| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Advanced RBSOA analysis for advanced power BJTs
|
Busatto, Giovanni
|
|
1996
|
36 |
7-8 |
p. 1077-1093
17 p.
|
artikel
|
| 2 |
Announcement
|
|
|
1996
|
36 |
7-8 |
p. 1139-
1 p.
|
artikel
|
| 3 |
A review of hot-carrier degradation mechanisms in MOSFETs
|
Acovic, Alexander
|
|
1996
|
36 |
7-8 |
p. 845-869
25 p.
|
artikel
|
| 4 |
Blue shift and mirror degradation in InGaAs GaAs strained quantum well lasers
|
Serra, L.
|
|
1996
|
36 |
7-8 |
p. 1095-1105
11 p.
|
artikel
|
| 5 |
Breakdown of thin gate silicon dioxide films—A review
|
Nafría, M.
|
|
1996
|
36 |
7-8 |
p. 871-905
35 p.
|
artikel
|
| 6 |
Built-in self-test and diagnostic support for safety critical microsystems
|
Olbrich, T.
|
|
1996
|
36 |
7-8 |
p. 1125-1136
12 p.
|
artikel
|
| 7 |
Diagnosis in submicron integrated circuits by electric force microscopy
|
Böhm, C.
|
|
1996
|
36 |
7-8 |
p. 1113-1118
6 p.
|
artikel
|
| 8 |
Diagnostics of the quality of MOSFETs
|
Vandamme, E.P.
|
|
1996
|
36 |
7-8 |
p. 1107-1112
6 p.
|
artikel
|
| 9 |
Editorial
|
Stojadinović, Ninoslav
|
|
1996
|
36 |
7-8 |
p. 843-844
2 p.
|
artikel
|
| 10 |
Electrical and radiation tests of thin tunnel oxides
|
Paccagnella, A.
|
|
1996
|
36 |
7-8 |
p. 1033-1044
12 p.
|
artikel
|
| 11 |
Electromigration failure of contacts and vias in sub-micron integrated circuit metallizations
|
Oates, Anthony S.
|
|
1996
|
36 |
7-8 |
p. 925-953
29 p.
|
artikel
|
| 12 |
Electromigration in Al based stripes: Low frequency noise measurements and MTF tests
|
Bagnoli, P.E.
|
|
1996
|
36 |
7-8 |
p. 1045-1050
6 p.
|
artikel
|
| 13 |
ESD issues for advanced CMOS technologies
|
Duvvury, Charvaka
|
|
1996
|
36 |
7-8 |
p. 907-924
18 p.
|
artikel
|
| 14 |
Failure-analysis-based test chip design for quick yield improvement
|
Hashimoto, Chisato
|
|
1996
|
36 |
7-8 |
p. 1063-1075
13 p.
|
artikel
|
| 15 |
Failures induced on analog integrated circuits by conveyed electromagnetic interferences: A review
|
Masetti, G.
|
|
1996
|
36 |
7-8 |
p. 955-972
18 p.
|
artikel
|
| 16 |
List of reviewers
|
|
|
1996
|
36 |
7-8 |
p. 1137-
1 p.
|
artikel
|
| 17 |
Modelling considerations and development of upper limits of stress conditions for dielectric breakdown projections
|
Vollertsen, R.-P.
|
|
1996
|
36 |
7-8 |
p. 1019-1031
13 p.
|
artikel
|
| 18 |
Plastic packages survive where hermetic packages fail
|
Sinnadurai, Nihal
|
|
1996
|
36 |
7-8 |
p. 1001-1018
18 p.
|
artikel
|
| 19 |
Pseudomorphic HEMTs reliability with scattering and noise parameters
|
Conti, P.
|
|
1996
|
36 |
7-8 |
p. 1119-1124
6 p.
|
artikel
|
| 20 |
Reliability of InGaAs InP based separate absorption grading multiplication avalanche photodiodes
|
Montangero, P.
|
|
1996
|
36 |
7-8 |
p. 973-1000
28 p.
|
artikel
|
| 21 |
The evolution of the microscopic damage in electromigration studied by multiple electrical measurements
|
Jone, B.K.
|
|
1996
|
36 |
7-8 |
p. 1051-1062
12 p.
|
artikel
|
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