-1801
7 p.
article
12 On the use of n-well resistors in ESD protections Notermans, G.
1998
38 11 p. 1741-1748
8 p.
article
13 Study of the ESD behavior of different clamp configurations in a 0.35 μm CMOS technology Richier, C
1998
38 11 p. 1733-1739
7 p.
article
14 The impact of MOSFET technology evolution and scaling on electrostatic discharge protection Voldman, Steven H
1998
38 11 p. 1649-1668
20 p.
article
15 Unique ESD failure mechanisms during negative to Vcc HBM tests Chaine, M
1998
38 11 p. 1749-1761
13 p.
article
                             15 results found
 
 Koninklijke Bibliotheek - National Library of the Netherlands